Acronyms, list techniques

CSAFM Current Sensing Atomic Force Microscopy (also called CAFM) 

CEEL Core Electron Energy Loss spectroscopy 

DRIFTS Diffuse Reflectance Infra-red Fourier Transform Spectroscopy 

ESCA Electron Spectroscopy for Chemical Analysis (also called XPS) 

ERDA Elastic Recoil Detection Analysis (also called ERD, ERS, FRS, 

---

The listing of techniques in Table Vlll-1 is not a static one. It is expanded over what it was a few years ago and is continuing to expand. Try, in an imaginative yet serious manner, to suggest techniques not listed in the table. Explain what their values might be and, of course, propose a suitable acronym for each. 

This glossary lists all the acronyms referred to in the encyclopedia together with their meanings. The major technique acronyms are listed alphabetically. Alternatives to these acronyms are listed immediately below each of these entries, if they exist. Related acronyms (variations or subsets of techniques terminology used within the technique area) are grouped together below the major acronym and indented to the right. Most, but not all, of the techniques listed here are the subject of individual articles in this volume. 

From the above descriptions, it becomes apparent that one can include a wide variety of techniques under the label diffraction methods . Table B 1.21.1 lists many techniques used for surface stmctural determination, and specifies which can be considered diffraction methods due to their use of wave interference (table Bl.21.1 also explains many technique acronyms commonly used in surface science). The diffraction methods range from the classic case of XRD and the analogous case of FEED to much more subtle cases like XAFS (listed as both SEXAFS (surface extended XAFS) and NEXAFS (near-edge XAFS) in the table). 

A variety of techniques are necessary to characterize nanomaterials. Often these techniques are referred to using acronyms. For each acronym listed below, provide the full name and a brief description of the technique APS, ATR-FTIR, BET, DLS, SEM, SMPS, TEM, XPS, and XRD. 

The function of this chapter is to review these methods with emphasis on the types of phenomenology involved and information obtained. Many of the effects are complicated, and full theoretical descriptions are still lacking. The wide variety of methods and derivative techniques has resulted in a veritable alphabet soup of acronyms. A short list is given in Table VIII-1 (see pp. 313-318) the lUPAC recommendations for the abbreviations are found in Ref. 1. 

Because the various types of particle can appear in both primary excitation and secondary emission, most authors and reviewers have found it convenient to group the techniques in a matrix, in which the columns refer to the nature of the exciting particle and the rows to the nature of the emitted particle [1.1-1.9]. Such a matrix of techniques is given in Tab. 1.1., which uses the acronyms now accepted. The meanings of the acronyms, together with some of the alternatives that have appeared in the literature, are given in Listing 1. 

A significant aid in the preparation of the second edition was the tremendous resources now available on the Internet for searching references to virtually any subject or key word within the scientific literature. For this reason, adding endless references to each chapter probably only would increase the size of the book by hundreds of pages, but add very little real value. Far better is for the reader to make use of pertinent Internet databases to search for key words, structure names, or reagent acronyms which can provide lists of hundreds or even thousands of additional references or links regarding any bioconjugation technique of interest. 

Table 1 List of acronyms ordered by compounds and techniques... 

Investigations of the adsorption of isocyanides on metal surfaces use various analytical techniques. Table 13.2 lists the techniques and their acronyms that are used throughout this chapter. Because isocyanides adsorbed on metal surfaces are often characterized by their v(N=C) stretching frequencies, these vibrational data are summarized in Table 13.3. Also given in Table 13.3 are v(N=C) values of the free (unadsorbed) isocyanides and brief descriptions of the proposed adsorption modes, which are often based on interpretations of the v(N=C) values as discussed in the following sections. 

Finally, in order to relate the acronyms for the various techniques to the scattering and emission experiments on which they are based, we present in Table I an indication of the relationship between these acronyms, the type of information which they provide, and the scattering or emission experiment which they designate. The definition of the acronyms is given in Table II. These tables embody only "commonly used" methods. Considerably more extensive lists may be found elsewhere in the literature (1, 5.-9, 20> 30> 36)- Unfortunately, all authors do not use the same acronyms. Therefore Tables I and II are a guide to but not a glossary of the acronyms used in other papers in this symposium. 

A description of the many techniques, procedures and instrumentation used in gas-phase ion investigations is beyond the scope of this chapter and the interested reader is referred to the original works cited in the text. A few words are spent, however, on the most recent and less common ones. The acronyms currently used to refer to the various techniques and apparatus are also adopted here. A list of all abbreviations recurring in this chapter has been included above. 

