Atomic force microscope micrographs

Recent developments have allowed atomic force microscopic (AFM) studies to follow the course of spherulite development and the internal lamellar structures as the spherulite evolves [206-209]. The major steps in spherulite formation were followed by AFM for poly(bisphenol) A octane ether [210,211] and more recently, as seen in the example of Figure 12 for a propylene 1-hexene copolymer [212] with 20 mol% comonomer. Accommodation of significant content of 1-hexene in the lattice allows formation and propagation of sheaf-like lamellar structure in this copolymer. The onset of sheave formation is clearly discerned in the micrographs of Figure 12 after crystallization for 10 h. Branching and development of the sheave are shown at later times. The direct observation of sheave and spherulitic formation by AFM supports the major features that have been deduced from transmission electron and optical microscopy. The fibrous internal spherulite structure could be directly observed by AFM. 

Fig. 7 (a) Catechol derivatized tetracenes self-assemble on metal oxide surfaces such as aluminum oxide, (b) Schematic and (c) scanning electron micrographs of FET structures fabricated with a 5-nm aluminum oxide layer on top of a 5-nm thermally oxidized Si wafer to allow self-assembly of the derivatized tetracene between sub-100 nm Au source and drain electrodes, (d) /d-Eds characteristics of the assembled tetracene monolayer FET for a 40 nm channel length showing hole modulation and (inset) an atomic force microscope image of the FET channel... 

Figure 31-3 (A) Cryo atomic force (AFM) micrograph of molecules of the human immunoglobulin IgM. Courtesy of Zhifeng Shao, University of Virginia. (B) Schematic diagram. One-fifth of this structure is shown in greater detail in Fig. 31-4A. (C) Model based on earlier electron microscopic images. From Feinstein and Munn. 64(2...

Figure 8.18 Schematic of an atomic force microscope (AFM). On the right, scanning electron micrographs show a cantilever (top) and a tip (bottom) in more detail. The tip, which in operation points downwards to the sample, is pointing towards the observer (top) and upwards (bottom).

In spite of the better alignment of basal planes in the skin region, the surface of carbon fibers can show extremely fine-scale roughness. A scanning electron micrograph of AS4 carbon fibers is shown in Fig. 8.9a, while an atom-force microscope picture of the same fibers is shown in Fig. 8.9b. Note the surface striations and the roughness at a microscopic scale. 

Figure 8.9 (a) Scanning electron micrograph of AS4 carbon fibers. The fiber diameter is Tixm (b) atom-force microscope picture showing the fiber surface roughness at an extremely fine scale (courtesy of R.K. Eby). 

As a resnlt of IBD and IBAD experiments [80], nanodiamonds immersed in the dominant sp amorphous carbon films were found. Patterns were formed via the dynamical process between the sputtering and the deposition effects [82]. Hexagonal nanosized diamonds were also prepared from the Ceo vapor with the simultaneons irradiation of 1.5-keV Ne" ions at a temperature of 700°C. Furthermore, although C and iridinm (Ir) are immiscible, defects introduced by C implantation conld favor the supersatnrated C atoms in the subsurface region. Fig. 26 shows an atomic force microscope (AFM) micrograph of... 

These conventional techniques can provide additional valuable information (see examples below). To characterize the structural changes caused by modification, an atomic force microscope (AFM) (NanoScope III, Digital Instruments, USA), was used and scanning electron micrographs were obtained using a JSM-25 JOEL and LEO SEM 1430VP with EDX detector. 

Provides an up-to-date collection of micrographs from the millimeter scale down to the micrometer and nanometer scale from all types of microscopes (optical microscope, scanning, and transmission electron microscopes (SEM and TEM), environmental scanning electron microscope, high-voltage electron microscope, atomic force microscope)... 

Structural elements at the 1 -10 J,m level, and Figure Ic shows examples of microstructures at the 50-120 p,m level. These micrographs were all obtained from an atomic force microscope operated in tapping mode. 

Figure 14.4 Fabricated elastomeric coplanar waveguides utilizing 3- am-thick gold layers (a) Electron micrograph of microcracked morphology, (b) atomic force microscope scan showing surface microcracks, and (c) 40-mm-long gold CPW electrodes (with dimensions as shown in Figure 14.3) remain conductive when flexed as shown.

Scanning electron micrographs and atomic force microscope images were taken of some of the fibres to provide information about the morphology of the hollow fibre walls. The images are discussed in the sections below. 

The extent of dimensional stability of the part after feature replication was divided into 2 parts. For microfeature analysis, scanning electron microscope (FE-SEM, S-4800, Hitachi, Japan) was used to calculate the differences in the dimensions of the tool and the part. For nano-feature analysis, both scanning electron microscopy (SEM) and atomic force microscopy (AFM) were used to calculate respectively the width and the depth of the features. Percentage shrinkage in the dimensions of polymer parts was calculated from the SEM and AFM micrographs. The feature morphology and quality of replication was clearly evident from the SEM and AFM micrographs. 

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