Probing using atomic force microscopy

A fussier preparation that uses "atomic force microscopy" (AFM) demonstrates that there can be a lateral force between surfaces sinusoidally coated with gold.49 Sophisticates of earlier sections know that a probe such as AFM will "see" into a surface to a depth comparable with separation between probe tip and surface. When substrate structure varies with depth from surface, interpretation of van der Waals interactions can be problematic. Nevertheless, good success has been reported.50,51... 

Mazzola, L.T. (1999). Probing biomolecular recognition using atomic force microscopy. PhD Thesis, Stanford University, Stanford, CA, pp. 115. 

The new scanning probe microscopies (chapter B1.19) have been used enthusiastically by biologists almost since their invention, because biomolecules can be investigated in aqueous, physiological milieux at room temperature. Early hopes of using atomic force microscopy to sequence DNA, or scanning tunnelling microscopy to characterize... 

Electron microscopy D E PACKHAM TEM and STEM applied to adhesion studies Scanning electron microscopy B C COPE Mode of operation, examples of use Atomic force microscopy G J LEGGETT Basis, scope limitations Scanning probe microscopy G J LEGGETT Basis and use... 

A. Meister, M. Liley, J. Brugger, R. Pugin, and H. Heinzelmann, Nanodispenser for attoliter volume deposition using atomic force microscopy probes modified by focused-ion-beam milling, Appl. Phys. Lett, 85, 6260-6262 (2004). 

Advances have been made in directly measuring the forces between two surfaces using freshly cleaved mica surfaces mounted on supports (15), and silica spheres in place of the sharp tip of an atomic force microscopy probe (16). These measurements can be directly related to theoretical models of surface forces. 

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