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Microscopy position-sensitive atom probe

The atom probe field-ion microscope (APFIM) and its subsequent developments, the position-sensitive atom probe POSAP) and the pulsed laser atom probe (PLAP), have the ultimate sensitivity in compositional analysis (i.e., single atoms). The APFIM was developed by Muller et al. [365], having grown out of field-ion microscopy (FIM) which also originated earlier with Muller [366]. [Pg.932]

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See also in sourсe #XX -- [ Pg.180 ]



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