Materials science scanning electron microscopy

Thiel, B.L. (2004). Imaging and analysis in materials science by low vacuum scanning electron microscopy. International Materials Reviews 49 109-122. 

A nondestructive method may be applied to a sample with relatively simple composition, but for a more complex sample, digestion processes are recommended, which are destructive. Beam analysis is recommended as a nondestructive method for samples with simple composition. The reliability of the analytical information for the beam analysis technique is assured by reproducibility and homogeneity of surfaces. It is necessary to clean the surfaces before the analytical process. Also, there are mechanical steps used for sample preparation to assure surface homogeneity. Conventional scanning election microscopy (SEM) is widely used as an analytical tool.38 4(1 Variable pressure scanning electron microscopy (VP-SEM) opens new opportunities in the field of materials science. Samples such as liquids can be analyzed using the VP-SEM technique without any prior preparation method (e.g., the characterization of two-phase crude petroleum from the... 

A. Y Crewe, High intensity electron sources and scanning electron microscopy, in Electron microscopy in material science, ed. U. Valdre (Academic Press, New York, pp. 162-207 1971). 

Wells OC (2001) Scanning electron microscopy. In Encyclopedia of materials science and technology. Elsevier, Amsterdam, pp 8265-8269... 

Scientific Working Group on Materials Analysis (SWG-MAT) (2002) Standard guide for using scanning electron microscopy/X-ray spectrometry in forensic paint examinations. Forensic Science Communications, U.S. Department of Justice, FBI, October 2002 vol. 4(4). Online http //www.fbi.gOv/hq/lab/fsc/backissu/oct2002/bottr-ell.htm. 

Scanning electron microscopy (SEM) is one of the most versatile and widely used of the surface analytical techniques as it allows both the morphology and composition of various materials in modern science to be studied. It is considered a relatively rapid. 

Thornton, P. R., (1968), Scanning Electron Microscopy, Applications to Materials and Device Science, Chapman and Hall, London. 

Material Science and Engineering. An application of scanning electron microscopy involves using an energy-dispersive X-ray spectroscopy system, which examines the phases of minerals and metals, as well as determines the size, shape, and distribution of particles. Using high-resolution electron microscopy, the molecular arrangements of polymers (such as plastics) can be viewed. 

Ramachandran, V. S. and J. J. Beaudoin. 2001. Handbook of Analytical Techniques in Concrete Science and Technology. Building Materials Science Series. Norwich, NY Noyes Publications. A handbook of analytical techniques for new types of concrete and related materials. The techniques range from chemical and thermal analysis to IR and nuclear magnetic resonance spectroscopy to scanning electron microscopy, x-ray diffraction, computer modeling, and more. Available online on Knovel. 

Figure 20 Raman spectra obtained from a-Geo.o4Co96 films annealed at several temperatures. The solid line is the fitted spectrum, as discussed in the text. The D and G bands are also plotted (dashed lines) [57]. (Reprodueed from Diamond and Related Materials, 8, Mariotto, G., et al., Raman spectroscopy and scanning electron microscopy investigation of annealed amorphous carbon germanium films deposited by d.c. magnetron scattering, pp. 668-672. Copyright 1999, with permission from Elsevier Science.)...

The research activities in the field of electrochemical materials science included electrochemical studies of metals and alloys, which were conducted, employing such methods as cychc voltammetry, electrochemical impedance spectroscopy, quartz crystal nanogravimetry, etc. These investigations in all cases were supported by the characterization of crystalline structure and chemical and phase composition of deposited layers, by means of transmission electron microscopy (TEM), electron diffi action, scanning electron microscopy with microprobe (EDX) analysis. X-ray and Auger electron spectroscopies (XPS), and X-ray diffraction (XRD) techniques. The latter studies were conducted in collaboration with the colleagues from the ICh department of materials strucmre characterization (R. Juskenas, A. Selskis, and V. Jasulaitiene). 

The surface morphology of spray-dried emulsions was analysed by scanning electron microscopy (Hitachi S4800, Hitachi High-Technologies Corporation, Tokyo, Japan) at 3 kV and ambient temperature. Powder samples were deposited on aluminium SEM stubs coated with double-sided adhesive carbon tabs (Leit adhesive carbon tabs) and sputter coated with a layer of 6-7 nm thickness of gold. Fibrils were also characterised using atomic force microscopy (NanoWizard 3, JPK Instruments AG, BerUn, Deutschland) in cooperation with the Institute for Material Science, Kiel University. For details refer to Serfert et al. [56]. 

Many material science laboratories now have the possibility of carrying out scanning transmission electron microscopy (STEM) in addition to TEM. As yet, however, STEM has not played a significant role in studying block copolymer structures. Scanning electron microscopy (SEM) on the other hand has played a part in investigating crystalline textures. Its lower resolution, however, has meant it has not been helpful in studying domains. 

Scanning electron microscopy (SEM) is a very powerful and versatile technique used in materials science with a major impact on the applications of microscopy due to the variety of surfaces that can be observed using a relatively simple approach. 

Liu J (2000) Scanning transmission electron microscopy of nanoparticles. In Characterization of Nanophase Materials. Wang ZL (ed) p 81-132. Wiley-VCH, Weinheim, FRG Linford RG (1973) Surface thermodynamics of solids. In Green M (ed) Solid State Surface Science 2 p 1-152. Dekker, New York... 

---