Painting cross-sections

Keune K., Binding medium, pigments and metal soaps characterized and localized in paint cross sections, PhD Dissertation, University of Amsterdam, 2005. 

In an article published in Analytical Chemistry in 2004, Keune and Boon [2004a] present the application of ToF-SIMS analysis to a paint cross-section. The sample used was from the panel painting The Descent from the Cross (Museo del Prado, Madrid) by the early Flemish painter Rogier van der Weyden (1399/1400 1464). Scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDX) and infrared microscopy were also used to complete and confirm the results. 

K. Keune and J. J. Boon, Imaging secondary ion mass spectrometry of a paint cross section taken from an early Netherlandish painting by Rogier van der Weyden, Analytical Chemistry, 76, 1374 1385 (2004a). 

K. Keune, E. S. B. Ferreira and J. J. Boon, Characterization and localization of the oil binding medium in paint cross sections using imaging secondary ion mass spectrometry, Preprints of the 14th Triennial Meeting ofICOM CC Committee for Conservation, The Hague (Netherlands), 2, 796 802(2005). 

Van den Weeerd J, van Veen MK, Heeren RMA, Boon JJ (2003) Identification of pigments in paint cross sections by reflection visible light imaging microspectroscopy. Anal Chem 75 716-722. 

ULTRASENSITIVE CHEMILUMINESCENT IMMUNOCHEMICAL LOCALISATION OF PROTEIN COMPONENTS IN PAINTING CROSS-SECTIONS... 

The CL immunolocalization method allow to detect ovalbumin in aged paint cross-sections with a spatial resolution of the order of micrometers. This analytical approach could be extended to the detection of other proteinaceous components, (animal collagen, casein, etc). Different proteins could be also detected in the same... 

Scanning electron microscope (SEM) systems are ideal for a pictorial representation of morphological features of single layers of multilayered paint samples (particularly those not well contrasted by optical microscopy as the white ones) obtained by the contrast of secondary (SE) and backscattered electrons (BSE). An important advantage of SEM is the ability to analyze even the smallest smears for this purpose the smears are lifted from the underlying material using double-sided adhesive tape transferred to the sample holder (e.g., slide). Twenty micrometers microtome sections of paint cross-sections are recommended. In order to avoid electrical charging the samples have to be carbon coated or transferred into the chamber of a low vacuum system. 

A schematic representation of a paint cross section is reported in figure 4. 

Van den Berg et al. [185] has compiled a database of SIMS spectra of the most common inorganic pigments. ToF-SIMS offers some interesting possibilities for the spatially resolved analysis of (mixtures of) pigments in paint cross sections. However, the specific selectivity of the technique for different pigments needs to be taken into account. A further point of concern is interference with the embedding medium of the paint cross sections (matrix effect). 

Figure 7.13. Optical micrograph of an automotive paint cross-section obtained from a red Mazda. [Adapted, by permission, from Marie, M. van Bronswijk, W. Lewis, S. W. Pitts, K. Martin, D. E., Forensic Sci. Int, 228,165-169,2013.

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