Atom probe field ion microscopy

Acronyms APFIM (atom probe field ion microscopy) 

A UHV chamber containing the sample in the form of a sharp tip is required. A time of flight mass spectrometer to identify the type of atoms emitted from the surface is also needed. 

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Miller, M.K., Cerezo, A., Fletherington, M.G. Smith, G.D.W. (1996) Atom Probe Field Ion Microscopy, Oxford University Press, Oxford, UK. 

Atomic levels, 27 294-295 Atomic masses, 15 649-650 accurate, 15 666 Atomic models, 21 288-290 Atomic numbers, 17 386 Atomic probe field ion microscopy (APFIM), 16 503... 

Tsong. T. T. (1990) Atom-Probe Field Ion Microscopy, Cambridge University Press, Cambridge. 

There already exist a few books written on field ion microscopy. Most of these either were published before 1970 when most works were concerned with techniques and methods, or are later ones which emphasize applications to materials science. While some of the basic principles of field ion microscopy remain unchanged from those twenty years ago, when Muller and I wrote a book on the subject, there have been many important new theoretical and technical developments and applications, and also many more detailed studies of a variety of problems in surface science and materials science. In the book just referred to, the subject of atom-probe field ion microscopy was only barely touched. This is of course where most of the new developments are made, and is also the instrument now most actively employed by investigators in the field. In the present volume I try to emphasize basic principles of atom-probe field ion microscopy, field ion emission and applications to surface science. As books emphasizing applications to materials science already exist, only selected topics in this area are presented here. They are used to illustrate the various capabilities of atom-probe field ion microscopy in materials science applications. 

There have been many monographs and review articles written on field ion microscopy.13 The earlier ones by Muller Tsong either have little discussion of atom-probe field ion microscopy, or the materials are somewhat out of date. Many review articles focus on narrow aspects of field ion microscopy, especially its applications. It is the intention of this... 

Figure 18.11 Spinodal decomposition observed by atom-probe field-ion microscopy,...

In another study, Shashkov and Seidman (1996) used atom-probe field-ion microscopy to examine the adsorption of Ag dissolved in solid Cu at semi-coherent interfaces between Cu-Ag and MgO precipitates obtained by internal oxidation of... 

Basic theory of surface states Sydney G. Davison and Maria Stgslicka Acoustic microscopy Andrew Briggs Light scattering principles and development W. Brown Quasicrystals a primer (Second edition) C. Janot Interfaces in crystalline materials A.P. Sutton and R.W. Balluffi Atom probe field ion microscopy M.K. Miller, A. Cerezo, M.G. Hetherington, and G.D.W. Smith... 

Field ion microscopy (FIM) The specimen is formed into a sharp tip to which a positive potential is applied. The tip is surrounded by inert gas atoms, which are drawn towards it. As they strike, electrons tunnel into the tip leaving the gas atoms ionized. The ions then accelerate away and can be detected as sports on a screen, corresponding to atoms at the tip surface Atomic probe field ion microscopy (APFIM)... 

Bre] Atom-probe field ion microscopy, transmission electron microscopy 10.6 mass% Co, 28.5 mass% Cr, Fe = bal. 525-640°C spinodal decomposition in bcc phase... 

Sakurai,T, Sakai,A., Pickering, H.W. (1989) Atom-Probe Field Ion Microscopy and Its Applications. Boston Academic Press. 

Kellogg, G.L.,Tsong,T.T. (1980) Pulsed-laser atom-probe field-ion microscopy. Journal of Applied Physics, 51, 1184-1193. 

Henjered, A., Norden, H. (1983) A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy./owma/ of Physics E Scientific Instruments, 16, 617-619. 

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