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Electron current

Figure Bl.6.11 Electron transmission spectrum of 1,3-cyclohexadiene presented as the derivative of transmitted electron current as a fiinction of the incident electron energy [17]. The prominent resonances correspond to electron capture into the two unoccupied, antibonding a -orbitals. The negative ion state is sufficiently long lived that discrete vibronic components can be resolved. Figure Bl.6.11 Electron transmission spectrum of 1,3-cyclohexadiene presented as the derivative of transmitted electron current as a fiinction of the incident electron energy [17]. The prominent resonances correspond to electron capture into the two unoccupied, antibonding a -orbitals. The negative ion state is sufficiently long lived that discrete vibronic components can be resolved.
Let the rate of the event under study be R. It will be proportional to the cross section for the process under study, a, the incident electron current, Iq, the target density, n, the length of the target viewed by the detectors,, the solid angles subtended by the detectors, Aoi and A012 the efficiency of the detectors, and... [Pg.1429]

In SEM and STEM, all detectors record the electron current signal of tire selected interacting electrons (elastic scattering, secondary electrons) in real time. Such detectors can be designed as simple metal-plate detectors, such as the elastic dark-field detector in STEM, or as electron-sensitive PMT. For a rigorous discussion of SEM detectors see [3],... [Pg.1633]

Except for the phase-contrast detector in STEM [9], STEM and SEM detectors do not track the position of the recorded electron. The spatial information of an image is fonned instead by assigning the measured electron current to the known position of the scaimed incident electron beam. This infomiation is then mapped into a 2D pixel array, which is depicted either on a TV screen or digitalized in a computer. [Pg.1633]

The total electron current generated in this process is given by the Fowler equation ... [Pg.1892]

In order to represent further geometric features, modifications of Eq, (16) were introduced. The influence of the electronic current in double bonds was incorporated by Eq. (17). [Pg.526]

Diagram showing a flow of ions of m/z a, b, c, etc. traveling in bunches toward the front face of a microchannel array. After each ion strikes the inside of any one microchannel, a cascade of electrons is produced and moves toward the back end of the microchannel, where they are collected on a metal plate. This flow of electrons from the microchannel plate constitutes the current produced by the incoming ions (often called the ion current but actually a flow of electrons). The ion.s of m/z a, b, c, etc. are separated in time and reach the front of the microchannel collector array one set after another. The time at which the resulting electron current flows is proportional to V m/z). [Pg.198]

Where space is not a problem, a linear electron multiplier having separate dynodes to collect and amplify the electron current created each time an ion enters its open end can be used. (See Chapter 28 for details on electron multipliers.) For array detection, the individual electron multipliers must be very small, so they can be packed side by side into as small a space as possible. For this reason, the design of an element of an array is significantly different from that of a standard electron multiplier used for point ion collection, even though its method of working is similar. Figure 29.2a shows an electron multiplier (also known as a Channeltron ) that works without using separate dynodes. It can be used to replace a dynode-type multiplier for point ion collection but, because... [Pg.206]

The electron current density J has units of A/cm and in a semiconductor results from drift and diffusion. In the absence of concentration gradients, equation 7 reduces to Ohm s law, = nqp E = [Pg.346]

HBT Device Characteristics. The HBT consists of two back-to-back n—p diodes. In the most typical configuration the emitter—base diode is forward biased, with the coUector-base diode reverse biased. Because the current ia a forward-biased n—p diode is exponentiaUy dependent on the bias, smaU changes ia the emitter-base voltage result ia large changes ia the emitter current. The current across the emitter-base junction is a combination of the electrons iajected iato the base and the holes iajected iato the emitter. If the diode was semi-infinite to each side, the electron current density,/, could be expressed as foUows (44), where q is the electron charge, Vis the bias across the diode, kT... [Pg.374]

Both reactions indicate that the pH at the cathode is high and at the anode low as a result of the ion migration. In principle, the aeration cell is a concentration cell of H ions, so that the anode remains free of surface films and the cathode is covered with oxide. The J U curves in Fig. 2-6 for anode and cathode are kept apart. Further oxidation of the corrosion product formed according to Eq. (4-4) occurs at a distance from the metal surface and results in a rust pustule that covers the anodic area. Figure 4-2 shows the steps in the aeration cell. The current circuit is completed on the metal side by the electron current, and on the medium side by ion migration. [Pg.141]

