Atomic force microscope imaging of chromatin fibers

Atomic force microscope imaging of chromatin fibers 

The AFM [7] uses a sharp tip mounted at the end of a flexible cantilever to probe a number of properties of the sample, including its topographical features and its mechanical characteristics. Interaction forces, both attractive and repulsive, between atoms on the AFM tip and atoms on the sample cause deflections of the flexible cantilever (for a detailed description of the interaction forces sensed by the AFM, see Ref. [8]). These deflections are registered by a laser beam reflected off of the back of the cantilever onto a photodiode position detector (Fig. la)  

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