Atomic force microscope tapping mode

FIGURE 21.20 Tapping-mode atomic force microscopic (AFM) height image left) and phase image right) of NRIO sample. The stmctures indicated hy circles are considered to he carhon hlack (CB) fillers. 

TMAFM Tapping Mode Atomic Force Microscope... 

Figure 10.7. Tapping mode atomic force microscope images of typical hot particles, (a) Four single particles. Only particles 1 and 2 were highly efficient for SERS. (b) Close-up image of a hot aggregate particle containing four linearly arranged particles, (c) Close-up image of a rodshaped hot particle, (d) Close-up image of a faceted hot particle. (With permission from Ref. 33.)...

Atomic Force Microscopic images were obtained with a NanoScope III (Digital Instruments, USA) apparatus working in Tapping Mode. Powder samples were prepared by hand pressing using a glass plate. 

If the generated craters exhibited a very low depth, postexperimental evaluation was performed with atomic force microscopes (AFM) in contact mode (Topometrix, Explorer-Scanner) or in tapping mode (Digital Instruments, Dimension 3000 SPM). 

The surface topography was investigated using a Mnltimode AFM (atomic force microscope) (Veeco, U.S.). Images were collected in air nsing a silicon tip in the tapping mode. The set-point voltage used was 1-2 V, and the scan rate was 1 Hz. 

Figure 3. The topography of a particular area of the carbon-black-polymer composite surface, as imaged in Ae tapping mode atomic force microscope mode of the scanning probe microscope. (Reproduced with permission from ref 4. Copyright 1995 American Physical Society.)...

An optical microscope allowing for interferometrical observations and an atomic force microscope (AFM, Digital Instrument, Nanoscope IIIA) operated both in tapping and in contact modes, were used to observe and to analyze the topology of the damaged surfaces. The optical observations were systematically made 1 hr after the mechanical testing, so that the possible incidence of fatigue-corrosion phenomena is about the same for all the specimens. 

The atomic force microscopic (AFM) test is good for analyzing and evaluating the surface characteristic of nanocellulose. Normally, after preparation of nanocellulose suspension, a drop of this suspension is deposited onto cleaved mica, dried, and then the image is recorded at room temperature and in tapping mode [139]. Figure 11.16 shows the AFM image of NFC from softwood [64] and CNC from MCC [140]. 

Lehmani, A., Durand-Vidal, S., and Turq, R 1998. Surface morphology of Nafion 117 membrane by tapping mode atomic force microscope. 68(3), 503-508. 

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