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TEM bright field

Fig. 4.29. EDXS line-profile analysis across the interfacial region of a C-fiber reinforced SiC composite and corresponding TEM bright-field image. Fig. 4.29. EDXS line-profile analysis across the interfacial region of a C-fiber reinforced SiC composite and corresponding TEM bright-field image.
Fig. 3 (left) TEM bright-field and (middle) dark-field images, and (right) selected area diffraction pattern from a 20 vol% Si3N4/5052 Al composite at 548 °C. (from Ref. [8,9])... [Pg.418]

FIGURE 4.6 Transmission electron microscopy (TEM) bright field image of the scale grown on a Crofer 22 APU coupon during an isothermal oxidation at 800°C in air after 300 h. [Pg.189]

Figure 10.1.10, a and b, shows the TEM bright-field images with different magnifications for the Pt/carbon tube composite prepared at 500°C. These two images exhibit the presence of uniform carbon nanotubes, and their outer diameter and... [Pg.561]

Fig. 10.1.12 TEM bright-field image of Pt nanoparticles in carbon nanotubes. (From Ref. 39.)... Fig. 10.1.12 TEM bright-field image of Pt nanoparticles in carbon nanotubes. (From Ref. 39.)...
Figure 18. Single bacterial cell of Magnetospirillum magnetotacticum strain MS-1 (a) TEM bright-field image of and (b) contours of spacing 0.064 radians formed from the magnetic contribution to the holographic phase shift. The contours, which spread out at the chain ends, have been overlaid onto the mean potential contribution to the phase to allow the positions of the crystals to be correlated with the magnetic contours [25],... Figure 18. Single bacterial cell of Magnetospirillum magnetotacticum strain MS-1 (a) TEM bright-field image of and (b) contours of spacing 0.064 radians formed from the magnetic contribution to the holographic phase shift. The contours, which spread out at the chain ends, have been overlaid onto the mean potential contribution to the phase to allow the positions of the crystals to be correlated with the magnetic contours [25],...
Figure 7. TEM Bright Field images for a FePt/C sample with 58.3 vol% C annealed at 600°C for a) as made, b) 10, c) 60 and d) 120 minutes. Figure 7. TEM Bright Field images for a FePt/C sample with 58.3 vol% C annealed at 600°C for a) as made, b) 10, c) 60 and d) 120 minutes.
Fig. 3 TEM bright field images of (a) 6.9 nm FcjoPtso nanocubes (b) HREM image of a single FePt nanocube (c) Fast-Fourier transform (FFT) of the HREM in (b). Reprinted with permission from M. Chen, J. Kim, J. P. Liu, H. Fan and S. Sun, J. Am. Chem. Soc., 2006, 128,7132. 2006 American Chemical Society. Fig. 3 TEM bright field images of (a) 6.9 nm FcjoPtso nanocubes (b) HREM image of a single FePt nanocube (c) Fast-Fourier transform (FFT) of the HREM in (b). Reprinted with permission from M. Chen, J. Kim, J. P. Liu, H. Fan and S. Sun, J. Am. Chem. Soc., 2006, 128,7132. 2006 American Chemical Society.
The nanotube network was successfully investigated in our laboratory by Dalmas et al. (63), in terms of distribution of radius of curvature. Indeed, the 2D apparent nanotube segment curvature radius distribution was then measured on TEM bright field images acquired on the composites (see Figure 3.8). The experimental curvature... [Pg.61]

Figure 3.9. TEM bright-field image of a SBS copolymer filled with 2.5 wt.% of polystyrene-grafted nitrogen-doped carbon nanotubes after staining with Ru04. Figure 3.9. TEM bright-field image of a SBS copolymer filled with 2.5 wt.% of polystyrene-grafted nitrogen-doped carbon nanotubes after staining with Ru04.
Figure 3.11. TEM bright-field images of composites made of polystyrene and (a) raw and (b) polystyrene-grafted nitrogen-doped multiwalled nanotubes (69). Figure 3.11. TEM bright-field images of composites made of polystyrene and (a) raw and (b) polystyrene-grafted nitrogen-doped multiwalled nanotubes (69).
Figure 10. (a) TEM bright-field image, (b) selected area diffraction (SAD) pattern, and (c) convergent beam electron diffraction (CBED) pattern of the optimally reannealed (r, 83 K) Tl-2201 thin film. [Pg.498]

