TEM

P interval temperature hot streams are represented ATn,in/2 colder and cold streams AT , /2 hotter than actual tem-... 

Transmission electron microscopy (TEM) can resolve features down to about 1 nm and allows the use of electron diffraction to characterize the structure. Since electrons must pass through the sample however, the technique is limited to thin films. One cryoelectron microscopic study of fatty-acid Langmuir films on vitrified water [13] showed faceted crystals. The application of TEM to Langmuir-Blodgett films is discussed in Chapter XV. 

Fig. Vni-3. (a) Atomic force microscope (AFM) and (b) transmission electron microscope (TEM) images of lead selenide particles grown under arachidic acid monolayers. (Pi Ref. 57.)...

The history of EM (for an overview see table Bl.17,1) can be interpreted as the development of two concepts the electron beam either illuminates a large area of tire sample ( flood-beam illumination , as in the typical transmission electron microscope (TEM) imaging using a spread-out beam) or just one point, i.e. focused to the smallest spot possible, which is then scaimed across the sample (scaiming transmission electron microscopy (STEM) or scaiming electron microscopy (SEM)). In both situations the electron beam is considered as a matter wave interacting with the sample and microscopy simply studies the interaction of the scattered electrons. 

Busch focuses an electron beam with a magnetic lens 1931 Ruska and colleagues build the first TEM protoype... 

Haider and colleagues prove the concept of the TEM spherical aberration corrector... 

Application High-resolution signal (TEM, STEM) Back-scattering of electrons (BSE signal in SEM) Analytical signal (TEM, STEM, SEM) Emission of secondary electrons (SE signal in SEM)... 

Inelastic scattering processes are not used for structural studies in TEM and STEM. Instead, the signal from inelastic scattering is used to probe the electron-chemical environment by interpreting the specific excitation of core electrons or valence electrons. Therefore, inelastic excitation spectra are exploited for analytical EM. 

EM instmments can be distinguished by the way the infonnation, i.e. the interacting electrons, is detected. Figure Bl.17.2 shows the typical situations for TEM, STEM, and SEM. For TEM the transmitted electron beam of the brightfield illumination is imaged simply as in an light microscope, using the objective and... 

Figure Bl.17.2. Typical electron beam path diagrams for TEM (a), STEM (b) and SEM (c). These schematic diagrams illustrate the way the different signals can be detected m the different instmments.

For the parallel recording of EEL spectra in STEM, linear arrays of semiconductor detectors are used. Such detectors convert the incident electrons mto photons, using additional fluorescent coatings or scintillators in the very same way as the TEM detectors described above. 

Specimens for (S)TEM have to be transparent to the electron beam. In order to get good contrast and resolution, they have to be thin enough to minimize inelastic scattering. The required thin sections of organic materials can be obtained by ultramicrotomy eitlier after embedding into suitable resms (mostly epoxy- or methacrylate resins [H]) or directly at low temperatures by cryo-ultramicrotomy [12]. 

B1.17.5.1 IMAGING OF PROJECTED STRUCTURE—THE CONTRAST TRANSFER FUNCTION (CTF) OF TEM... 

Figure Bl.17.5. Examples of CTFs for a typical TEM (spherical aberration = 2.7 mm, 120 keV electron energy). In (a) and (b) the idealistic case of no signal decreasing envelope fimctions [77] are shown, (a) Pure phase contrast object, i.e. no amplitude contrast two different defocus values are shown (Scherzer focus of 120 mn imderfocus (solid curve), 500 mn underfocus (dashed curve)) (b) pure amplitude object (Scherzer focus of 120 mn underfocus) (c) realistic case mcluding envelope fimctions and a mixed weak...

The construction of an aberration-corrected TEM proved to be teclmically more demanding the point resolution of a conventional TEM today is of the order of 1-2 A. Therefore, the aim of a corrected TEM must be to increase the resolution beyond the 1 A barrier. This unplies a great number of additional stability problems, which can only be solved by the most modem technologies. The first corrected TEM prototype was presented by Flaider and coworkers [M]- Eigure BE 17.9 shows the unprovement in image quality and interpretability gained from the correction of the spherical aberration in the case of a materials science sample. 

Figure Bl.17.9. A CoSi grain boundary as visualized in a spherical-aberration-corrected TEM (Haider et a/ 1998). (a) Individual images recorded at different defocus with and without correction of C(b) CTFs in the case of the uncorrected TEM at higher defocus (c) CTF for the corrected TEM at only 14 nm underfocus. Pictures by courtesy of M Haider and Elsevier.

The field of corrected microscopes has just begun with the instruments discussed above. The progress in this field is very rapid and proposals for a sub-Angstrom TEM (SATEM) or even the combination of this instrument with a corrected energy filter to fonn a sub-electronvolt/sub-Angstrom TEM (SESAM) are underway. 

In many ways the nanocrystal characterization problem is an ideal one for transmission electron microscopy (TEM). Here, an electron beam is used to image a thin sample in transmission mode [119]. The resolution is a sensitive fimction of the beam voltage and electron optics a low-resolution microscope operating at 100 kV might... 

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