High-resolution TEM images

Fig. 26. High-resolution TEM images of bent and twisted carbon nanotubes. The length scales for these images are indicated [199].

Fig. 6—Bright field high resolution TEM image of 2 nm thick ta-C coating deposited on Si substrate by FCVA.

Figure 4. High resolution TEM images of (A) a square Pt particle and (B) a triangular Pt particle obtained by using poly-NIPA at 40 °C and poly-NEA at 80 °C, respectively.

Figure 7. High resolution TEM image of a single Au nanoparticle observed inside a stem of alfalfa seedlings grown in gold emiched medium. The inset corresponds to the fast Fourier transform of the crystalline particle. (Reprinted from Ref. [28], 2002, with permission from American Chemical Society)...

FIG. 20-24 High -resolution TEM image of Si nanowires produced at 500 C and 24.1 MPa in supercritical hexane from gold seed crystals. Inset Electron diffraction pattern indexed for the <111> zone axis of Si indicates <110> growth direction. [Reprinted with permission from Lu et al. Nano Lett., 3(1), 93-99 (2003). Copyright 2003 American Chemical Society. ]... 

Figure 5.18. High resolution TEM images of (a) a GP zone and (b) a GP zone-like defect in aged...

Figure 3 high resolution TEM images with Fourier transforms showing the real-time degradation of the BEA framework under a 200 kV accelerated electron beam images at a) time = 0s and after b) 10s, c) 20s and d) 40s. 

TEM images of carbon filaments produced by decomposition of NG over Fe(10 wt%)/Al203 catalyst at 850°C. (a) Carbon filaments with embedded iron nanoparticles, (inset b) high-resolution TEM image of the wall of a carbon filament, and (c) = an iron nanoparticle encapsulated in carbon layers at the tip of a carbon filament. 

Fig. 2.3 Evidence of monolayer graphene from TEM [72]. (a) and (b) High-resolution TEM images of solution-cast monolayer (a) and bilayer (b) graphene (scale bar 500 nm) (c) electron diffraction pattern of the sheet in (a), with the peaks labeled by Miller-Bravais indices (d) and (e) electron diffraction patterns taken from the positions of the black (d) and white spots (e), respectively, of the sheet shown in (b), using the same labels as in (c). fhe graphene is clearly one layer thick in (d) and two layers thick in (e) (f)-(h) Diffracted intensity taken along the 1210 to 2110 axis for the patterns shown in (c)-(e), respectively (i) Histogram of the ratios of the intensity of the 1100 and 2110 diffraction peaks for all the diffraction patterns collected. A ratio > 1 is a signature of graphene.

Fig. 6.3 XRD patterns of (a) bulk MoS2 and few-layer MoS2 (b) High resolution TEM image of MoSe2 (from [2]).

Characterization. The high resolution TEM images were obtained on a JEOL 2010 electron microscope with an acceleration voltage of 200 kV. Measurement of nitrogen adsorption-desorption isotherms was performed on a Micromeritics ASAP... 

HRTEM of Si-Based Nanowires. High resolution TEM images of SiNW showed amorphous structures for all the nanowires inspected. Although it is difficult... 

A literature survey showed that the stmcture of I-phase was not new in fact, but had been discovered earlier in the Cs-Nb-W oxide system by Lundberg and Sundberg using high resolution TEM imaging [9]. We were able to prepare a single phase substance with the composition... 

Figure 15.6 (a) TEM image of a PtPd bimetallic nanowire/HMM-1 prepared by UV-irradiation of an (H2PtCl6 -r H2PdCl4)/ HMM-1 sample with MeOH and H2O vapor (b) high-resolution TEM image of a PtRh nanowire/HMM-1 prepared by UV-irradiation... 

Fig. 8 TMR for 8 nm Co/0.6nm Al203/1.6nm Alq3/10nmNlgoFe2o junction. In (a) the TMR was measured at a 10-mV bias. The inset shows the temperature dependence of the junction resistance and the chemical structure of the Alq3 molecule. In (b) the bias dependence of the TMR is shown. The inset in (b) is a cross-sectional high-resolution TEM image of the junction showing the continuous barrier. Taken from [48] with permission...

Fig. 1.6.8 High-resolution TEM image of a single Fe304 UFP. (From Ref. 5.)...

Fig. 4. High-resolution TEM images of a Cu/ZnO model catalyst in various gas environments together with their corresponding Wulff construction. (A, B) A metallic copper nanocrystal with facets corresponding to the (10 0), (110), and (111) surfaces. The image was obtained at a pressure of 1.5 mbar of H2 at 493 K. The electron beam was parallel to the (011) zone axis of copper. (C, D) A metallic copper nanocrystal in a gas mixture of H2 and H2O, H2 H2O = 3 1 at a total pressure of l.Smbar at 493 K. (E, F) A metallic copper nanocrystal in a gas mixture of H2 (95%) and CO (5%) at a total pressure of 5 mbar at 493 K. Reprinted with permission from Reference (4).

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