Time-of-flight SIMS

Wickes BT, Kim Y, Castner DG (2003) Denoising and multivariate analysis of time-of-flight SIMS images. Surface Interface Anal 35 640... 

Time of flight (TOF), 75 660-661 Time-of-flight (ToF) mass analyzers, 24 109 Time of flight diffraction (TOFD), 79 486 Time-of-flight instrumentation, in particle counting, 78 150—151 Time-of-flight-SIMS technique, 24 109 Time-resolved fluorimetry, 74 148-149 Time-resolved spectra, analysis of, 74 613 Time standards, 75 749—750 Time-temperature parameters (TTP), 73 471, 478, 479 creep properties and, 73 480 Time-temperature superposition, 27 746-747... 

Wagner et al. [108] developed a PLS model to predict the amount of protein adsorbed in a metallic basis using time-of-flight SIMS (TOF-SIMS) spectra. Study of the multivariate models yielded insight into the surface chemistry and the mechanism for protein resistance of the coatings. The same group reported two other similar studies with satisfactory results [109,110]. 

Keywords Silanes time-of-flight SIMS XPS SAAPS y-APS steel zinc. 

For static SIMS, the time-of-flight SIMS (TOF-SIMS) technique is most suitable. For TOF-SIMS, a pulsed primary ion beam is used. The secondary ions emitted from the surface after one pulse, are accelerated by an electrical potential U. These ions gain the velocity v that depends on the mass m and charge Q of the ion according to ... 

The results presented here demonstrate that static SIMS has unique capabilities for the characterization of the surfaces of polymers that have been modified by metal deposition or by plasma or corona techniques. Especially, the introduction of unsaturation and crosslinking are aspects that in some polymers can be observed directly. The formation of low-molecular oxidized material that can be inferred from XPS studies, can also be observed directly. A limitation of the quadrupole-type instrument, which is still the most widely used, is its limited mass range and mass resolution. It can be expected that a considerably more detailed description of modified polymer surfaces can be obtained by application of the more powerful reflectron-type Time-of-Flight SIMS spectrometers, but such studies have, to date, not yet been published. 

There are two varieties of SIMS - static and dynamic. Static SIMS (often referred to as time-of-flight SIMS, TOF-SIMS) is often the method-of-choice, used for... 

Diffuse Reflectance IR and Time-of-Flight SIMS Investigation of Methoxysilane SA-Layers on Silica and... 

Keywords Methoxysilanes / SA-layer / Diffuse Reflectance Infrared / Time-of-flight SIMS... 

Analysis of surface chemical structure requires use of the static SIMS technique to ensure that the major portion of the surface should not be affected by secondary ion emission. Time-of-flight SIMS (ToF SIMS) is the most widely used static SIMS technique. As its name indicates, ToF SIMS uses the ToF mass analyzer to measure mz l of secondary ions. ToF SIMS is a stand-alone instrument, not incorporated into or attached to other SIMS instruments as for dynamic SIMS. A typical structure is illustrated in Figure 8.13. 

Figure 8.13 Time-of-flight SIMS instrumentation. (Reproduced with permission from J.C. Vickerman and D. Briggs, ToF-SIMS Surface Analysis by Mass Spectrometry, IM Publications and SurfaceSpectra, Chichester and Manchester. 2001 IM Publications.)...

TOF-SIMS Time of flight SIMS Ion beam Secondary ion Heat of adsorption, heat of transition 100 pm, depth direction 1 nm Lubrication distribution, deterioration... 

Pachuta, S. J., and Strobel, M. "Time-of-Flight SIMS Analysis of Polypropylene Films Modified by Flame Treatments Using Isotopically Labeled Methane Fuel." Journal of Adhesion Science and Technology 21 (2007) 795-818. 

ToF-SlMS time-of-flight SIMS VB valence band... 

