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Atom Probe Field Ion Microscopy APFIM

Atomic levels, 27 294-295 Atomic masses, 15 649-650 accurate, 15 666 Atomic models, 21 288-290 Atomic numbers, 17 386 Atomic probe field ion microscopy (APFIM), 16 503... [Pg.78]

Field ion microscopy (FIM) The specimen is formed into a sharp tip to which a positive potential is applied. The tip is surrounded by inert gas atoms, which are drawn towards it. As they strike, electrons tunnel into the tip leaving the gas atoms ionized. The ions then accelerate away and can be detected as sports on a screen, corresponding to atoms at the tip surface Atomic probe field ion microscopy (APFIM)... [Pg.4593]

Atom Probe Field-Ion Microscopy (APFIM, POSAP, PLAP)... [Pg.932]

Electric field — Field electron microscopy (FEM) Atom probe field-ion microscopy (APFIM)... [Pg.33]

The atom probe field-ion microscope (APFIM) and its subsequent developments, the position-sensitive atom probe POSAP) and the pulsed laser atom probe (PLAP), have the ultimate sensitivity in compositional analysis (i.e., single atoms). The APFIM was developed by Muller et al. [365], having grown out of field-ion microscopy (FIM) which also originated earlier with Muller [366]. [Pg.932]

See other pages where Atom Probe Field Ion Microscopy APFIM is mentioned: [Pg.180]    [Pg.366]    [Pg.206]    [Pg.643]    [Pg.64]    [Pg.180]    [Pg.366]    [Pg.206]    [Pg.643]    [Pg.64]    [Pg.5]    [Pg.594]    [Pg.933]    [Pg.188]   
See also in sourсe #XX -- [ Pg.366 , Pg.394 ]



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Atom probe field ion microscopy

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