Spectroscopy scanning

Film-forming chemical reactions and the chemical composition of the film formed on lithium in nonaqueous aprotic liquid electrolytes are reviewed by Dominey [7], SEI formation on carbon and graphite anodes in liquid electrolytes has been reviewed by Dahn et al. [8], In addition to the evolution of new systems, new techniques have recently been adapted to the study of the electrode surface and the chemical and physical properties of the SEI. The most important of these are X-ray photoelectron spectroscopy (XPS), SEM, X-ray diffraction (XRD), Raman spectroscopy, scanning tunneling microscopy (STM), energy-dispersive X-ray spectroscopy (EDS), FTIR, NMR, EPR, calorimetry, DSC, TGA, use of quartz-crystal microbalance (QCMB) and atomic force microscopy (AFM). 

Ion beam spectrochemical analysis Auger emission spectroscopy Scanning electron microscopy (SEM) Electron microprobe (EMPA) Particle-induced X-ray emission spectroscopy (PIXE)... 

The samples were characterized by using X-ray diffraction, Fourier transform infrared spectroscopy, scanning electron microscopy, 57Fe Mossbauer spectroscopy [2] and Rutherford backscattering spectrometry (RBS). 

Lindner et al. carried out detailed studies on the use of the sol-gel procedure to obtain new materials as suitable matrices [45]. A co-condensation of Si(OR)4, Si(OR)3-spacer-Si(OR)3 and Si(OR)3-spacer-ligand resulted in new hybrid materials, the properties of which strongly depended upon the spacer and the ratio of the different components used. Most of these materials were characterised with IR, EXAFS, and EDX spectroscopy, scanning electron microscopy and solid state NMR spectroscopy. Solid state 31P NMR was used to quantify the mobility of the interphases the changes in line-... 

LB films prepared from ironfUI) stearate, transferred to solid substrates, dried, exposed to hydrochloric add in a desiccator, and subsequently exposed to pyrrole vapor Absorption spectroscopy, scanning electron microscopy, and conductivity measurements Lateral conductivity as high as t.25 S cm" was measured 123... 

Keywords Vibrational spectroscopy scanning tunneling microscopy and spectroscopy conductance inelastic conductance single-molecule chemistry controlled manipulation mode-selective reactivity. 

Adsorption (Chemical Engineering) Batch Processing Catalysis, Homogeneous Catalysis, Industrial Electrochemistry Infrared Spectroscopy Mossbauer Spectroscopy Nuclear Magnetic Resonance Raman Spectroscopy Scanning Electron Microscopy Surface Chemistry... 

The use of photoresists to cover most of the metal surface and isolate individual pits has made possible detailed analysis of these entities, varying in radius from around 0.1 to 5 pm. The methods of examination include Auger spectroscopy, scanning electron microscopy, X-ray dispersive analysis, and atomic force microscopy (Ke and Alkyre, 1995). 

Secondary Ion Mass Spectroscopy Scanning Tunneling Microscopy temperature... 

ESCA UPS SIMS STM IR UV electron spectroscopy for chemical analysis ultra-violet photoelectron spectroscopy secondary ion mass spectroscopy scanning tunneling microscopy infra-red ultra-violet... 

Frictional Force Microscopy Fourier-transform infrared spectroscopy scanning electron microscope surface force apparatus Secondary ion mass spectroscopy scanning tunneling microscope X-ray photoelectron spectroscopy bovine serum albumin immunoglobulin G... 

Scanning force spectroscopy (SFS) Force-distance curves Amplitude-distance curves Phase-distance curves Frequency-distance curves - Kelvin probe spectroscopy - Scanning capacitance spectroscopy Full-resonance spectroscopy (FRS) AFAM resonance spectroscopy (AFAM-RS) Scanning spreading resistance spectroscopy (SSRS)... 

Low tenperature isotropic (LTI) pyrolytic carbon has been studied by X-ray photoelectron spectroscopy, scanning electron microscopy, and energy dispersive X-ray analysis. Both silicon-alloyed and unalloyed carbons were studied, in both as-deposited and polished (finished) forms. The polished materials contain significant amounts of surface oxygen. Approximately 1 in 10 of the carbon atoms in the surface volume analyzed by XPS are... 

Rutherford backscattering spectroscopy Scanning electron microscopy Secondary ion mass spectroscopy Single crystal X-ray diffraction Small angle X-ray and neutron scattering Spark source mass spectrometry Transmission electron microscopy Voltametry... 

Analytical techniques commonly used to check for solid-state characteristics include melting point (including hot-stage microscopy), solid-state infrared spectroscopy, x-ray powder diffraction, thermal analysis (e.g., differential scanning calorimetry, thermogravimetric analysis, and differential thermal analysis), Raman spectroscopy, scanning electron microscopy, and solid-state nuclear magnetic resonance (NMR). 

Surface excesses of electroactive species are often examined by methods sensitive to the faradaic reactions of the adsorbed species. Cyclic voltammetry, chronocoulometry, polarography, and thin layer methods are all useful in this regard. Discussions of their application to this type of problem are provided in Section 14.3. In addition to these electrochemical methods for studying the solid electrode/electrolyte interface, there has been intense activity in the utilization of spectroscopic and microscopic methods (e.g., surface enhanced Raman spectroscopy, infrared spectroscopy, scanning tunneling microscopy) as probes of the electrode surface region these are discussed in Chapters 16 and 17. 

There has also been interest in studying adsorbed layers on the electrode surfaces by spectrometric methods, either with the electrode immersed in the solution (e.g., by ellip-sometry, surface enhanced Raman spectroscopy, scanning tunneling microscopy) or after removal emersion) of the electrode from solution. These methods are useful, since they can supply information about the structure of the adsorbed layer. They are discussed briefly in Chapter 17. 

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