Magnetic sector atom-probe

1 See for examples Direct imaging of atoms in crystals and molecules, Proc. 

Nobel Symp., 47, ed. L. Kihlborg, Royal Swedish Academy of Science, 1979 also D. J. Smith in Chemistry and Physics of Solid Surfaces VI, 413, Springer, Berlin, 1986. 

Muller T. T. Tsong, Field Ion Microscopy, Principles and Appli- 

Metals, Pergamon Press, Oxford, 1959 P. A. Jacquet, Metallurgical Rev., 1,157 (1961) I. S. Brammer, M. A. P. Dewey, Specimen Preparation for Electron Metallography, American Elsevier, New York, 1966 J. W. Edington, Practical Electron Microscopy in Materials Science, Macmillan Philips Technical Library, Eindhoven, 1974. 

8 This table is an incomplete compilation of data available in the literature, 

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Fig. 3. 22 Magnetic sector atom-probe which uses a second order focusing 60° sector field. The line spectrum is displayed on a 7.5 cm diameter Chevron channel plate and a proximity focused screen, which can show the impact of single ions.

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