Atom probe tomography analysis

Since electrons with MeV order energies can produce uniform damage to a depth in the order of mm, tensile tests can be conducted as macroscopic mechanical testing. SAXS or SANS can be conducted as well as TEM, atom probe tomography analysis and positron annihilation spectroscopy measurements. In HVEM irradiation, time-dependent evolution of individual defect clusters such as an interstitial loop or a vacancy cluster can be investigated in an irradiated spot area. Microanalysis using an electron beam probe such as energy dispersive X-ray analysis is also applicable in the beam spot area. However, other analyses or measurements on such small areas are difficult to carry out. 

M.K. Miller, Atom Probe Tomography Analysis at the atomic level, Kluwer Academic, New York, 2000. 

J.M. Hyde, M.G Burke, B. Gault, D.W. Saxey, P. Styman, K.B. Wilford and T.J. Williams, Atom probe tomography of reactor pressure vessel steels An analysis of data integrity . Ultramicroscopy, 2011, 111, 676-682. 

E.A. Marquis and J.M. Hyde, Atomic scale analysis of solute behaviours by atom-probe tomography . Mater. Sci. Eng. R., 2010,69,4-5,37-62. 

APT Atom probe tomography NRA Nuclear reaction analysis... 

Thompson, K., Bunton, J.H., Kelly, T.F, Larson, D.I (2006) Characterization of ultralow-energy implants and towards the analysis of three-dimensional dopant distributions using three-dimensional atom-probe tomography. Journal of Vacuum Science Technology B.Microelectronics and Nanometer Structures, 24, 421-427. 

The last chapter is of paramount importance for the materials community -characterization. Prom electron microscopy to surface quantitative analysis techniques, and everything in between, this chapter provides a thorough description of modem techniques used to characterize materials. A flowchart is provided at the end of the chapter that will assist the materials scientist in choosing the most suitable technique(s) to characterize a particular material. In addition to comprehensive updates throughout the chapter, a new technique known as atom-probe tomography (APT) has been included in this edition. 

One of the modern hi -accuracy experimental methods is tomography atom probe (TAP). It enables the investigation of reactions in thin metallic diffusion couples by means of spatially resolved chemical analysis with a local accuracy up to interatomic distance [11, 12]. This technique was also applied to reactive diffusion in the thin film system Al-Co within the temperature range of 200-400 °C [6]. In accordance with the previous results obtained by the authors [13, 14] by DSC, the first phase to nucleate and grow in the temperature interval from 200 to 400 °C is AI9C02. The authors of [6] have established that in the diffusion zone between A1 and Co formation and growth of a solid solution layer occurs first, and nucleation of AI9C02 particles is never observed before the diffusion zone reaches about 3-4 nm thickness. Thus, the appearance of the product phase is controlled by the width... 

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