Chemical information secondary sources

TOXLINE (non-royalty based) Toxicology Information Online National Library of Medicine 8600 Roekville Pike Bethesda, MD 20894 (301) 496-1131 On-line bibliographic database covering the pharmacological, physiological, and toxicological effects of drugs and chemicals. Information is taken from eleven secondary sources. 

The Toxicology Information Services at the Karolinska Institutet 1n Stockholm, Sweden, publish a monthly bulletin entitled Teratology Lookout. This excellent source of references of interest to experimental teratologists and clinicians is compiled by an advisory panel. The secondary sources Biological Abstracts, Biological Abstracts/RRM, and Chemical Abstracts and the MEDLARS data bases are scanned by the use of computer profiles to spot pertinent material. Keywords have been added to each reference, and most references include author addresses. The contents are divided into seven... 

Accuracy in an abstract journal is naturally of interest to users. Too many mistakes get into Chemical Abstracts, Nevertheless a good deal of care is exercised to keep abstracts accurate (much checking is done). Because an abstract journal is secondary information, not source material. Chemical Abstracts does not publish an erratum section, but the more serious mistakes and omissions discovered are corrected by the use of supplementary abstracts or by suitably worded index entries. 

AJHP is abstracted and indexed by all the major secondary sources (e.g., International Pharmaceutical Abstracts, Biological Abstracts, Chemical Abstracts, Cumulative Index to Nursing and Allied Health Literature, Current Contents Clinical Medicine, Current Contents Life Sciences, Excerpta Medica, Index Medicus, and the Iowa Drug Information Service. 

The Chemical Information Sources Wiki (http //cheminfo. informatics.indiana.edu/cicc/cis/index.php/Main Page) is a guide to the many sources of reference materials available for those with questions related to chemistry. The site includes information on primary, secondary, and tertiary pubheation sources, chemical information databases, physical property information, chemical patent searching, and molecular visualization tools and sites. The material is based on an undergraduate course offered for many years in the Indiana University Department of Chemistry by Gary Wiggins. 

A,3. SECONDARY SOURCES OF CHEMICAL INFORMATION. ABSTRACTING JOURNALS... 

We have seen that there are essentially three different kinds of information in the chemical literature — (1) numerical, (2) conceptual, (3) structural. Computerised retrieval from the primary literature is as yet embryonic, and we must therefore turn om attention mainly to secondary sources. The normal secondary sources deal largely with words, t. e. conceptual information, the other typ>es of information being dealt with by specialised systems. Computer search services therefore use machine-readable versions of the standard sources for cmrent-awareness, specialised systems being used for retrospective searching. 

The difficulty in obtaining public data on the volume, distribution, and use of chemicals by specific countries involved in the global chemical enterprise is reflected in this chapter, in which most of the numbers are derived from secondary sources and are largely aggregated according to region. There is also little publicly available information on the volume and distribution of chemicals used by academic and research laboratories, especially those in developing countries. The analysis of snpply and distribution to academic laboratories in particular is therefore supplemented by a bibliometric analysis of current chemical literatme. 

ABSTRACT. An attempt to construct the literature databases for inclusion complexes since the beginning of this century is illustrated. The original literatures were cited and cross-checked by several secondary sources including Chemical Abstracts. The existing database systems appear to be insufficient to obtain necessary information effi-... 

There are several MS-based techniques that can provide chemical information for thin and thick layers [12]. For very thin layers (sub to 1-2 monolayers), nondestructive techniques such as static SIMS [13], ion scattering MS [14], or MS of recoiled ions [15] are suitable. These techniques are also the best adapted for examining surface contamination. They are all based on surface interactions of an ion beam with the solid surface. For depth profiling of thin and thick layers, MS is associated with a destructive source of neutrals or ions dynamic SIMS, secondary neutron mass spectroscopy (SNMS), glow discharge mass spectroscopy (GD-MS), matrix-enhanced SIMS, laser desorption/ionization MS, and desorption electrospray ionization (DESI) MS [16]. Ions are either desorbed from the solid surface or generated by postionization of neutrals sputtered off the surface. 

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