Microscopes atomic force

In many cases, imaging resolution critically depends on the tip-sample interaction. For soft surfaces, contact pressure of the tip will lead to sample deformation and reduced resolution. Understanding the forces acting between the tip and the sample 

H13 uncoated (a) before heat treatment and (b) after heat treatment (TiAI)N-coated HI samples (c) before heat treatment and (d) after heat treatment. 

Matgka et al. examined the wear characteristics of SiC-reinforced iron-phenolic based brake disks using an AFM [16]. Abrasives, such as SiC, are added to brake 

Quadrangular pyramid-shaped AFM tip of 3(im height with toner particle of approximately 5.5(im diameter attached. 

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Fig. VIII-1. Schematic illustration of the scanning tunneling microscope (STM) and atomic force microscope (AFM). (From Ref. 9.)...

Fig. Vni-3. (a) Atomic force microscope (AFM) and (b) transmission electron microscope (TEM) images of lead selenide particles grown under arachidic acid monolayers. (Pi Ref. 57.)...

Figure Bl.19.18. Schematic of an atomic force microscope showing the optical lever principle.

Salmeron M B 1993 Use of the atomic force microscope to study mechanical properties of lubricant layers MRS Bulletin XVIII-5 20... 

Binnig G, Quate C F and Gerber Ch 1986 Atomic force microscope Phys. Rev. Lett. 56 930... 

Carpick R W, Agrait N, Ogletree D F and Salmeron M 1996 Measurement of interfacial shear (friction) with an ultrahigh vacuum atomic force microscope J. Vac. Sc/. Technol. B 14 1289... 

Ducker W A, Senden T J and Pashley R M 1991 Direct measurement of colloidal forces using an atomic force microscope Nature 353 239... 

Thundat T, Zheng X-Y, Chen G Y, Sharp S L, Warmack R J and Schowalter L J 1993 Characterization of atomic force microscope tips by adhesion force measurements App/. Phys. Lett. 63 2150... 

Hansma H G, Vesenka J, Siegerist C, Kelderman G, Morrett H, Sinsheimer R L, Bustamante C, Elings V and Hansma P K 1992 Reproducible imaging and dissection of plasmid DNA under liquid with the atomic force microscope Science 256 1180... 

Jarvis S P, Yamamoto S-l, Yamada H, Tokumoto H and Pethica J B 1997 Tip-surface interactions studied using a force controlled atomic force microscope in ultrahigh vacuum Appl. Phys. Lett. 70 2238... 

Meyer G and Amer N M 1990 Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope Appl. Phys. Lett. 57 2089... 

Kolosov O and Yamanaka K 1993 Nonlinear detection of ultrasonic vibrations in an atomic force microscope Japan. J. Appl. Phys. 32 LI 095... 

Friedbacher G, Hansma P K, Ramil E and Stucky G D 1991 Imaging powders with the atomic force microscope from biominerals to commercial materials Sc/e/ ce 253 1261... 

Keita B, Nad]o L and K]oller K 1991 Surface characterization of a single crystal of sodium decatungstocerate (IV) by the atomic force microscope Surf. Sc/. Lett. 256 L613... 

Overney R, Howald L, Frommer J, Meyer E and Guntherodt H 1991 Molecular surface structure of tetracene mapped by the atomic force microscope J. Chem. Phys. 94 8441... 

Radmacher M, Fritz M, Hansma H G and Hansma P K 1994 Direct observation of enzyme activity with the atomic force microscope Science 265 1577... 

Muller D W, Fotiadis D and Engel A 1998 Mapping flexible protein domains at subnanometre resolution with the atomic force microscope FEBS Lett. 430 105... 

Overney R M, Meyer E, Frommer J, Brodbeck D, Luthi R, Flowald L, Guntherodt Fl-J, Fu]ihara M, Takano FI and Gotoh Y 1992 Friction measurements of phase separated thin films with a modified atomic force microscope Nature... 

