TEM high-resolution

High Resolution Transmission Electron Microscopy and Associated Techniques. (P. R. Buseck, J. M. Cowley, and L. Eyring, eds.) Oxford University Press, New York, 1988. A review covering these techniques in detail (except X-ray microanalysis) including extensive material on high-resolution TEM. 

Fig. 14. High resolution TEM observations of three multi-wall carbon nanotubes with N concentric carbon nanotubes with various outer diameters do (a) N = 5, do = 6.7 nm, (b) N = 2, do = 5.5 nm, and (c) N = 7, do = 6.5 nm. The inner diameter of (c) is d = 2.3 nm. Each cylindrical shell is described by its own diameter and chiral angle [151].

Fig. 26. High-resolution TEM images of bent and twisted carbon nanotubes. The length scales for these images are indicated [199].

Fig. 6—Bright field high resolution TEM image of 2 nm thick ta-C coating deposited on Si substrate by FCVA.

Fig. 18—High resolution TEM plan-view image of TiN/Si3N4 nanocomposite coating with Si content of 10.8 at. % and hardness of 42 GPa. The coating was deposited on NaCI substrate for about 50 nm thick and then was floated off onto a mesh. The crystallites were confirmed to be TIN by the interplanar distance of 0.21 nm, which is the TIN (200) interplanar distance. The gain size of the TiN crystallites is less than 5 nm.

Fig. 3. Cross section of high resolution TEM (top) and cross-sectional biight-field TEM images...

A square and triangular Pt nanoparticle obtained by using poly-NIPA and poly-NEA, respectively, was observed by high resolution TEM (HRTEM) (JEM-2010F). The images (Figure 4) show a crystalline structure with clearly resolved lattice fringes. The square Pt nanoparticle... 

Figure 4. High resolution TEM images of (A) a square Pt particle and (B) a triangular Pt particle obtained by using poly-NIPA at 40 °C and poly-NEA at 80 °C, respectively.

Figure 7. High resolution TEM image of a single Au nanoparticle observed inside a stem of alfalfa seedlings grown in gold emiched medium. The inset corresponds to the fast Fourier transform of the crystalline particle. (Reprinted from Ref. [28], 2002, with permission from American Chemical Society)...

FIG. 20-24 High -resolution TEM image of Si nanowires produced at 500 C and 24.1 MPa in supercritical hexane from gold seed crystals. Inset Electron diffraction pattern indexed for the <111> zone axis of Si indicates <110> growth direction. [Reprinted with permission from Lu et al. Nano Lett., 3(1), 93-99 (2003). Copyright 2003 American Chemical Society. ]... 

Figure 5.18. High resolution TEM images of (a) a GP zone and (b) a GP zone-like defect in aged...

Figure 3 high resolution TEM images with Fourier transforms showing the real-time degradation of the BEA framework under a 200 kV accelerated electron beam images at a) time = 0s and after b) 10s, c) 20s and d) 40s. 

TEM images of carbon filaments produced by decomposition of NG over Fe(10 wt%)/Al203 catalyst at 850°C. (a) Carbon filaments with embedded iron nanoparticles, (inset b) high-resolution TEM image of the wall of a carbon filament, and (c) = an iron nanoparticle encapsulated in carbon layers at the tip of a carbon filament. 

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