Cross-sectional scanning electron microscopy

Damage mode Visual 1-50 x fracture surface Metallography 50-1000 x (cross-section) Scanning electron microscopy, 20-10000 x (fracture surface)... 

Figure 1.12 Cross-sectional scanning electron microscopy images of EPD-fabricated composites or multilayered coatings (a) Laminate coatings of chitosan (Ch) and HA (H) with different layers on a graphite substrate (S) (b) 10 alternating layers of AI2O3 and Zr02 (c) polyacrylic acid films containing halloysite nanotubes (white arrows) on the platinized sihcon wafer substrate (d) sodium hyaluronate and bovine serum albumin composite films (H + B) on a graphite substrate (S).

Figure 14.5 Local InGaN growth rate and In composition. Inset is a cross-sectional scanning electron microscopy (SEM) image estimated. Broken line drawn for the In viewed along the [1100] direction. Numbers composition is to guide the eye.

Figure 14.6a shows the cross-section scanning electron microscopy (SEM) image of the electrolyte and hydrogen membrane. Before preparation of the cross-section sample, the tungsten protection layer was coated on the electrolyte layer to avoid damage. As seen, a solid and uniform electrolyte layer without... 

Figure 5.14 (a) A schematic illustration of oblique angle deposition (b) Top and (c) cross-sectional scanning electron microscopy Images of the Ag nanorod array SERS substrates. 

FIGURE 18.8 Cross-sectional scanning electron microscopy (SEM) images of commercial RO membrane (Koch TFC-HR) (a) before and (b) after iCVD surface modification. (Data from R. Yang et al, Chem Mater, 23,1263-1272, 2011.)... 

Figure 3. Images of a cross-section of carbon fibers after propylene pyrolysis. 3a Scanning Electron Microscopy of a piece of the carbon cloth. 3b optical microscopy (crossed polarizers with a wave retarding plate).

Fig. 14.14 Transmission electron microscopy images of ultra-microtomed halloysite G nanotubes before, longitudinal and, in the inset, perpendicular cross-section (A), and image afterCaC03 formation (B). Scanning electron microscopy images of halloysite G nanotubes before (C) and after (D) CaC03 formation.

Scanning electron microscopy indicated that the zeolites crystals are homogeneously dispersed in the surface and the core of the composites. Figure 2 presents micrographs of cross-sections of the chitosan-zeolite spheres and shows that the morphology of the zeolite crystals has not been affected by the gelling of chitosan. 

In an article published in Analytical Chemistry in 2004, Keune and Boon [2004a] present the application of ToF-SIMS analysis to a paint cross-section. The sample used was from the panel painting The Descent from the Cross (Museo del Prado, Madrid) by the early Flemish painter Rogier van der Weyden (1399/1400 1464). Scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDX) and infrared microscopy were also used to complete and confirm the results. 

FIGURE 4.8 Scanning electron microscopy (SEM) cross-sections of AISI430 coupons after 300 h of oxidation at 800°C in air under different exposure conditions (a) both sides exposed to air and (b) on the air side of the air/(H2 + 3%H20) exposures [154]. 

The scanning electron microscopy micrographs shown in the body of this manuscript were taken by AMR-1000 and Jeol C-35 instruments. All specimens were gold-palladium coated. To obtain the cross-section morphologies, the membranes were fragmented in liquid nitrogen. 

Various noncellulosic thln-film-composlte membranes were examined by scanning electron microscopy (SEM). Figure 3 illustrates the type of surface structure and cross-sections that exist in these membranes. Figure 3a shows the surface microporosity of polysulfone support films. Micropores in the film were measured by both SEM and TEM typically pore radii averaged 330 A. Figure 3b is a photomicrograph of a cross-section of a NS-lOO membrane. 

Pore dimensions may have a more subtle effect on decay rate depending on component dimensions and production method of the manufactured material. Products made from pasted starch, LDPE, and EAA (2) typically appeared as laminates of starch and plastic when examined by scanning electron microscopy (Figure 1). The dimensions of inter-laminate channels (i.e., pores) were not uniform and ranged from about 50 to 325 m in cross-section (22). Since flux is dependent on diffusional path area, the smaller pores can be an impediment to movement of solutes from the interior to the surface of the films. Figure 5 illustrates two films in which the laminate units are the same thickness, but differ in length. When the starch is removed... 

Fig. 73a,b. Multilayered film of two-dimensional polymer network a photograph, diameter 25 mm b cross-sectional view by scanning electron microscopy [444]... 

Figure 13.11—Scanning electron microscopy (SEM) accompanied by X-ray fluorescence analysis. Secondary electron image of a cross-section of a supraconducting polycrystalline ceramic with oriented grains of oxide BiPbiSriCaiCurO, (Philips instrument, model XL30FEG). Energy emission spectra corresponding to the matrix and to a 5 pm-long inclusion (bottom). It should be noted that it is possible with this technique to obtain the composition at a precise point on the sample (Link-Oxford analyser) (study by V. Rouessac, reproduced by permission of CRISMAT. University of Caen).

Figure 1. Scanning Electron Microscopy (SEM) images of a 4.1 mm diameter coke bean cross-section. Magnification (a) x75 (b) xl50, expansion of the outlined area in (a) to focus on the shell (c) x200. with further detail of the exterior shell. The SEM images were collected on a Jeol JSM-5300 scanning microscope.

Fig. 3A-C. Cross sectional views of gels A,B awl C obtained by scanning electron microscopy. Freezing rates were, A 3.78, B 0i0766,0.0.0329 in Cs 1...

Fig. 14 Scanning electron microscopy images of the silica-based MIP monolith cross-section of the formed monolith magnified (a) 800x and (b) 5,000 x. Reproduced with permission from [184]...

Fig. 15 Scanning electron microscopy images of (a) the top surface and (b) the cross-section of an MIP membrane, (c) the bottom surface of the MIP membrane (the surface contacting the glass substrate during solidification), (d) the cross-section of the control membrane. The inset in (a) is a Fourier transform of the top surface SEM image. Reproduced with permission from [214]...

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