Atomic force microscopy current-sensing

Scanned probe microscopies (SPM) that are capable of measuring either current or electrical potential are promising for in situ characterization of nanoscale energy storage cells. Mass transfer, electrical conductivity, and the electrochemical activity of anode and cathode materials can be directly quantified by these techniques. Two examples of this class of SPM are scanning electrochemical microscopy (SECM) and current-sensing atomic force microscopy (CAFM), both of which are commercially available. 

D.H. Han, H.J. Lee, and S.M. Park, Electrochemistry of conductive pol)miers XXXV Electrical and morphological characteristics of pol3fpyrrole films prepared in aqueous media studied by current sensing atomic force microscopy. Electrochim. Acta, 50, 3085 (2005). 

Pobelov, I.V., Mohos, M., Yoshida, K. et al. (2013) Electrochemical current-sensing atomic force microscopy in conductive solutions. Nanotechnology, 24, 115501. 

CSAFM Current Sensing Atomic Force Microscopy (also called CAFM)... 

Visual detection of surface layers on cathodes using microscopy techniques such as SFM seems to be supportive of the existence of LiF as a particulate-type deposition.The current sensing atomic force microscope (CSAFM) technique was used by McLarnon and co-workers to observe the thin-film spinel cathode surface, and a thin, electronically insulating surface layer was detected when the electrode was exposed to either DMC or the mixture FC/DMC. The experiments were carried out at an elevated temperature (70 °C) to simulate the poor storage performance of manganese spinel-based cathodes, and degradation of the cathode in the form of disproportionation and Mn + dissolution was ob-served. °° This confirms the previous report by Taras-con and co-workers that the Mn + dissolution is acid-induced and the electrolyte solute (LiPFe) is mainly responsible. 

Recent innovations in microscopy include the use of scanning probes that sense changes either in the tunneling current (scanning tunneling microscopy (STM)] or in the interfacia] force [atomic force microscopy... 

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