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Substrate/surface characterization atomic Force Microscope

The smface roughness of etalon samples, glass substrates and polymer replicas were investigated with Solver atomic-force microscopes (NT MDT company, Zelenograd, Russia). The AFM measurements data were used to construct dependence of the rms roughness o on a frame size, which characterizes the surface roughness on a varying scale. [Pg.492]


See other pages where Substrate/surface characterization atomic Force Microscope is mentioned: [Pg.438]    [Pg.55]    [Pg.228]    [Pg.3121]    [Pg.319]    [Pg.1936]    [Pg.10]    [Pg.69]    [Pg.512]    [Pg.233]    [Pg.512]    [Pg.861]    [Pg.750]    [Pg.152]    [Pg.141]    [Pg.328]    [Pg.19]   


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Atomic Force Microscope

Atomic substrates

Atoms characterizing

Force microscope

Microscopic forces

Substrate characterization

Substrate surface

Substrate/surface characterization

Surface atoms

Surface forces

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