Atomic force microscope specimen preparation

Both the transmission electron microscope and the scanning probe microscope (particularly the atomic force microscope) are the highest-resolution-imaging devices available for biochemical research. While knowledge of the instruments is important, the selection of appropriate methods of specimen preparation and the correct execution of those methods are critical for accurate ultrastructural data. In fact, use of more than one method can be quite desirable, especially if alternative methods of data corroboration are not available. 

Atomic force microscopy. Scanning electron microscopes do not provide the necessary resolution for analyzing detail morphology of certain membrane layers of very fine pore sizes such as those suitable for ultrafiltration and gas separation. While transmission electron microscopes are capable of examining very small scale structures, the technique is limited to only very thin specimens. This makes sample preparation for a multilayered membrane very difficult and tedious. 

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