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Ultrathin films deposition

The control of the deposition thickness is crucially important in the LCVD operation, regardless of the modes of operation. However, it is very difficult to measure the actual thickness of ultrathin film deposited on polymeric substrates. If an LCVD film is deposited on polymeric substrates, such as films, fibers, and molded articles, it is nearly impossible to determine the thickness by a simple nondestructive method that can be done quickly enough to monitor the LCVD operation. In order to circumvent this problem, the use of special substrates added or attached to the normal substrate is found to be satisfactory. A small piece of Si wafer is a typical case of this approach. Ellipsometer can measure the deposition on the Si wafer easily and quickly, which provides thickness and refractive index values. [Pg.259]

Stancell et. al. ( 0) reported the possible use of ultrathin films deposited onto relatively permeable substrates as permselective membranes. Ultrathin and highly crosslinked coatings effectively distinguish between molecules of different sizes and increase the permselectivity of the substrate film. Chang et. al. ( ) demonstrated that the permeability coefficient of silicone rubber to oxygen decreased noticeably after depositing a plasma-polymerized ethylene film on the surface. Colter, et. al. (92.93) found similar effects of plasma polymerized films as diffusion barriers in controlled-released drug delivery systems. [Pg.28]

Apart from scattering, which increases the DR spectral contrast of a film, and the intensity enhancement, a rough surface can give a specific contribution to the IR spectra of an ultrathin film deposited on this surface. As pointed out in Section 3.2.1, under ordinary experimental conditions, a surface polariton on a fiat surface is nonradiative. However, when the surface of an active medium is grated with a spacing a, the x-component of the incident-photon wave vector (Fig. 1.9) becomes [418]... [Pg.241]

In thin films, the picture of the film thickness influence on lattice constants is more complex than that in the powders and/or ceramics. First of all, this is related to the influence of mismatch between the film and substrate parameters, which leads to appearance of compressive or tensile mechanical strain normal to the film surface, similarly to the discussion in Sect. 2.1. This means, that parameter of a film tetragonality c/a l even in cubic phase. Moreover, the substrates, which induce large enough compressive strain, essentially impede thickness induced phase transition from ferroelectric to paraelectric phase, so that ferroelectricity can be conserved even in ultrathin films deposited on such substrates. As an example of such behavior, we show on Fig. 2.5 the ratio c/a measured for PbTiOs film on SrTi03 Nb substrate at r= 300 K [20]. It is seen, that similarly to the powders and ceramics, c/a ratio diminishes with the size (film thickness) decrease. However, up to the thickness 4 nm the ferroelectricity is retained and c/a remains to be more than the value 1.3, corresponding to the disappearance of ferroelectricity with respect to mechanical strain. [Pg.39]

Structural phase transition of poly-NIPAM was studied on ultrathin films deposited by plasma enhanced chemical vapor. The tip was modulated in lateral direction and kept stationary at a constant force by an active feedback. The temperature was varied and control via a small temperature device (MMR technology), which is based on resitive heating and a the Joule-Thompson element. The change in response amplitude (a) and the phase lag (b) were simultaneously recorded as a function of temperature. Measurements were carried out in small custom-made liquid cell in ultrapure water. Applied lateral modulation amplitude was 4.5 nm, modulation frequency 5 kHz, the temperature was changed in steps of 0.5 °C at a rate of O.l Cper minute. [Pg.187]

ALD, also known as atomic layer epitaxy (ALE), has gained more and more attention for ultrathin film deposition for applications in many fields such as optics and... [Pg.336]

Numerous monomers with long hydrocarbon chains can form monolayers at the gas-water interface and are also oriented at the surface of the water. Polymerization of such organized systems leads to the preparation of polymers with peculiar morphologies and properties. It is a method for polymer synthesis in ultrathin films in different forms, for instance, polymerization in ultrathin films deposited using the layer-by-layer method. By this method, polymeric microspheres containing chugs can be produced. [Pg.834]

Figure 24.1 (a) Capacitance versus voltage for a 9nm thick NCI2O3 ultrathin film deposited by aqueous chemical solution deposition (unpublished results), (b) MOS stack (upper) and MOS-FET device (lower) schemaHc. [Pg.770]

