S TEM Characterization

Micrographs from HAADF-STEM measurements, taken of the as prepared samples are shown in Fig. 5.24 (different coverages) and Fig. 5.25 (different sizes). 

In Fig. 5.24 the representative 40 x 40nm excerpts show for unselected (a) and size-selected Pt clusters (c) the same and in (e) twice the amount of clusters coverages on the CdS NR thin films. This can be observed for the coverage on, as well as adjacent to the NRs. In micrographs with higher magnification (size 10 x 10 nm ), Pt clusters with different sizes for the unselected Pt 36 (b) and only one size for both size-selected Pt46 (d, f) samples is observed. The overall number of clusters 

Cluster coverages on bare graphite support and on CdS NRs are linearly related. Thus, the three values obtained for the two size-selected samples Pl22 (0.04 e/nm ) and Pt46 0.04 e/nm and 0.07 e/nm ) are used to linearly correlate between the units e/nm and cluster/NR in the graphs of the following sections. 

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