Secondary ion mass spectroscop

Secondary Ion Mass Spectroscopic Studies of Adsorption and Reaction at Metal Surfaces Correlations with Other Surface-Sensitive Techniques... 

Optical examination of etched polished surfaces or small particles can often identify compounds or different minerals hy shape, color, optical properties, and the response to various etching attempts. A semi-quantitative elemental analysis can he used for elements with atomic number greater than four by SEM equipped with X-ray fluorescence and various electron detectors. The electron probe microanalyzer and Auer microprobe also provide elemental analysis of small areas. The secondary ion mass spectroscope, laser microprobe mass analyzer, and Raman microprobe analyzer can identify elements, compounds, and molecules. Electron diffraction patterns can be obtained with the TEM to determine which crystalline compounds are present. Ferrography is used for the identification of wear particles in lubricating oils. 

Denison P, Jones FR, Brown A, Humphrey P, Harvey J, Scanning secondary ion mass spectroscopic studies of the micromechanics and chemical structure in the region of the interface in carbon fibre-epoxy composites, J Mater Sci, 23, 2153-2156, 1988. 

Cheng, H., Cornelio Clark, R.A., Hanton, S.D., Kung, R. (2000) Cationization effect on the molecular weight distribution of an ethoxylated polymer a combined theoretical and time-of-flight secondary ion mass spectroscopic study. /. Phys. Chem. A, 104, 2641-2647. 

Higher H diffusivities were observed in some solar-cell materials than in Czochralski or float-zone wafers. Secondary ion mass spectroscopic profiles of H or D, which had been implanted at low energies and at temperatures ranging from 100 to 300C, were compared for various types of Si substrate. The data could be described by the expressions ... 

Mass spectroscopy has been reviewed, particularly its application to volatiles [1,2] and non-volatiles [3], fast atom bombardment techniques [4] (Section 2.6), secondary ion mass spectroscopic techniques (SIMS) [5] (Section 2.1), electrospray ionisation (ESI) - mass spectroscopy (Section 2.3) [6] and laser mass spectroscopy techniques (Section 2.2) [7]. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

The film thickness and retractive index were calculated using spectroscopic ellipsometry. X-ray photoelectron spectroscopy (XPS) was used for composition analysis. Auger electron spectroscopy (AES) and secondary ion mass spectroscopy (SIMS) was used to investigate the depth profiles of the film. 

As for silicon, secondary ion mass spectrometry (SIMS) is the most widely used profiling analysis technique for deuterium diffusion studies in III-V compounds. Deuterium advantageously replaces hydrogen for lowering the detection limit. The investigations of donor and acceptor neutralization effects have been usually performed through electrical measurements, low temperature photoluminescence, photothermal ionization spectroscopy (PTIS) and infrared absorption spectroscopy. These spectroscopic investigations will be treated in a separated part of this chapter. 

In the present study the surface chemistry of birnessite and of birnessite following the interaction with aqueous solutions of cobalt(II) and cobalt(III) amine complexes as a function of pH has been investigated using two surface sensitive spectroscopic techniques. X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). The significant contribution that such an investigation can provide rests in the information obtained regarding the chemical nature of the neat metal oxide and of the metal oxide/metal ion adsorbate surfaces, within about the top 50 of the material surface. The chemical... 

Other spectroscopic techniques used to characterize iron oxides are photoelectron (PS), X-ray absorption (XAS), nuclear magnetic resonance (NMR) (Broz et ah, 1987), Auger (AES) (Seo et ah, 1975 Kamrath et ah, 1990 Seioghe et ah 1999), electron loss (EELS)), secondary ion mass (SIMS) and electron spin resonance (ESR) spectroscopy (Gehring et ah, 1990, Gehring Hofmeister, 1994) (see Tab. 7.8). Most of these tech-... 

Altered surfaces have been inferred from solution chemistry measurements (e.g., Chou and Wollast, 1984, 1985) and from spectroscopic measurements of altered surfaces, using such techniques as secondary ion mass spectrometry (for altered layers that are several tens of nm thick (e.g., Schweda et al, 1997), Auger electron spectroscopy (layers <10 nm thick (e.g., Hochella, 1988), XPS (layers <10 nm thick (e.g., Hochella, 1988 Muir et al, 1990), transmission electron microscopy (TEM, e.g., Casey et al, 1989b), Raman spectroscopy (e.g.. Gout et al, 1997), Fourier transform infrared spectroscopy (e.g., Hamilton et al, 2001), in situ high-resolution X-ray reflectivity (Farquhar et al, 1999b Fenter et al, 2003), nuclear magnetic resonance (Tsomaia et al, 2003), and other spectroscopies (e.g., Hellmann et al, 1997). 

Mass spectrometry is a standard spectroscopic technique for the characterisation of high molecular weight organic and inorganic compounds, but has until recently received little attention from the zeolite community. The surface composition of zeolites has been explored using fast atom bombardment mass spectrometry (FABMS)[66] and secondary ion mass spectrometry [67], but mass spectrometric analysis of the bulk composition of a zeolite or of adsorbed molecules has not until very recently been attempted. The practical difficulty is to vaporise the solid. Two different strategies have been proposed laser ablation and plasma desorption. 

Specific spectroscopic techniques are used for the analysis of polymer surface (or more correctly of a thin layer at the surface of the polymer). They are applied for the study of surface coatings, surface oxidation, surface morphology, etc. These techniques are typically done by irradiating the polymer surface with photons, electrons or ions that penetrate only a thin layer of the polymer surface. This irradiation is followed by the absorption of a part of the incident radiation or by the emission of specific radiation, which is subsequently analyzed providing information about the polymer surface. One of the most common techniques used for the study of polymer surfaces is attenuated total reflectance in IR (ATR), also known as internal reflection spectroscopy. Other techniques include scanning electron microscopy, photoacoustic spectroscopy, electron spectroscopy for chemical analysis (ESCA), Auger electron spectroscopy, secondary ion mass spectroscopy (SIMS), etc. 

Secondary-ion mass spectrometry (SIMS) can be used to detect the presence and the depth distribution of a specific impurity by etching out ions (secondary ions) from a material with a Cs+ or C>2+ ions probe, and measuring the impurity peak by mass spectrometry. This method provides a chemical signature of the impurity, with possible interferences, however, between atomic and molecular ions with the same masses and charges. It cannot discriminate between the isolated impurity and complexes or precipitates in which it is involved. Its sensitivity depends on the background of impurity. SIMS has been used for the detection of boron acceptor in CVD diamond [39]. These absolute methods of concentration measurements have been combined with spectroscopic measurements, which are easier to perform, to produce spectroscopic calibration factors. 

Spectroscopic instrumentation that has been widely and successfully applied to polymers includes IR, NMR, electron spin resonance, UV, X-ray, near IR, SIMS (secondary ion mass spectrometry), MS (mass spectrometry), photoacoustic, Raman, and microwave spectroscopy, and electron spectroscopy for chemical analysis. 

The techniques named in rows 5-7 of Table 21-1 detect a secondary beam of tons and are classified as ion spectroscopic techniques. These include secondary-ion mass spectrometry, ion-scattering spectroscopy, Rutherford backscattering spectroscopy, and laser-microprobe muss spectrometry. 

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