Figure 24.7 AFM, CV, thickness, and GATR-FTIR measurements of niobia ultrathin films deposited at maximum 150°C using UV/O3 treatment from aqueous dtrato- and tartratoniobatefV) precursor soiutions (unpubiished resuits). Figure 24.7 AFM, CV, thickness, and GATR-FTIR measurements of niobia ultrathin films deposited at maximum 150°C using UV/O3 treatment from aqueous dtrato- and tartratoniobatefV) precursor soiutions (unpubiished resuits).
We observed an extraordinary enhancement in bond orientational order, in ultrathin films deposited below their glass transition temperature, as revealed by extraordinary high values of the dielectric strength with respect to the bulk [1]. By varying the deposition conditions and the molecular size, we could tune the kinetic stability of the liquid phase enriched in bond orientational order (MROL) towards conversion into the ordinary liquid phase. [Pg.228]

Ultrathin films of CdS ranging in coverage from 25 to 200 ML were grown also by the previous method on Au substrates (of non-specified nature) and were characterized by quantitative Raman resonance [41], It was found that the electronic structure of the films in this coverage regime corresponds to that of bulk CdS. It was concluded also that ECALE does not involve growth by random precipitation of CdS onto the Au surface the thin deposited layers of the material were contiguous. [Pg.165]

Recently, ultrathin evaporated films have been used as models for dispersed supported metal catalysts, the main object being the preparation of a catalyst where surface cleanliness and crystallite size and structure could be better controlled than in conventional supported catalysts. In ultrathin films of this type, an average metal density on the substrate equivalent to >0.02 monolayers has been used. The apparatus for this technique is shown schematically in Fig. 8 (27). It was designed to permit use under UHV conditions, and to avoid depositing the working film on top of an outgassing film. ... [Pg.17]

Brennecka, G. Tuttle, B. 2007. Deposition of ultrathin film capacitors fabricated by chemical solution deposition. /. Mat. Res. 22 2868-2874. [Pg.74]

The developed sensor was used for ultrathin-film measurement. The reflection spectrum was shifted during the deposition of thin films (e.g., self-assembly of polyelectrolyte layers) onto the sensor end. The reflection between the thin film and the fiber endface was neglected because of their similar refractive indices. As the film increased its thickness, the length of the fiber cavity changed. The amount of change was estimated by the phase shift of the interferogram. The device could also be used as an immunosensor in which the optical thickness changes were used to... [Pg.151]

Electron Beam Lithography. LB PMMA films with thicknesses of 6.3 nm (7 layers) are sufficient for patterning a Cr film suitable for photomask fabrication. For ultrathin PMMA films the resolution (see Fig. 1) is limited by the smallest spot diameter available on MEBES I (1/8 pm). However, it is not possible to obtain this resolution if a thicker resist (>100 nm) is used under the same exposure and development conditions, which demonstrates that ultrathin resists are able to minimize the proximity effect. Also, since the radius of gyration of 188,100 Mw PMMA is about 10 nm in the bulk, and the thickness of the 7 layer film (6.3 nm) is less than 10 nm, it is reasonable to assume there must be an alteration of chain configuration in the ultrathin films. This will be particularly true when the post-deposition baking temperature of the multilayer films is less than the glass transition temperature (115°C), as is the case for the present experiments. In such a case, interdiffusion of PMMA chains between the deposited layers may not result in chain configurations characteristic of the bulk. [Pg.354]

The key effect of oxide supports on the catalytic activities of metal particles is exerted through the interface between oxides and metal particles. The key objective of this study is to develop synthesis methodologies for tailoring this interface. Here, an SSG approach was introduced to modify the surface of mesoporous silica materials with ultrathin films of titanium oxide so that the uniform deposition of gold precursors on ordered mesoporous silica materials by DP could be achieved without the constraint of the low lEP of silica. The surface sol-gel process was originally developed by Kunitake and coworkers.This novel technology enables molecular-scale control of film thickness over a large 2-D substrate area and can be viewed as a solution-based... [Pg.62]

The structure of the so-called "composite" membranes used in reverse osmosis is also much more complex than the conventional, simplistic description of the ultrathin semipermeable film deposited on and supported by a porous substrate. Most of these membranes which exhibit high flux and separation are composed of an anisotropic, porous substrate topped by an anisotropic, ultrathin permselective dense layer which is either highly crosslinked, or exhibits a progressively decreased hydrophilicity toward the surface. The basic difference between the conventional anisotropic (asymmetric) membrane and the thin film composite is that the latter might be... [Pg.268]


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See also in sourсe #XX -- [ Pg.775 , Pg.779 ]




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Deposited films

Deposition of Ultrathin Films

Examples of Sol-Gel Deposited Ultrathin Dielectric Films

Fluoropolymers (cont ultrathin film deposition

Thin-film deposition ultrathin

Ultrathin

Ultrathin deposition

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