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Field detector

In SEM and STEM, all detectors record the electron current signal of tire selected interacting electrons (elastic scattering, secondary electrons) in real time. Such detectors can be designed as simple metal-plate detectors, such as the elastic dark-field detector in STEM, or as electron-sensitive PMT. For a rigorous discussion of SEM detectors see [3],... [Pg.1633]

Figure Bl.17.3. STEM detectors (a) conventional bright and dark-field detectors, electrons are detected according to their different scattering angles, all other positional infonnation is lost (b) positional detector as developed by Haider and coworkers (Haider etal 1994). Figure Bl.17.3. STEM detectors (a) conventional bright and dark-field detectors, electrons are detected according to their different scattering angles, all other positional infonnation is lost (b) positional detector as developed by Haider and coworkers (Haider etal 1994).
Fig. 7. Fluorescence polarization (FP). (a) The formation of the large FITC—protein A—IgG complex which leads to a net increase in plane polarized light transmitted from the solution. Molecular weights of the protein A-FITC, IgG, and complex are ca 43,000, 150,000, and 343,000, respectively, (b) Detection of IgG by fluorescence polarization immunoassay using A, a laboratory fluorimeter where (O) represents AP = change in polarization, and B, a portable detection unit where (D) is —fiV = change in voltage (27). The field detector proved to be more sensitive than the fluorimeter. Fig. 7. Fluorescence polarization (FP). (a) The formation of the large FITC—protein A—IgG complex which leads to a net increase in plane polarized light transmitted from the solution. Molecular weights of the protein A-FITC, IgG, and complex are ca 43,000, 150,000, and 343,000, respectively, (b) Detection of IgG by fluorescence polarization immunoassay using A, a laboratory fluorimeter where (O) represents AP = change in polarization, and B, a portable detection unit where (D) is —fiV = change in voltage (27). The field detector proved to be more sensitive than the fluorimeter.
The annular dark-field detector of the field-emission STEM (see Figure 2) provides a powerful high-resolution imaging mode that is not available in the conventional TEM or TEM/STEM. In this mode, images of individual atoms may be obtained, as shown in Figure 4 (see Isaacson, Ohtsuki, and Utlaut ). Some annular dark-field... [Pg.167]

S. J. Pennycook. EMSA Bulletin. 19, 67, 1989. A summary of compositional imaging using a high-angle annular dark-field detector in a field emission STEM instrument published by the Electron Microscopy Society of America, Box EMSA Woods Hole, MA 02543. [Pg.174]

Magnetic field detectors (superconducting quantum interference devices or SQUIDS). [Pg.380]

S5mthetic resin-embedded alfalfa samples were oven dried at 65 °C for 24 h and cut at 40-90 nm. The slides were analyzed using a JEOL 2010-F TEM prepared with field emission gun, EDS, and a high angle annular dark field detector for the analysis of solitary nanoparticles. [Pg.407]

D Position Sensitive Detectors are multi-wire electrical-field detectors. The principal limitation of the total counting rate reduces the applicability at a synchrotron beamline in particular for 2D detectors. But even strong, narrow peaks pose a problem, because the whole image is distorted as soon as local saturation occurs. The detector response is changing, because the wires are worn out by use. [Pg.75]

Detection, Biological The military has a limited number of field detectors that can identify biological agents, but if you happen to be a local or state responder the bulk of biological agent identification work will actually be done in a biological laboratory such as found in hospitals, research universities, or the Centers of Disease Control in Atlanta, Georgia. [Pg.305]

Figure 1 Diagrams showing the essential electron-optical configurations used for various imaging modes in CTEM and STEM as seen by two points A and B on the sample, (a) CTEM axial bright field, (b) CTEM tilted dark field, (c) CTEM hollow cone dark field, and (d) STEM with bright field and annular dark field detectors. Figure 1 Diagrams showing the essential electron-optical configurations used for various imaging modes in CTEM and STEM as seen by two points A and B on the sample, (a) CTEM axial bright field, (b) CTEM tilted dark field, (c) CTEM hollow cone dark field, and (d) STEM with bright field and annular dark field detectors.
Describe some of the desirable characteristics of field detectors. [Pg.797]

Power for the control panel should be provided with a suitable uninterrupted power supply (UPS). The panel will provide a DC current to field detectors. This power will enable the panel to monitor all input circuits, output circuits, and trouble signals within the detectors, such as shorts, ground faults, and detector disconnects. It will also provide an AC powering signal to field output devices. All output circuits should be similarly supervised for trouble. An example alarm and detection control panel is shown in Figure 7-18. [Pg.185]

