Intermittent contact atomic force microscope

Atomic force microscope (AFM). Sample solutions at 100 ng/ml or less were cemented onto mica and imaged in a model Nanoscope Ilia scanning probe microscope with TESP cantilevers (Veeco/Digital Instruments, Santa Barbara, CA) operated in the intermittent contact mode on an atomic force microscope. 

Atomic Force Microscopes (AFMs). The AFM operates in essentially the same manner as the STM, except that its function is to maintain a constant measured electrical force between the probe tip and the atomic surfece being scanned. In this function, the probe tip follows the shape of the atomic surfaces directly, rather than measuring a property difference that changes according to the shape of the surface. Several different modes of operation are available within this context, such as constant contact, non-contact, intermittent contact, lateral force, magnetic force, and thermal scanning. Each mode provides a different type of information about the surfece atoms. 

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