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Nanostructured materials scanning tunneling microscopy

Nanostructured materials have also been formed by scanning tunneling microscopy (STM) [24], scanning electrochemical microscopy (SECM) [25], and atomic force microscopy (AFM) [26], Recent reports on the modification of atomic sites at bare surfaces by STM [27] and the formation of nanometer-scale defects by STM [28] and AFM [29] illustrate the power of these techniques. [Pg.5]

Garcia, N. (1991). Scanning tunneling microscopy and force microscopy applied to magnetic materials. In Science and Technology of Nanostructured Materials. Eds. G. C. Hadjipanayis and G. A. Prinz. NATO ASI Series B Physics, Vol. 259. Plenum Press, London, pp. 301-30. [Pg.301]


See other pages where Nanostructured materials scanning tunneling microscopy is mentioned: [Pg.249]    [Pg.219]    [Pg.338]    [Pg.52]    [Pg.17]    [Pg.405]    [Pg.693]   


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