Probe atomic force microscopy

Typical forces profdes measmed between glass surfaces in ethanol-cyclohexane mixtures are shown in Fig. 2. Colloidal probe atomic force microscopy has been employed. In pure cyclohexane, the observed force agrees well with the conventional van der Waals attraction calculated with the nometarded Hamaker constant for glass/cyclohexane/glass. 

Wold DV, Haag R, Rampi MA, Frisbie CD (2002) Distance dependence of electron tunneling through self-assembled monolayers measured by conducting probe atomic force microscopy unsaturated versus saturated molecular junctions. J Phys Chem B 106 2813-2816... 

G. Gillies, C.A. Prestidge, and P. Attard Determination of the Separation in Colloid Probe Atomic Force Microscopy of Deformable Bodies. Langmuir 17, 7955 (2001). 

Loiacono MJ, Granstrom EL, Frisbie CD (1998) Investigation of charge transport in thin, doped sexithiophene crystals by conducting probe atomic force microscopy. J Phys Chem B 102 1679-1688... 

Conducting probe atomic force microscopy (CP-AFM), in which a SAM is formed on a Au metal surface, and a Au coated AFM tip is used to contact the top of the SAM (a different procedure than that above) has been used to measure conductance of alkanethiolate monolayers.42 No NDR effects were seen. 

D. J. Wold and C. D. Frisbie, Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy, J. Am. Chem. Soc. 123, 5549-5556 (2001). 

This trend is nicely revealed by the ET distance dependence studies carried out on the SAMs of unsaturated bridges shown in Fig. 24. The /3 value for ET mediated by the saturated polymethylene bridge, determined from conducting probe atomic force microscopy, is 0.94 A-1 (Fig. 24a).121 (/3 for this system is also given in Fig. 19e, but in units of bond-1 all /3 values listed in Fig. 24 are in A-1 units because they were reported in this form in the literature.). A similar /3 value of 0.90 A-1 was... 

An experimental trial for finding foe freezing point elevation phenomena was conducted, employing foe so-called colloidal-probe Atomic Force Microscopy. A carbonaceous nanospace with slit geometry was successfully made up by this technique. 

Alternatively, one may employ colloidal probe atomic force microscopy (AFM) to measure force distance curves such as the ones plotted in Fig. 5.1 [162]. The important difference between SFA and colloidal probe AFM experiments is that in the latter the entire force distance curve is accessible rather than only that portion satisfying Eq. (5.66) [163, 164]. In Ref. 164 a comparison is presented between theoretical and experimental data for confined poly-electrolyt.e systems. 

Kelley, T.W., Granstrom, E.L., and Frisbie, C.D., Conducting probe atomic force microscopy A characterization tool for molecular electronics, Adv. Mater. 11, 261, 1999. 

EngeUces, V.B., Beebe, J.M., and Erisbie, C.D., Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy, J. Phys. Chem. B. 109, 16801-16810, 2005. 

Figure 9.26 Upper panel (A) Adhesion force as a function of applied bias. Lower panel (B) Adhesion force (symbols) and the best fit line for the 1,4-benzene dimethanethiol sample. (Reprinted with permission from Langmuir, Adhesion Forces in Conducting Probe Atomic Force Microscopy by A. V. Tivanski etal., 19, 6. Copyright (2003) American Chemical Society)...

Pasche, S., Textor, M., Meagher, L., Spencer, N.D., Griesser, H.J. Relationship between interfacial forces measured by colloid-probe atomic force microscopy and protein resistance of poly/ethylen glycol)-grafted poly(L-lysine) adlayers on niobia surfaces. Langmuir 21, 6508-6520 (2005). doi 10.1021/la050386x... 

Relationship between Interfacial Forces Measured by Colloid-Probe Atomic Force Microscopy and Protein Resistance of Poly(ethylene glycoD-Grafted Poly(L-lysine) Adlayers on Niobia Surfaces... 

Measurement of interfacial forces thus offers the potential to study the factors involved in protein repellence or adsorption. Force measurements on adsorbed and grafted PEG layers have been reported, using both the surface forces apparatus (SFA) and the colloid-probe atomic force microscopy (AFM) technique. - Adsorbed PEG layers show responses due to relaxation processes,... 

Colloid Probe Atomic Force Microscopy. Colloid probe atomic force microscopy (AFM) uses a microsphere as a probe for the quantitative measurement of surface forces.The main advantage of using a microsphere instead of a sharp tip is the improved definition of the contact geometry and thus the ability to perform quantitative comparisons with theoretical models of interfacial forces. 

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