High spatial resolution

Plenary 8. J Grave et al, e-mail address J.Greve tn.utwente.nl (RS). Confocal direct unaging Raman microscope (CDIRM) for probing of the human eye lens. High spatial resolution of the distribution of water and cholesterol in lenses. 

Figure Bl.19.30. Height and friction images of a spin-cast polystyrene-poly(methyl methacrylate) blend obtained with (a) gold and (b) silica probes under perfluorodecalin. Note the reversal of frictional contrast and the high spatial resolution. (Taken from [142], figure 7.)...

Hamann H F, Gallagher A and Nesbitt D J 1999 Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution Appl. Phys. Lett. 75 1469-71... 

A principal advantage of the Raman microprobe is that the optics are those of a conventional light microscope a wide variety of special-purpose objectives developed for materials and biological microscopy are available. The Raman microprobe also offers the advantage of fluorescence reduction owing to the high spatial resolution of the microscope if a region of low fluorescence can be chosen for observation. 

Overall a customer needs to know under what circumstances it is best to use either the electron-beam techniques of EDS and WDS or the X-ray technique of XRF for an analysis problem. If both are equally available, the choice usually resides in whether high spatial resolution is needed, as would be obtained only with electron-beam techniques. If liquids are to be analyzed, the only viable choice is XRF. If one s choice is to use electron-beam methods, the further decision between EDS and WDS is usually one of operator preference. That is, to commence study on a totally new sample most electron-beam operators will run an EDS spectrum first. If there are no serious peak overlap problems, then EDS may be sufficient. If there is peak overlap or if maximum sensitivity is desired, then WDS is usually preferred. Factored into all of this must be the beam sensitivity of the sample, since for WDS analysis the beam current required is lO-lOOx greater than for EDS. This is of special concern in the analysis of polymer materials. 

Quantitative Microanalysis with High Spatial Resolution. (G. W. Lorimer, M. H. Jacobs, and P. Doig, eds.) The Metals Society, London, 1981. Research papers giving results from many materials. 

The principal applications of REELS are thin-film growth studies and gas-surface reactions in the few-monolayer regime when chemical state information is required. In its high spatial resolution mode it has been used to detect submicron metal hydride phases and to characterize surface segregation and difRision as a function of grain boundary orientation. REELS is not nearly as commonly used as AES orXPS. 

An additional advantage to neutron reflectivity is that high-vacuum conditions are not required. Thus, while studies on solid films can easily be pursued by several techniques, studies involving solvents or other volatile fluids are amenable only to reflectivity techniques. Neutrons penetrate deeply into a medium without substantial losses due to absorption. For example, a hydrocarbon film with a density of Ig cm havii a thickness of 2 mm attenuates the neutron beam by only 50%. Consequently, films several pm in thickness can be studied by neutron reflecdvity. Thus, one has the ability to probe concentration gradients at interfaces that are buried deep within a specimen while maintaining the high spatial resolution. Materials like quartz, sapphire, or aluminum are transparent to neutrons. Thus, concentration profiles at solid interfaces can be studied with neutrons, which simply is not possible with other techniques. 

Like XPS, the application of AES has been very widespread, particularly in the earlier years of its existence more recently, the technique has been applied increasingly to those problem areas that need the high spatial resolution that AES can provide and XPS, currently, cannot. Because data acquisition in AES is faster than in XPS, it is also employed widely in routine quality control by surface analysis of random samples from production lines of for example, integrated circuits. In the semiconductor industry, in particular, SIMS is a competing method. Note that AES and XPS on the one hand and SIMS/SNMS on the other, both in depth-profiling mode, are complementary, the former gaining signal from the sputter-modified surface and the latter from the flux of sputtered particles. 

SAM) and TEM. An Auger electron spectrometer with high spatial resolution imaging capability was developed especially for the detection of small particles and defects which might be present in the ULSI regime this enabled the inspection of wafers up to 200 mm in diameter [2.150]. 

With the use of appropriate transmission optics, high focusing of the laser light is carried out and the extension of the optical probe is considerably reduced. Accordingly, laser-based techniques offer the possibility of measurements of high spatial resolution. 

The combination of atomic force microscopy (AFM) and Raman spectroscopy is another approach to attain high spatial resolution. AFM also employs a sharp tip close to a sample surface. When the tip is made of metal and light is irradiated onto the tip and surface, Raman scattering is largely enhanced. In this way, a spatial resolution of 15 nm is achieved [2]. 

In summary, recent progress and future prospects in the research field of fiuorescence and Raman spectroscopy combined with STM in order to achieve high spatial resolution spectroscopy have been reviewed. In the near future, single (sub-) molecule STM spectroscopy is expected to be applied to the nano-world of science and engineering. 

In summary, the NLE technique offers a concepmally new approach to observe NFS. Existing limits for time resolution could be overcome by a microfocused synchrotron beam (as planned for PETRA III) and by detectors with high spatial resolution and background from SAXS could be suppressed by employing high-energy transitions and crystalline sapphire as rotor material. 

There are two principal sources of reliable partitioning data for any trace element glassy volcanic rocks and high temperature experiments. For the reasons outlined above, both sources rely on analytical techniques with high spatial resolution. Typically these are microbeam techniques, such as electron-microprobe (EMPA), laser ablation ICP-MS, ion-microprobe secondary ion mass spectrometry (SIMS) or proton-induced X-ray emission (PIXE). 

Human skin is the largest organ in the human body. It is fundamentally important to health as the semi-permeable barrier - the first line of defence - between the body and the external world. However, it remains relatively inaccessible to conventional magnetic resonance imaging, firstly because it is thin and therefore requires high spatial resolution, and secondly because it is characterized by relatively short T2 relaxation times, particularly in the outermost stratum comeum. Conventional studies have not usually achieved a resolution better than 70-150 pm, with an echo time of the order of a millisecond or so. As a planar sample, skin has proved amenable to GARField study where it has been possible to use both a shorter echo time and achieve a better spatial resolution, albeit in one direction only. Such studies have attracted the interest of the pharmaceutical and cosmetic industries that are interested in skin hydration and the transport of creams and lotions across the skin. 

Fig. 5.2.7 Identification of location and size of local pulses within the trickle bed. A high spatial resolution image (in-plane spatial resolution 1 75 [tm x 175 im slice thickness 1 mm) is overlayed with a standard deviation map calculated from images acquired at a spatial resolution of in-plane spatial resolution 1.4 mm x 2.8 mm slice thickness 2 mm.

High spatial resolution (laser beam diameter 1 p,m)... 

---