Figure 3 TEM bright field image of leached NiAl alloy where two distinct... Figure 3 TEM bright field image of leached NiAl alloy where two distinct...
Fig. 4.28. TEM bright field image and particle size distribution of vapor deposited Pt/Si02 after preoxidation at 823 K. The morphology, size, and density of the Pt particles do not change with varying preoxidation temperature up to 923K. The black circles frame Pt particles with a contrast difference due to diffraction (from [125])... Fig. 4.28. TEM bright field image and particle size distribution of vapor deposited Pt/Si02 after preoxidation at 823 K. The morphology, size, and density of the Pt particles do not change with varying preoxidation temperature up to 923K. The black circles frame Pt particles with a contrast difference due to diffraction (from [125])...
Fig. 7.7 MFM images at the ac-demagnetized states of the Co/Pd multilayered films (a) with the sputter-deposited 10 nm-thick Pd seedlayer (film I) and (b) with the Pd cluster seeds (film 11). Plan-view TEM bright field images of (c) film I and (d) film II [31]... Fig. 7.7 MFM images at the ac-demagnetized states of the Co/Pd multilayered films (a) with the sputter-deposited 10 nm-thick Pd seedlayer (film I) and (b) with the Pd cluster seeds (film 11). Plan-view TEM bright field images of (c) film I and (d) film II [31]...
Figure 6. Typical TEM bright field (with SAED as an insert) (a) and dark field (b) micrographs and HREM image (c) of as-processed CP Ti. Figure 6. Typical TEM bright field (with SAED as an insert) (a) and dark field (b) micrographs and HREM image (c) of as-processed CP Ti.
Figure4. TEM bright field images illustrating the dislocation structures in the as compacted samples of Ti5Si3 (a) and TiSi2 (b). Figure4. TEM bright field images illustrating the dislocation structures in the as compacted samples of Ti5Si3 (a) and TiSi2 (b).
Figure 5. TEM bright field images of creep deformed Ti5Si3 (a) and TiSij (b) samples tested at 1000 °C, strain rate e =10"7s . Figure 5. TEM bright field images of creep deformed Ti5Si3 (a) and TiSij (b) samples tested at 1000 °C, strain rate e =10"7s .
Fig. 11.9. Low magnification cross-section TEM bright field image of the hydrogen-implanted silicon wafer in the as-implanted state... Fig. 11.9. Low magnification cross-section TEM bright field image of the hydrogen-implanted silicon wafer in the as-implanted state...
Fig. 16. TEM bright field image of the metal-scale interface of Y203-dispersed Fe-28Al-2Cr after 2 h at 1200°C in 02.The arrows mark intcrfacial voids [35]. Fig. 16. TEM bright field image of the metal-scale interface of Y203-dispersed Fe-28Al-2Cr after 2 h at 1200°C in 02.The arrows mark intcrfacial voids [35].
Fig. 11.6 TEM bright-field image of a microtomed foil of the solution cast cellulose whiskers-PLA nanocomposite (Kvien et al. [74])... Fig. 11.6 TEM bright-field image of a microtomed foil of the solution cast cellulose whiskers-PLA nanocomposite (Kvien et al. [74])...
Fig. 27. TEM bright-field micrographs of (a) Nd4 5Fe77B,8 5, (b) Nd4 5Fe76,8Bij,5C%2> (c) Nd4 5Fe75gBi8jCU( Nb (, and (d) Nd45Fe76.oB j.5Nbm melt-spun ribbons which were crystallized at 933 K for 10 min. The average grain size is about 30, 17, 12, and 43 run, respective. ... Fig. 27. TEM bright-field micrographs of (a) Nd4 5Fe77B,8 5, (b) Nd4 5Fe76,8Bij,5C%2> (c) Nd4 5Fe75gBi8jCU( Nb (, and (d) Nd45Fe76.oB j.5Nbm melt-spun ribbons which were crystallized at 933 K for 10 min. The average grain size is about 30, 17, 12, and 43 run, respective. ...
FIGURE 11. TEM bright field image from cross-section of Hi-Nicalon/BN/SiC/BSAS composite showing (a) multiple BN layers and (b) coarsening of the outer three BN layers. The iimer BN and the SiC interface layers are unaffected. (Reprinted, from reference 26, with kind permission from Elsevier). [Pg.238]

Fig. 2. TEM bright-field image of ZrC/Ti3AlC2 composite and the relative content of Al, Ti and Zr along the line across the interface. Fig. 2. TEM bright-field image of ZrC/Ti3AlC2 composite and the relative content of Al, Ti and Zr along the line across the interface.
Fiii. 2. TEM bright field image of the Altex fibre after a heat treatment at I I30°C. Growth of mullitc grains surrounded by smaller grains of transitional forms of alumina. [Pg.93]


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