Time-of-flight secondary ion

The use of separation techniques, such as gel permeation and high pressure Hquid chromatography interfaced with sensitive, silicon-specific aas or ICP detectors, has been particularly advantageous for the analysis of siUcones in environmental extracts (469,483—486). Supercritical fluid chromatography coupled with various detection devices is effective for the separation of siUcone oligomers that have molecular weights less than 3000 Da. Time-of-flight secondary ion mass spectrometry (TOF-sims) is appHcable up to 10,000 Da (487). 

The brief history, operation principle, and applications of the above-mentioned techniques are described in this chapter. There are several other measuring techniques, such as the fluorometry technique. Scanning Acoustic Microscopy, Laser Doppler Vibrometer, and Time-of-flight Secondary Ion Mass Spectroscopy, which are successfully applied in micro/nanotribology, are introduced in this chapter, too. 

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)... 

ToF-SIMS Time-of-flight secondary ion mass spectrometry... 

The time-of-flight secondary ion mass spectrum of a thick film prepared from Si(OEt)4 on a hydrophilic silicon substrate (Fig. 1) reveals a distribution of masses up to 1200 amu. The observed formation of cationized oligomers with a distribution shown in Fig. 1 can be explained by bond cleavage within the uppermost monolayer of the polycondensate of TEOS as a result of primary Ar+ ion impact. 

J. Batcheller, A. M. Hacke, R. Mitchell and C. M. Carr, Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF SIMS), Applied Surface Science, 252, 7113 7116(2006). 

A. M. Belu, D. J. Graham and D. G. Castner, Time of flight secondary ion mass spectrometry techniques and applications for the characterization of biomaterial surfaces, Biomaterials, 24, 3635 3653 (2003). 

A. Brunelle, D. Touboul and O. Laprevote, Biological tissue imaging with time of flight secondary ion mass spectrometry and cluster ion sources, Journal of Mass Spectrometry, 40,985 999 (2005). 

J. B. Lhoest, M. S. Wagner, C. D. Tidwell and D. G. Castner, Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry, Journal of Biomedical Materials Research, 57, 432 440 (2001). 

K. Saito, T. Mitsutani, T. Imai, Y. Matsushita and K. Fukushima, Discriminating the indistinguishable sapwood from heartwood in discolored ancient wood by direct molecular mapping of specific extractives using time of flight secondary ion mass spectrometry, Analytical Chemistry, 80, 1552 1557 (2008). 

R. N. S. Sodhi. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Versatility in Chemical and Imaging Surface Analysis. Analyst, 129(2004) 483-487. 

Wang, D., Jones F.R. and Denison, P. (1992a). Surface analytical study of the interaction between r-aminopropyltriethoxysilane (APS) and E-glass surface. Part 1-Time of flight secondary ion mass spectroscopy. J. Mater. Sci. 27, 36-48. 

Dannetun P, Boman M, Stafstrom S, Salaneck WR, Lazzaroni R, Fredriksson C, Bredas JL, Zamboni R, Taliani C (1993) The chemical and electronic structure of the interface between aluminum and polythiophene semiconductors. J Chem Phys 99(l) 664-672 Ahn H, Whitten JE (2003) Vapor-deposition of aluminum on thiophene-terminated self-assembled monolayers on gold. J Phys Chem B 107(27) 6565-6572 Fisher GL, Flooper A, Opila RL, Jung DR, Allara DL, Winograd N (1999) The interaction between vapor-deposited A1 atoms and methylester-terminated self-assembled monolayers studied by time-of-flight secondary ion mass spectrometry, X-ray photoelectron spectroscopy and infrared reflectance spectroscopy. J Electron Spectrosc Relat Phenom 98-99 139-148... 

The time-of-flight secondary ion mass spectroscopy (ToF-SIMS) analysis was performed on a CAMECA ION-TOF Model IV spectrometer. This instrument was equipped with a reflection-type ToF mass analyzer and a pulsed 25 kV primary... 

A few SIMS and SNMS instruments for surface analysis187-189 are commercially available on the analytical market. These are SIMS instruments using a double-focusing sector field mass spectrometer (e.g., CAMECA IMS-7f), time-of-flight secondary ion mass spectrometers (ToF-SIMS IV from CAMECA, Cedex, France, or ToF-SIMS 5, the ToF-SIMS 300 from ION-TOF, Munster, Germany and the PHI TRIFT IV from Physical Electronics, USA) and quadrupole based SIMS (SIMS 4550 and 4600 CAMECA, Cedex, France) or the quadrupole based SNMS instruments with SIMS option (INA-X, SPECS GmbH, Berlin, Germany). 

M. S. Wagner, S. Pasche, D. G. Castner and M. Textor, Characterisation of poly(L-lysine)-graft-poly(ethylene glycol) assembled monolayers on niobium pentoxide substrates using time-of-flight secondary ion mass spectrometry and multivariate analysis, Anal. Chem., 16, 2004, 1483-1492. 

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