The photoelectron spectroscopic techniques can be supplemented by the more surface and molecular-specific techniques, such as the secondary ion mass spectroscopy (SIMS). In this technique, the polymer surface is sputtered by a noble gas ion beam, such as Ar+ or Xe of <4 KeVand 1 nA/cm" [358], Small percentages of the positively and negatively charged fragments arc extracted into a mass spectrometer (typically of the quadruple type) and provide, in sequential experiments, the positive and negative secondary ion mass spectra, respectively. The time-of-flight SIMS (ToF-SlMS) technique, on the other hand,... 

Time-of-flight SIMS TOFSIMS SNMS also matrix effects 28... 

Figure 3 Time-of-Flight SIMS map of the distribution of the intensity of the ion -255 amu originating from stearic acid in lubricant residue at the surface of a cold-rolled steel sample magnification approximately 500 x primary ions Ga+ of 25 kV.

Time-of-Flight SIMS. The introduction of TOF analyzers, along with postionization, is one of the major developments in the SIMS teehniques of the last few years. 

Figure 4 Principle of Time-of-Flight SIMS showing mass-separated primary beam of 10 kV Ar ions and 2 meter flight tube with two-stage ion reflector system. (From Ref. 7.)...

Figure 5 Part of positive, high mass-resolution Time-of-Flight SIMS spectrum of a polished 304L stainless steel surface primary ions Ga of 25 kV. 

Figure 6 Positive Time-of-Flight SIMS spectrum obtained from a thin film of polydimethyl-siloxane on a silver substrate showing the polymer fragmentation in the 0-500 amu range and the...

Figure 9 Positive Time-of-Flight SIMS spectra of 50/50 (by weight) blends of high molecular weight polystyrene and fully deuterated polystyrene (Mw=l,950,000 for both polymers) before (a) and after (b) annealing for 24 hours at 200°C in an inert gas. The labeled ions 82,98 and 122 amu are the deuterated analogs formed by the deuterated pol5mer of the ions 77, 91 and 115 amu formed by polystyrene. The spectra demonstrate the increase of the surface concentration of the deuterated polystyrene upon annealing. Courtesy F.J. Boerio and P.P. Hong, University of Cincinnati.

Figure 11 (a) Positive and negative time-of-flight SIMS spectra of a 100x100 xm area of the metal side of the interface between an epoxy cataphoretic paint system and phosphated cold-rolled steel. The paint was slightly overcured (b) as in (a) but positive spectrum of paint side (c) as in (a) but paint was undercured metal side (d) as in (c) but positive spectrum of paint side. (From Ref. 24.)... 

Muddiman, D.G., Brockman, A.H., Proctor, A., Houalla, M., and Hercules, D.M., Characterization of pol5 t5trene on etched silver using ion scattering and x-ray photoelectron spectroscopy correlation of secondary ion yield and time-of-flight sims with surface coverage. /. Phys. Chem., 98, 11570, 1994. 

On a selected number of Cu metallized samples a second system consisting of a Time-Of- Flight -SIMS (Charles Evans spectrometer was employed. In this case, a pulsed primary Ion beam of 12 keV -Ga ions was used. A 600 pA DC current was pulsed at 5 kHz repetition rate and a pulse width of 4 lun. A 1 beam spot was... 

Weng, L.T., P. Bertrand, G. Lalande, D. Guay, and J.P. Dodelet (1995). Surface characterization of time of flight SIMS of a catalyst for oxygen electroreduction pyrolyzed cobalt phthalocyanine-on-carbon black. Appl. Surf. Sci 84, 9-21. 

Figure 3.20. The time-of-flight SIMS spectrum of a polystyrene oligomer whose number average relative molecular mass is 4964, deposited as a thin film on a silver substrate. After Bletsos et al. (1987).

Li J.-T, Maurice V., Swiatowska-Mrowiecka J., Seyeux A., Zanna S., Klein L., Sun S.-G., Marcus P. XPS, time-of-flight-SIMS and polarization modulation IRRAS study of Cr203 thin film materials as anode for lithium ion battery, Electrochim. Acta 2009, 54,3700-3707. 

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