Atom-probe tomography

Bem] Field ion microscopy and atom probe tomography Precipitate type and habit plane... 

Since electrons with MeV order energies can produce uniform damage to a depth in the order of mm, tensile tests can be conducted as macroscopic mechanical testing. SAXS or SANS can be conducted as well as TEM, atom probe tomography analysis and positron annihilation spectroscopy measurements. In HVEM irradiation, time-dependent evolution of individual defect clusters such as an interstitial loop or a vacancy cluster can be investigated in an irradiated spot area. Microanalysis using an electron beam probe such as energy dispersive X-ray analysis is also applicable in the beam spot area. However, other analyses or measurements on such small areas are difficult to carry out. 

M.K. Miller, Atom Probe Tomography Analysis at the atomic level, Kluwer Academic, New York, 2000. 

B.P. Geiser, Reconstruction Models , Workshop on Atom Probe Tomography, Blue Mountains, NSW, Australia, 2008. 

J.M. Hyde, M.G Burke, B. Gault, D.W. Saxey, P. Styman, K.B. Wilford and T.J. Williams, Atom probe tomography of reactor pressure vessel steels An analysis of data integrity . Ultramicroscopy, 2011, 111, 676-682. 

B.P. Geiser,T.F.Kelly,D.J.Larson,J.Schneirand J.P.Roberts, Spatialdistribution maps for atom probe tomography , Microsc. Microanal., 2001,13,437-447. 

A. Shariq,T. Al-Kassab, R. Kirchheim and R.B. Schwarz, Exploring the next neighbourhood relationship in amorphous alloys utiUzing atom probe tomography . Ultramicroscopy, 2007,107,9,773-780. 

E.A. Marquis and J.M. Hyde, Atomic scale analysis of solute behaviours by atom-probe tomography . Mater. Sci. Eng. R., 2010,69,4-5,37-62. 

M.K. Miller, Atom probe tomography characterization of solute segregation to dislocations and interfaces ,/. Mater. Sci, 2006, 41, 7808-7813. 

M.K. Miller and K.F. Russell, Embrittlement of RPV steels An atom probe tomography perspective ,/. Nucl. Mater, 2007, 371,145-160. 

E. Meshn, B. Radiguet, P. Pareige and A. Barbu, Kinetic of solute clustering in neutron irradiated ferritic model alloys and a French pressure vessel steel investigated by atom probe tomography , /. Nucl. Mater., 2010, 399, 2-3, 137-145. 

FIGURE 40.24 Example of FIB preparation with lift-out technique and production of an atom probe sample (sequence steps A-D) that contains the gate region of a transistor (E,F arrow). Reprinted from Cerezo, A., Clifton, P.H., Galtrey, M.J., Humphreys, C.J., Kelly, T.E, Larson, D.J., Lozano-Perez S., Marquis, E.A., Oliver, R.A., Sha, G., Thompson, K., Zandbergen, M., Alvis, R.L. (2007) Atom probe tomography today. Materials Today, 10(12), 36-42. Copyright (2007), with permission from Elsevier. 

FIGURE 40.25 Sample preparation by FIB with a region isolated by a moat-type removal of surrounding material. Reprinted from Thompson, K., Lawrence, D., Larson, D.J., Olson, ID., Kelly, T.F., Gorman, B. (2006) In situ site-specific specimen preparation for atom probe tomography. Ultramicroscopy, 107(2-3), 131-139. Copyright (2006), with permission from Elsevier. 

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