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Atomic Force Microscope electrical double-layer forces

Ishino, T., Hieda, H., Tanaka, K. and Gemma, N. (1994) Electrical double-layer forces measured with an atomic-force microscope while electrochemically controlling surface-potential of the cantilever. Japanese Journal of Applied Physics Part 2, 33, L1552-L1554. [Pg.179]

Analyzing Electric Double Layers with the Atomic Force Microscope I 225... [Pg.225]

Analyzing Electric Double layers with the Atomic Force Microscope 1227... [Pg.227]

Analyzing Electric Double Layers ivith the Atomic Force Microscope 1247... [Pg.247]

Analyzing Electric Doable Layers with the Atomic Force Microscope 235 Tab. 1 Measurements of electrostatic double-layer forces with the AFM... [Pg.235]

See other pages where Atomic Force Microscope electrical double-layer forces is mentioned: [Pg.118]    [Pg.301]    [Pg.277]    [Pg.860]   
See also in sourсe #XX -- [ Pg.93 , Pg.97 , Pg.98 ]



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