Time-of-flight secondary ToF-SIMS

ToF-SIMS Time-of-flight secondary ion mass spectrometry... 

TOF-SIMS Time of Flight Secondary Ion Mass Spectroscopy... 

Chemical bond information for materials can be determined with inferred and/or Raman spectroscopy, SIMS (second ion mass spectroscopy) and TOF-SIMS (time-of-flight secondary ion mass spectroscopy). Chemical bond information, especially on the materials surfaces, can be obtained with TOF-SIMS. Micro-IR and micro-Raman spectroscopes have been developed to map the chemical compositions of samples on a micrometer scale. The chemical species presented in MEAs after different lifetime tests were studied by a Raman spectrometer [36]. Cheng and co-workers observed a significant shift in the Raman bands of ruthenium oxide (RUO2) from 528, 646, and 716 cm in a single crystal to 506, 616, and 675-680 cm of amorphous ruthenium oxide at the anode side of MEAs. Although the RUO2 was initially present in the powder sample of the anode... 

Various characterization techniques have been used to study the cross-linked hydrogels (Fig. 7). The most-used techniques are FTIR (Fourier Transform Infrared Spectroscopy), XRD, SEM, TGA/DSCFTIR and ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectra). Percentage grafting can also determine the functionalized polymer unit in the hydrogel. 

TOF-SIMS Time of flight SIMS Ion beam Secondary ion Heat of adsorption, heat of transition 100 pm, depth direction 1 nm Lubrication distribution, deterioration... 

The use of separation techniques, such as gel permeation and high pressure Hquid chromatography interfaced with sensitive, silicon-specific aas or ICP detectors, has been particularly advantageous for the analysis of siUcones in environmental extracts (469,483—486). Supercritical fluid chromatography coupled with various detection devices is effective for the separation of siUcone oligomers that have molecular weights less than 3000 Da. Time-of-flight secondary ion mass spectrometry (TOF-sims) is appHcable up to 10,000 Da (487). 

J. Batcheller, A. M. Hacke, R. Mitchell and C. M. Carr, Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF SIMS), Applied Surface Science, 252, 7113 7116(2006). 

R. N. S. Sodhi. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Versatility in Chemical and Imaging Surface Analysis. Analyst, 129(2004) 483-487. 

The time-of-flight secondary ion mass spectroscopy (ToF-SIMS) analysis was performed on a CAMECA ION-TOF Model IV spectrometer. This instrument was equipped with a reflection-type ToF mass analyzer and a pulsed 25 kV primary... 

A few SIMS and SNMS instruments for surface analysis187-189 are commercially available on the analytical market. These are SIMS instruments using a double-focusing sector field mass spectrometer (e.g., CAMECA IMS-7f), time-of-flight secondary ion mass spectrometers (ToF-SIMS IV from CAMECA, Cedex, France, or ToF-SIMS 5, the ToF-SIMS 300 from ION-TOF, Munster, Germany and the PHI TRIFT IV from Physical Electronics, USA) and quadrupole based SIMS (SIMS 4550 and 4600 CAMECA, Cedex, France) or the quadrupole based SNMS instruments with SIMS option (INA-X, SPECS GmbH, Berlin, Germany). 

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