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Materials characterization, techniques

Materials characterization techniques, ie, atomic and molecular identification and analysis, ate discussed ia articles the tides of which, for the most part, are descriptive of the analytical method. For example, both iaftared (it) and near iaftared analysis (nira) are described ia Infrared and raman SPECTROSCOPY. Nucleai magaetic resoaance (nmr) and electron spia resonance (esr) are discussed ia Magnetic spin resonance. Ultraviolet (uv) and visible (vis), absorption and emission, as well as Raman spectroscopy, circular dichroism (cd), etc are discussed ia Spectroscopy (see also Chemiluminescence Electho-analytical techniques It unoassay Mass specthot thy Microscopy Microwave technology Plasma technology and X-ray technology). [Pg.393]

Rutherford back-scattering spectroscopy (RBS) is one of the most frequently used techniques for quantitative analysis of composition, thickness, and depth profiles of thin solid films or solid samples near the surface region. It has been in use since the nineteen-sixties and has since evolved into a major materials-characterization technique. The number and range of applications are enormous. Because of its quantitative feature, RBS often serves as a standard for other techniques. [Pg.141]

Lauf, R.J. Application of Materials Characterization Techniques to Coal and Coal Wastes. ORNL/TM-7663, Oak Ridge National Laboratory, TN, 1981. [Pg.363]

This chapter focuses on the use of fluidized bed granulation process in the development and preparation of low-dose granule formulations for further conversion to immediate release tablets for personal administration. As a reference document, the chapter does not cover some very common subjects such as process safety, material characterization techniques and basic process and instrumentation technologies. Because the authors intention is to relate their experience in this specialized area, these areas are not discussed in any depth however their omission does not reduce their importance. [Pg.64]

The most widely employed material characterization techniques in third-order nonlinear optics are third-harmonic generation (THG) [21], degenerate four wave-mixing (DFWM) [22], Z-scan [6], and optical limiting by direct two-photon absorption (TPA) and fluorescence spectroscopy induced by TPA [23]. All of them will be discussed in the following. Further measurement techniques such as electric-field induced second-harmonic generation (EFISH) [24], optical Kerr... [Pg.141]

The powder diffraction experiment is the cornerstone of a truly basic materials characterization technique - diffraction analysis - and it has been used for many decades with exceptional success to provide accurate information about the structure of materials. Although powder data usually lack the three-dimensionality of a diffraction image, the fundamental nature of the method is easily appreciated from the fact that each powder diffraction pattern represents a one-dimensional snapshot of the three-dimensional reciprocal lattice of a crystal. The quality of the powder diffraction pattern is usually limited by the nature and the energy of the available radiation, by the resolution of the instrument, and by the physical and chemical conditions of the specimen. Since many materials can only be prepared in a polycrystalline form, the powder diffraction experiment becomes the only realistic option for a reliable determination of the crystal structure of such materials. [Pg.261]

This chapter describes the results of an ongoing study we are conducting into the nanoscale mechanical properties, chemical composition and structure of healthy enamel, carious lesions and the acquired salivary pellicle layer. A variety of material characterization techniques are being used, including nanoindentation, scanning electron microscopy (SEM), electron microprobe analysis (EMPA), scanning acoustic microscopy, atomic force microscopy (AFM) and time-of-flight secondary ion mass spectroscopy (TOF SIMS). [Pg.106]

Friction materials are often characterized in terms of friction, wear, and noise performance. However, as explained earlier, these are characteristics of the complete brake system and not of the friction couple alone. Friction material characterization techniques... [Pg.1074]

Structural and Surface Characterization of Carbon Products. Carbon products of the process were analyzed by a number of material characterization techniques, including x-ray diffraction, scanning electron microscopy. Auger electron spectroscopy, x-ray photoelectron spectroscopy, and others. X-ray diffraction studies revealed an ordered graphite-like (or turbostratic) structure of carbon products (Figure 4). [Pg.85]

This book chapter reviews how powerful infrared spectroscopy techniques play a fundamental role in the novel synthesis approaches developed during the last 5 years (2007 - 2011) by this research group. Synthesized high p>erformance cathode powders had their features investigated using different materials characterization techniques, such as Fourier Transform Infrared Sp>ectroscopy (FTIK), FAR and MlD-lnfrared spectroscopy. [Pg.384]

Material characterization technique which uses a tip (typically silicon) on the end of a cantilever... [Pg.84]

Material characterization technique where electrons emitted from a filament (typically tungsten)... [Pg.2951]

Material characterization technique used to determine the crystalline quality, chemical composition, and physical properties of a material. A Cu source is used to generate X-rays, which are then scattered off of a sample and collected by a detector. The full width at half maximum... [Pg.3512]

In this section, we present a description of the MAFBS apparatus, an account of challenges encountered during its development, a brief description of the materials characterization techniques used in this research, and an explanation of the flow reactor used to test the catalytic activity of the prepared carbides and nitrides. [Pg.145]

The early chemical literature contains several references to materials either alleged or assumed to be polyphenylene sulfide. However, material characterization techniques in those early days were not as definitive as they are today. Consequently, structural assignments were not always completely accurate. Several of these references have been reviewed recently. a brief summary of these early investigations follows. [Pg.135]

Material characterization technique which uses a tip (typically silicon) on the end of a cantilever to determine the surface profile of a material. As the cantilever is moved across the surface, a laser is reflected off of the backside. As the cantilever is deflected, the change in laser beam position is detected by a photodetector. This information is then used to create a three-dimensional image of the surface, with atomic-scale resolution. [Pg.56]

Material characterization technique which uses a high-energy beam of He ions to determine the chemical and physical properties of a material. The beam is directed at a sample and the ions which scatter from the sample are collected by a detector. This technique can give both composition and crystallographic information on a material. [Pg.1795]

Material characterization technique where electrons emitted from a filament (typically tungsten) interact with a material to create secondary electrons. These electrons are collected in a detector and used to create an image of the material. The resolution of this technique approaches hundreds of angstroms and thus shows a material s grain structure. [Pg.1798]

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), and Auger electron spectroscopy (AES) are widely used materials characterization techniques belonging to the general class of methods referred to as surface analysis. Each of these techniques provides, to varying degrees, semi-quantitative elemental, chemical-state and electronic-structure information from the top 10 nm of a material. Another widely used surface analytical method covered in this book is secondary ion mass spectrometry. Chap. 4. [Pg.93]

Zhang S, Li L, Kumar A (2009) Materials characterization techniques. CRC Press, Boca Raton... [Pg.1100]

This chapter has been adapted from Surface and Material Characterization Techniques in Surface Treatment of Materials for Adhesion Bonding, S. Ebnesajjad C.F. Ebnesajjad 2006 Elsevier Inc. [Pg.31]


See other pages where Materials characterization, techniques is mentioned: [Pg.4]    [Pg.597]    [Pg.66]    [Pg.351]    [Pg.377]    [Pg.356]    [Pg.94]    [Pg.95]    [Pg.36]    [Pg.4]    [Pg.245]    [Pg.2485]    [Pg.10]    [Pg.31]    [Pg.33]    [Pg.35]    [Pg.37]    [Pg.39]    [Pg.41]    [Pg.43]    [Pg.45]    [Pg.47]   


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