An extensive list that defines acronyms and abbreviations in the field of mass spectrometry was published in 2002 [6], A single analytical technique or a type of instrument is abbreviated without hyphens or slashes. However, it is customary to use hyphens for a description of an instrument whereas an abbreviation that describes the method uses slashes. For example, LC-MS is an instrument where a liquid chromatograph is coupled with a mass spectrometer, while LC/MS is the method of liquid chromatography/mass spectrometry. Thus, one uses an LC-MS instrument to obtain a LC/MS spectrum. 

A wide range of techniques have been developed to study surfaces in vacuum, and many techniques are commonly referred to by acronyms. Table I lists acronyms and brief descriptions of most common techniques used in surface science. 

Many other pulse-sequence techniques besides COSY can be used to produce multidimensional NMR spectra. It will suffice here to simply list the acronyms of some of the better known methods EXSY (exchange spectroscopy), NOESY (nuclear Overhauser effect spectroscopy), TOCS Y (total correlation spectroscopy), ROESY (rotational nuclear Overhauser effect spectroscopy). The nuclear Overhauser effect (NOE) refers to a change in intensity of one NMR peak when another peak is irradiated. 

Table 3.6. List of acronyms for optical and scanning techniques used in analyzing monolayers.

These versatile techniques combined with the pressing pharmaceutical need for particle design have been an impetus for intense research in this field, which has resulted in an exponential growth in articles devoted to these applications. A number of reviews have been published (2-14), clearly demonstrating that SCF technologies are viable approaches. However, a thorough review of the literature indicates that different acronyms were used to refer to the same technique. These discrepancies essentially concern the second group, the antisolvent techniques. Some examples of these discrepancies are summarized in the nonexhaustive list that follows. 

We are presenting a series of one dimensional (ID) and two dimensional (2D) NMR spectra to exemplify the power of the technique. It is beyond the purpose of the present chapter to cover all types of NMR spectroscopy. Sometimes the same technique is known under several alternative acronyms, and in other cases different techniques provide the same information. We mention some of the most popular techniques listing alternative acronyms, but without detailing the full names or technical aspects. The interested reader should refer to already quoted books for more information [10,11,13]. A good compendium on basic ID and 2D types of NMR spectra is Nakanishi s book [26] whereas some 2D-, 3D- and 4D-spectra are well explained in Evans book [27]. However, as the techniques advance very fast, following more recent reviews and original publications is essential. 

This table lists some abbreviations, acronyms, and symbols encountered in the physical sciences. Most entries in italic type are symbols for physical quantities for more details on these, see the table Symbols and Terminology for Physical and Chemical Quantities in this section. Additional information on units may be found in the table International System of Units (SI) in Section 1. Many of the terms to which these abbreviations refer are included in the tables Definitions of Scientific Terms in Section 2 and Techniques for Materials Characterization in Section 12. Useful references for further information are given below. 

The modern tendency of describing practically everything in this world by a combination of a few letters (acronyms) has also penetrated the field of Materials Characterization. The table below gives the meaning of the acronym for every technique listed, the form and size of the required sample (bulk, surface, fUm, liquid, powder, etc.), the nature of the incoming and of the emerging radiation, the depth and the lateral spatial resolution that can be probed, and the information obtained from the experiment. The last column lists one or two major references to the technique described. 

Table 1,1 lists many of the. surface science techniques that have been used iiiosi frt querjtly In recent years to Icam about the iritertace on the atomic scale, TTie names of the technique , their acronyms, and brief descriplions are provided, along with references, if a more detailed study of the capabilities and limitations of a panicuiar technique is desired. We also indicate the primary surface Infomtatton that can be obtained by the application of each technique. Detailed discussions of these tech niques are outside the scope of this book. The reader is referred to review papers that describe the principles of operation for each, the i ns tm mental ton, and some of... 

Surface analysis uses different techniques to probe the surface leading to a response, an analytical signal serving as a source of analytical information. The probe/ response combinations used in surface analysis include electrons, ions, photons, neutrals, heat, and electric field. Practically all combinations may form the basis of techniques used in surface analysis and so their list is rather long and should by no means be considered to be complete. This is also due to fact that very subde variations of a technique sometimes become known by their own name and acronym. Some of these acronyms are listed in the Appendix, Section 13.6. 

This chapter summarizes the principles of some of the many spectroscopic techniques that are available for the analysis or study of aspects of adhesive bonding science and technology. As indicated in Table 1, there are dozens of techniques and new acronyms appear almost on a daily basis. The number of instrumental spectroscopies available today to the scientist is bewildering, especially the many techniques for surface characterization. Therefore, it is likely that some techniques have been missed, although it was attempted to cover them all, at least in Table 1. The choice of techniques from that listing that were actually discussed in this chapter had to be limited and was in some cases somewhat arbitrary and subjective. However, some emphasis was put on techniques that can be used in the study of the science of adhesive bonding technology. Techniques for routine analysis, e.g., NMR or the various mass spectrometries, were not discussed in depth. 

---