Similarly to Eq. (2.6), fCis a proportionality constant containing fixed operating conditions, for example incident electron current density, transmission of the analyzer at the kinetic energy Ea, efficiency of the detector at the kinetic energy Ea, and the probability of the Auger transition XYZ. [Pg.40]

This kind of estimation of the relative concentration is the most widely used method for quantitative EELS analysis. It is advantageous because the dependence on the primary electron current, Iq, is cancelled out this is not easily determined in a transmission electron microscope under suitable analytical conditions. Eurthermore, in comparison with other methods, e. g. Auger electron spectroscopy and energy-disper-... [Pg.66]

To date, the usual way of recording the LEED pattern is a light-sensitive video camera with a suitable image-processing system. In older systems movable Earaday cups (EC) were used which detected the electron current directly. Because of long data acquisition times and the problems of transferring motion into UHV, these systems are mostly out of use nowadays. [Pg.73]

Older experimental arrangements used Earaday cups with small apertures mounted on goniometers, which could be moved around the sample to collect the back-scattered electron current directly, or spot photometers, which were directed at one dif-... [Pg.80]

The principal advantages of AEAPS and DAPS over SXAPS is that they can be operated at much lower primary electron currents, thus causing less disturbance to any adsorbed species. [Pg.275]

As has been demonstrated by various authors an expression for the photo electron current intensity l E,k,ms uj,q, ) observed in VB-photo emission can be derived by... [Pg.187]

Here is the p-th spatial component of the electronic current operator j and. .. )conf. denotes the atomic configuration average for a disordered alloy. [Pg.284]

Anodic passivation also allows titanium to be employed as a Jig for aluminium anodising baths ", because the protective anodic film formed on titanium allows passage of electronic current to the metal contact while virtually suppressing flow of ionic current through the anodically-formed surface film. This aspect is discussed in more detail in relation to special applications. [Pg.876]

The hole current in this LED is space charge limited and the electron current is contact limited. There are many more holes than electrons in the device and all of the injected electrons recombine in the device. The measured external quantum efficiency of the device is about 0.5% al a current density of 0.1 A/cm. The recombination current calculated from the device model is in reasonable agreement with the observed quantum efficiency. The quantum efficiency of this device is limited by the asymmetric charge injection. Most of the injected holes traverse the structure without recombining because there are few electrons available to form excilons. [Pg.190]


See other pages where Electron current is mentioned: [Pg.1308]    [Pg.1313]    [Pg.2992]    [Pg.437]    [Pg.294]    [Pg.203]    [Pg.344]    [Pg.442]    [Pg.292]    [Pg.414]    [Pg.414]    [Pg.28]    [Pg.374]    [Pg.331]    [Pg.376]    [Pg.338]    [Pg.175]    [Pg.232]    [Pg.236]    [Pg.179]    [Pg.239]    [Pg.328]    [Pg.125]    [Pg.127]    [Pg.242]    [Pg.242]    [Pg.276]    [Pg.193]    [Pg.232]    [Pg.234]   
See also in sourсe #XX -- [ Pg.15 ]

See also in sourсe #XX -- [ Pg.172 ]




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4-current many-electron case

Bond electrons, current density

Conductivity measurements direct current electronic

Conductivity measurements steady-state electronic current

Current densities electron transfer kinetics

Current electronic/ionic

Current multiple-electron transfers

Current understanding of ultrafast electron transfer

Current-potential relationship for steady-state electron transfer

Electrical current amperes , measuring electron flow

Electron Beam Induced Current

Electron Charge and Current Density

Electron beam current

Electron beam induced current EBIC)

Electron capture detector background current

Electron capture detector standing current

Electron current density

Electron current problems

Electron delocalization ring current maps

Electron emission current from metals

Electron excitation current density

Electron hole current

Electron particle current

Electron transfer coefficients current density-overpotential

Electron transfer current

Electron-beam-induced current materials

Electron-capture detector constant current

Electronic Selected Current Aerospace Notices

Electronic current

Electronic current density

Electronic current density fields

Electronic current density paramagnetic contributions

Electronic current, limiting factors

Electronic current, mechanism

Electronic hole current

Electronic properties, layer redox currents

Leakage currents, electronic devices

Limiting current electron transfer

Local electron currents

Metals, electron emission current

Nonlocal electron currents

Reversal electron current against the proton motion

Reverse Currents, Electron and Hole Injection

Some Current Statements Concerning a and n Electrons

Switching, electronic current-voltage characteristics

Transmission electron microscopy current instruments

Vibrationally induced electronic currents

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