Bright-field

In the simplest case of bright-field imaging, the CTF can easily be deduced the elastically scattered electron... 

Figure Bl.18.4. The most frequently used illumination system in bright-field mieroseopy.

Figure 6.4. Bright-field micrograph and SADP of deformation twins in Al-4.8 wt.% Mg shock loaded to 13 GPa at 100 K.

Figure 2 Bright-field TEM image of polyether sulphone inclusions (dark objects see arrows) in a polystyrene matrix.

Figure 4 (a) Bright-field image from a small region of a Ni3AI sample containing ori-... 

There are three primary image modes that are used in conventional TEM work, bright-field microscopy, dark-field microscopy, and high-resolution electron microscopy. In practice, the three image modes differ in the way in which an objective diaphragm is used as a filter in the back focal plane. 

In bright-field microscopy, a small objective aperture is used to block all diffracted beams and to pass only the transmitted (undiffracted) electron beam. In the... 

Figure 3 Bright-field (a) and dark-field (b) STEM images of crushed ceramic particles dispersed on a "holey" carbon film supported on an electron microscope grid (shown at the right).

Fig. 4.26. Typical X-ray spectra (a) STEM bright-field image of a polycrystalline Zr02/TiC ceramic with a triple junction (b) corresponding EDX spectrum.

Fig. 4.29. EDXS line-profile analysis across the interfacial region of a C-fiber reinforced SiC composite and corresponding TEM bright-field image.

Heller, m. heller (roo krone) farthing, hellfarbig, a. light-colored, Hellfeldbeleuchtung, /. bright-field illumination. 

Fig. 3 (left) TEM bright-field and (middle) dark-field images, and (right) selected area diffraction pattern from a 20 vol% Si3N4/5052 Al composite at 548 °C. (from Ref. [8,9])... 

Fig. 6—Bright field high resolution TEM image of 2 nm thick ta-C coating deposited on Si substrate by FCVA.

Figure 2. (a) Bright field STEM image of small gold crystals on... 

Figure 2. Electron micrographs of synthetic aurlchalclte, (Cuo.3Zno.7)5(C03)2(OH)6. (a) Bright field Image, (b) Selected...

Figure 4. Electron micrographs of mineral aurichalcite calcined at 400 C for 4 hours, (a) Bright field image, (b) Selected area diffraction pattern showing ZnO orientations with zone axes of [1010], [3031] and [5051]. See text for other ZnO orientations.

Figure 6a and b. Electron micrographs of mineral aurichalcite calcined at 350°C for 4 hours and reduced in a 1% H2/N2 gas mixture, (a) and (b) bright field images. 

Figure 6. Digital x-ray imaging of zeolite ZSM-5 (Si/Al 49,5) thin section a) bright-field STEM image, b) A1 x-ray image smoothed by averaging each pixel with its 8 nearest neighbors. The darker shading within the particle indicates higher A1 content. The circular field is due to the image of the selected area diffraction aperture.

---