Conducting-probe Atomic Force Microscopy

Wold DV, Haag R, Rampi MA, Frisbie CD (2002) Distance dependence of electron tunneling through self-assembled monolayers measured by conducting probe atomic force microscopy unsaturated versus saturated molecular junctions. J Phys Chem B 106 2813-2816... 

Loiacono MJ, Granstrom EL, Frisbie CD (1998) Investigation of charge transport in thin, doped sexithiophene crystals by conducting probe atomic force microscopy. J Phys Chem B 102 1679-1688... 

Conducting probe atomic force microscopy (CP-AFM), in which a SAM is formed on a Au metal surface, and a Au coated AFM tip is used to contact the top of the SAM (a different procedure than that above) has been used to measure conductance of alkanethiolate monolayers.42 No NDR effects were seen. 

D. J. Wold and C. D. Frisbie, Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy, J. Am. Chem. Soc. 123, 5549-5556 (2001). 

This trend is nicely revealed by the ET distance dependence studies carried out on the SAMs of unsaturated bridges shown in Fig. 24. The /3 value for ET mediated by the saturated polymethylene bridge, determined from conducting probe atomic force microscopy, is 0.94 A-1 (Fig. 24a).121 (/3 for this system is also given in Fig. 19e, but in units of bond-1 all /3 values listed in Fig. 24 are in A-1 units because they were reported in this form in the literature.). A similar /3 value of 0.90 A-1 was... 

Kelley, T.W., Granstrom, E.L., and Frisbie, C.D., Conducting probe atomic force microscopy A characterization tool for molecular electronics, Adv. Mater. 11, 261, 1999. 

EngeUces, V.B., Beebe, J.M., and Erisbie, C.D., Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy, J. Phys. Chem. B. 109, 16801-16810, 2005. 

Figure 9.26 Upper panel (A) Adhesion force as a function of applied bias. Lower panel (B) Adhesion force (symbols) and the best fit line for the 1,4-benzene dimethanethiol sample. (Reprinted with permission from Langmuir, Adhesion Forces in Conducting Probe Atomic Force Microscopy by A. V. Tivanski etal., 19, 6. Copyright (2003) American Chemical Society)...

Holt, K. B., A. J. Bard, Y. Show, and G. M. Swain. 2004. Scanning electrochemical microscopy and conductive probe atomic force microscopy studies of hydrogen-terminated boron-doped diamond electrodes with different doping levels. J. Phys. Chem. B 108 15117-15127. 

---