Scanning atom probe

Accelerator mass spectrometry Acousto-optical tuneable filter Acousto-optical tuneable spectrometer/scanning Atom probe... 

ERDA Elastic recoil detection analysis SAP Scanning atom probe... 

Nishikawa, O., Kimoto, M. (1994) Toward a scanning atom probe—computer simulation of electric field. Applied Surface Science, 76-77,424-430. 

Nishikawa, O., Sekine,T, Ohtani,Y., Maeda, K.,Numada, Y., Watanabe, M., Iwatsnki, M., Aoki, S., Itoh, I, Yamanaka, K. (1998) Development of a scanning atom probe and atom-by-atom mass analysis of diamonds. Applied Physics A Materials Science Processing, 66, S11-S16. 

Microscopic techniques, 70 428 Microscopists, role of, 76 467 Microscopy, 76 464-509, See also Atomic force microscopy (AFM) Electron microscopy Light microscopy Microscopes Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) acronyms related to, 76 506-507 atomic force, 76 499-501 atom probe, 76 503 cathodoluminescence, 76 484 confocal, 76 483-484 electron, 76 487-495 in examining trace evidence, 72 99 field emission, 76 503 field ion, 76 503 fluorescence, 76 483 near-held scanning optical,... 

There are of course many other similarities and differences, and some of them are listed in Table 5.1 without further explanations. In general, STM is very versatile and flexible. Especially with the development of the atomic force microscope (AFM), materials of poor electrical conductivity can also be imaged. There is the potential of many important applications. A critically important factor in STM and AFM is the characterization of the probing tip, which can of course be done with the FIM. FIM, with its ability to field evaporate surface atoms and surface layers one by one, and the capability of single atom chemical analysis with the atom-probe FIM (APFIM), also finds many applications, especially in chemical analysis of materials on a sub-nanometer scale. It should be possible to develop an STM-FIM-APFIM system where the sample to be scanned in STM is itself an FIM tip so that the sample can either be thermally treated or be field evaporated to reach into the bulk or to reach to an interface inside the sample. After the emitter surface is scanned for its atomic structure, it can be mass analyzed in the atom-probe for one atomic layer,... 

A further spatially resolved method, also based on work function contrast, is scanning Kelvin probe microscopy (SKPM). As an extended version of atomic force microscopy (AFM), additional information on the local surface potential is revealed by a second feedback circuit. The method delivers information depending on the value (p (p(x) + A x). Here, A(zS(x) is the difference in work function between the sample and the AFM tip and cp(x) is the local electric potential [12]. (p x) itself gives information on additional surface charges due to... 

Atomic force microscopy (AFM) similar to STM is a scanning atomic-scale probe microscopy however, AFM does not rely on tunneling. It detects the interatomic forces between the tip and surface atoms. This method provides a very powerful complement to STM. It can be used in cases when faradaic current is flowing, that is, it offers the possibility of studying surfaces in the course of electrochemical processes. Nonconducting samples can be imaged as well. 

SECM (Scanning electrochemical microscopy) is a technique to characterize the local electrochemical nature of various materials by scanning a probe microelectrode [1,2]. The spatial resolution of SECM is inferior to the conventional scanning probe microscopes such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) as the fabrication of the probe, microelectrode, with nanometer sizes is quite difficult and the faradaic current of the microprobe is very small (often picoamps or less). However, SECM has unique characteristics that cannot be expected for STM and AFM SECM can image localized chemical reactions and it also can induce localized chemical reactions in a controlled manner. 

Dip Pen Nanolithography (DPN) is a direct-write scan-ning-probe-based lithography method in which an atomic force microscope (AFM) tip or array of tips is used to deliver chemical reagents directly to specific regions of a substrate surface. 

STAR Scanning Tunneling Atom Probe Weinheim 2. Foster A, Hofer W (2006) Scanning Probe Microscopy Atomic... 

Atom-technology and beyond manipulating matter using scanning 116 probes... 

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