Manne S, Flansma P K, Massie J, Elings V B and Gewirth A A 1991 Atomic-resolution electrochemistry with the atomic force microscope copper deposition on gold Science 251 183... 

Jarvis S P and Tokumoto FI 1997 Measurement and interpretation of forces in the atomic force microscope Probe Microscopy 1 65... 

It is remarkable that tire roots of the SFA go back to the early 1960s [1], Tabor and Winterton [2] and Israelachvili and Tabor [3] developed it to the current state of the art some 15 years before the invention of the more widely used atomic force microscope (AFM) (see chapter B1.19). 

Cleveland J P, Schaffer T E and Hansma P K 1995 Probing oscillatory hydration potentials using thermal-mechanical noise in an atomic force microscope Rhys. Rev. B 52 R8692-5... 

Fisher T E, Oberhauser A F, Carrion-Vazquez M, Marszalek P E and Fernandez J M 1999 The study of protein mechanics with the atomic force microscope Trends Biochem. Sci. 24 379-84... 

Surfaces can be characterized using scaiming probe microscopies (see section B1.19). In addition, by attaching a colloidal particle to tire tip of an atomic force microscope, colloidal interactions can be probed as well [27]. Interactions between surfaces can be studied using tire surface force apparatus (see section B1.20). This also helps one to understand tire interactions between colloidal particles. 

The atomic force microscope (ATM) provides one approach to the measurement of friction in well defined systems. The ATM allows measurement of friction between a surface and a tip with a radius of the order of 5-10 nm figure C2.9.3 a)). It is the tme realization of a single asperity contact with a flat surface which, in its ultimate fonn, would measure friction between a single atom and a surface. The ATM allows friction measurements on surfaces that are well defined in tenns of both composition and stmcture. It is limited by the fact that the characteristics of the tip itself are often poorly understood. It is very difficult to detennine the radius, stmcture and composition of the tip however, these limitations are being resolved. The AFM has already allowed the spatial resolution of friction forces that exlribit atomic periodicity and chemical specificity [3, K), 13]. 

Figure C2.9.3 Schematic diagrams of the interfaces reaiized by (a) tire atomic force microscope, (b) tire surface forces apparatus and (c) tire quartz crystai microbaiance for achieving fundamentai measurements of friction in weii defined systems.

Chen C-FI, Washburn N and Gewirth A A 1993 In situ atomic force microscope study of Pb underpotential deposition on Au(111) Structural properties of the catalytically active phase J.Phys. Chem. 97 9754-60... 

Microscopic Interpretation of Atomic Force Microscope Rupture Experiments... 

That simulation study [49] aimed at a microscopic interpretation of single molecule atomic force microscope (AFM) experiments [50], in which unbinding forces between individual protein-ligand complexes have been m( asured... 

Fig. 5. Block diagram of contact atomic force microscope system in which cantilever deflection monitored optically with position-sensitive photodiode...

Newer techniques that are responding to the need for atomic level imaging and chemical analysis include scanning tunneling microscopes (STMs), atomic force microscopes (AFMs) (52), and focused ion beams (FIBs). These are expected to quickly pass from laboratory-scale use to in-line monitoring apphcations for 200-mm wafers (32). 

Figure 5 Atomic force microscope images of an aluminum film deposited on ambient (a) and heated (b) Si substrates. The scales are 15 pm x 15 pm (a) and 20 pm x 20 pm (b). The grain size can be clearly observed (Courtesy of M. Lawrence A. Dass, Intel Corporation).

It may be that in years to come, interatomic potentials can be estimated experimentally by the use of the atomic force microscope (Section 6.2.3). A first step in this direction has been taken by Jarvis et al. (1996), who used a force feedback loop in an AFM to prevent sudden springback when the probing silicon tip approaches the silicon specimen. The authors claim that their method means that force-distance spectroscopy of specific sites is possible - mechanical characterisation of the potentials of specific chemical bonds . 

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