This performance can, in fact, be measured, since magnetic field detectors detect little or no magnetic field surrounding the flux path (or even around the magnet in the flux path at an inch or two away from it), and yet coils placed in the spatial flux path outside the core interact with the field-free A potential that is still there. A coil placed around the flux path so that the flux path constitutes its core, interacts with both the field-free A potential outside the material flux path core, and simultaneously—via the magnetic field inside the coil—with the magnetic field flux energy inside the core. [Pg.729]

The high spatial resolution of the designed MM is provided first of all by application of the ferromagnetic needle between the magnetic field detector and the TO it acts as a magnetic concentrator. [Pg.198]

Fig. 7.6 Scheme of a scanning transmission electron microscope with bright- and dark-field detectors. ADF annular dark field HAADF high-angle annular dark field. (Adapted from [7]). [Pg.187]

We shall conclude this chapter with a few speculative remarks on possible future developments of nonlinear IR spectroscopy on peptides and proteins. Up to now, we have demonstrated a detailed relationship between the known structure of a few model peptides and the excitonic system of coupled amide I vibrations and have proven the correctness of the excitonic coupling model (at least in principle). We have demonstrated two realizations of 2D-IR spectroscopy a frequency domain (incoherent) technique (Section IV.C) and a form of semi-impulsive method (Section IV.E), which from the experimental viewpoint is extremely simple. Other 2D methods, proposed recently by Mukamel and coworkers (47), would not pose any additional experimental difficulty. In the case of NMR, time domain Fourier transform (FT) methods have proven to be more sensitive by far as a result of the multiplex advantage, which compensates for the small population differences of spin transitions at room temperature. It was recently demonstrated that FT methods are just as advantageous in the infrared regime, although one has to measure electric fields rather than intensities, which cannot be done directly by an electric field detector but requires heterodyned echoes or spectral interferometry (146). Future work will have to explore which experimental technique is most powerful and reliable. [Pg.348]

Materials with very narrow ESR lines (AHpp < 20 mG) can be used as small-volume and low-power magnetic sensors of great sensitivity. Such devices would have applications as submarine mine detectors, local terrestrial magnetic field detectors [65,66], and for the identification of objects with an added suitable paramagnetic substance [67]. [Pg.303]

Improved annular dark field detectors for the scanning transmission electron microscopes may assist in detecting lnm crystallites. For tailoring a catalyst to a specific reaction, one must be able to relate the structure of the site to catalytic activity and selectivity. Possibly future developments in high resolution electron microscopy will address this problem. [Pg.280]

Such is not the case if, instead of the axial detector, we employ the annular dark-field detector for which P la 1, where P is the effective angle subtended by the detector. Under these circumstances we anticipate that phase contrast will not contribute significantly to the image. Instead, modulation of the amplitude-contrast transfer function should be noted in an image if, for example, a probe of FWHM comparable to atomic separations is scanned across a sharp edge or a periodic structure. This is observed in Figure 8, in which a probe of FWHM 3 A is scanned across... [Pg.90]

Figure 12 SAD channelling pattern recorded with annular dark-field detector for Au single crystal... Figure 12 SAD channelling pattern recorded with annular dark-field detector for Au single crystal...
Microdiffraction.—Perhaps more important than SAD techniques, particularly in the context of catalyst research, microdiffraction allows the user to benefit from the small probe size generated in STEM in the structural analysis of small particles and localized areas in thin foils. If the small probe is stopped on a particle, then clearly a transmission diffraction pattern will be observable after the beam has traversed the sample, provided we have the means available for its display. In CTEM such a pattern will, of course, be formed by the imaging system in a manner identical to SAD, but in STEM the pattern must be scanned across the detector. This is accomplished by means of a set of post-specimen scan coils which once more scan the diffracted beams across the axial bright-field detector. Such a pattern is shown in Figure 13 where a beam of approximately 10 A FWHM was stopped on a small second-phase particle during the omega-phase transformation in a Zr-Nb alloy. The relatively poor definition of the reflection is a consequence of both the convergent nature in the probe (necessary in order to obtain the smallest probe sizes) and a S/N limited by the available current in the probe. Nevertheless, weak reflections with half-order indices are clearly visible between the main alloy reflections and it is therefore possible to attempt structural... [Pg.95]


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See also in sourсe #XX -- [ Pg.789 ]




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Annular dark-field detector

Detector electric field variations

Detector field of view

Detectors field-flow fractionation

Electric field detectors

Field consistency, detectors

High-angle annular dark- field detector

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