Microscopy materials

National Center for Electron Microscopy, Materials and Chemicals Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA 94720... 

LCenter for Advanced Materials, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, and Materials Science and Mineral Engineering Department, University of California, Berkeley, CA 94720 2National Center for Electron Microscopy, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, and Materials Science and Mineral Engineering Department, University of California, Berkeley, CA 94720... 

Larson BC and Lengeler B (eds.) (2004) High resolution three-dimensional X-Ray microscopy. Materials Research Society Bulletin 29(3) 152-181. 

P. Gese, Scanning probe microscopy materials analysis with an added dimension. Journal of Metals. 12,8-10(1992). 

Overney, R. M. Guo, L. Totsuka, H. Rafailovich, M. Sokolov, J. Schwarz, S. A. Interfacially confined polymeric systems studied by atomic force microscopy Material Research Society , 1997. 

Viville, P., Deffieux, A., Schappacher, M. et al. (2001) Surface organization of single hyperbranched polymer molecules, as studied by atomic force microscopy. Materials Science and Engineering C, 15,311-314. 

Tanabe, H., Y. Yamamma, and T. Misawa, In situ ionic imaging for pitting corrosion sites on austenitic stainless steels with scanning electrochemical microscopy. Materials Science Forum, 185-188, 1995, 991. 

Schulte, A., S. Belger, and W. Schuhmann, Corrosion of NiTi shape-memory alloys Visualization by means of potentiometric constant-distance scanning electrochemical microscopy. Materials Science... 

Briggs A., Kolosov O. Acoustic Microscopy for Imaging and Characterization // Materials Research Society Bulletin - 1996. - 21, 10. - P. 30-35. 

Brewster angle microscopy takes advantage of the reflectivity behavior of light at an interface. This method relies on the fact that light passing from a material of lower refractive index, no into a medium of higher index i will have... 

Since scanning tunneling microscopy requires flat conducting surfaces, it is not surprising that most of its early application was to study inorganic materials [17, 19, 20, 29-34]. These studies include investigations of catalytic metal surfaces [24, 35-37], silicon and other oxides [21], superconductors [38], gold... 

The specific surface area of a solid is one of the first things that must be determined if any detailed physical chemical interpretation of its behavior as an adsorbent is to be possible. Such a determination can be made through adsorption studies themselves, and this aspect is taken up in the next chapter there are a number of other methods, however, that are summarized in the following material. Space does not permit a full discussion, and, in particular, the methods that really amount to a particle or pore size determination, such as optical and electron microscopy, x-ray or neutron diffraction, and permeability studies are largely omitted. 

There has been a general updating of the material in all the chapters the treatment of films at the liquid-air and liquid-solid interfaces has been expanded, particularly in the area of contemporary techniques and that of macromolecular films. The scanning microscopies (tunneling and atomic force) now contribute more prominently. The topic of heterogeneous catalysis has been expanded to include the well-studied case of oxidation of carbon monoxide on metals, and there is now more emphasis on the flexible surface, that is, the restructuring of surfaces when adsorption occurs. New calculational methods are discussed. 

Scaiming probe microscopies have become the most conspicuous surface analysis tecimiques since their invention in the mid-1980s and the awarding of the 1986 Nobel Prize in Physics [71, 72]- The basic idea behind these tecimiques is to move an extremely fine tip close to a surface and to monitor a signal as a fiinction of the tip s position above the surface. The tip is moved with the use of piezoelectric materials, which can control the position of a tip to a sub-Angstrom accuracy, while a signal is measured that is indicative of the surface topography. These tecimiques are described in detail in section BI.20. 

AFM measures the spatial distribution of the forces between an ultrafme tip and the sample. This distribution of these forces is also highly correlated with the atomic structure. STM is able to image many semiconductor and metal surfaces with atomic resolution. AFM is necessary for insulating materials, however, as electron conduction is required for STM in order to achieve tiumelling. Note that there are many modes of operation for these instruments, and many variations in use. In addition, there are other types of scaiming probe microscopies under development. 

Thomas G and Goringe M J 1981 Transmission Electron Microscopy of Materials (New York Wiiey)... 

Rombaoh K, Laukemper-Ostendorf and Blumler P 1998 Applioations of NMR flow imaging in materials soienoe Spatially Resolved Magnetic Resonance, Proc. 4th Int. Cent, on Magnetic Resonance Microscopy and Macroscopy ed P Blumler, B Blumioh, R E Botto and E Fukushima (Weinheim Wiley-VCFI) pp 517-29... 

Biumioh B and Kuhn W (eds) 1992 Magnetic Resonance Microscopy Methods and Applications in Materials Science, Agriouiture and Biomedioine (Weinheim Wiiey-VCFI)... 

Williams D B and Carter C B 1996 Transmission Electron Microscopy, A Textbook for Material Science (New York Plenum)... 

Light microscopy is of great importance for basic research, analysis in materials science and for the practical control of fabrication steps. Wlien used conventionally it serves to reveal structures of objects which are otherwise mvisible to the eye or magnifying glass, such as micrometre-sized structures of microelectronic devices on silicon wafers. The lateral resolution of the teclmique is detennined by the wavelength of tire light... 

Light microscopy allows, in comparison to other microscopic methods, quick, contact-free and non-destmctive access to the stmctures of materials, their surfaces and to dimensions and details of objects in the lateral size range down to about 0.2 pm. A variety of microscopes with different imaging and illumination systems has been constmcted and is conunercially available in order to satisfy special requirements. These include stereo, darkfield, polarization, phase contrast and fluorescence microscopes. 

V Amelinck S, van Dyck D, van Landuyt J and van Trendelo G (eds) 1996 Handbook of Microscopy, Application In Materials Science, Solid State Physics and Chemistry 3 vols (Weinheim VCH)... 

Schroth D 1997 The confocal laser scanning microscopy. A new tool in materials testing Matehalpruefung 39 264 Chestnut M H 1997 Confocal microscopy of colloids Curr. Opin. Colloid Interface Sc/. 2 158-61... 

Bhawalkar J D, Swiatkiewicz J, Pan S J, Samarabandu J K, Liou W S, He G S, Berezney R, Cheng P C and Prasad P N 1996 Three-dimensional laser scanning two-photon fluorescence confocal microscopy of polymer materials using a new, efficient upconverting fluorophore Scanning 18 562-6... 

---