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Sector field

The development of methods of analysis of tria2ines and thek hydroxy metabohtes in humic soil samples with combined chromatographic and ms techniques has been described (78). A two-way approach was used for separating interfering humic substances and for performing stmctural elucidation of the herbicide traces. Humic samples were extracted by supercritical fluid extraction and analy2ed by both hplc/particle beam ms and a new ms/ms method. The new ms /ms unit was of the tandem sector field-time-of-flight/ms type. [Pg.246]

Apart from the quadrupole and TOP analyzers described in Sect. 3.2.2, the most important types of mass analyzer used in common dynamic SIMS instruments employ a magnetic-sector field. [Pg.109]

Magnetic Sector Field. In a magnetic field B an ion with the velocity v and the charge q experiences a centripetal force, the Lorentz force P ... [Pg.109]

Two types of commercial magnetic sector field instrument will be described in the following ... [Pg.110]

Fig. 3.19. Basic set-up of a direct imaging magnetic sector instrument. The stigmatic secondary ion optics consists of an electrostatic analyzer (ESA) and a magnet sector field. Fig. 3.19. Basic set-up of a direct imaging magnetic sector instrument. The stigmatic secondary ion optics consists of an electrostatic analyzer (ESA) and a magnet sector field.
The direct imaging magnetic sector mass analyzer (Fig. 3.19) has the unique property that all parts (lenses, electrostatic analyzer and magnetic sector field) of the secondary ion optics are stigmatic (comparable with light microscopes). This means that all points of the surface are simultaneously projected into the analyzer. [Pg.111]

Magnetic sector field instruments have mass resolutions up to m/Am = 20000 quad-rupole instruments are limited to a mass resolution of approximately m/Am = 500. For both types of instrument the a mass range extends to 500. [Pg.113]

Reduction of the measurement time for element distributions is possible by simultaneous detection of several masses. This can be achieved only by use of a magnetic sector field spectrometer with Mattauch-Herzog geometry [3.49] (Fig. 3.20) and parallel detection of up to five masses by mechanically adjusted electron multipliers. [Pg.117]

In both electron post-ionization techniques mass analysis is performed by means of a quadrupole mass analyzer (Sect. 3.1.2.2), and pulse counting by means of a dynode multiplier. In contrast with a magnetic sector field, a quadrupole enables swift switching between mass settings, thus enabling continuous data acquisition for many elements even at high sputter rates within thin layers. [Pg.126]

In principle GD-MS is very well suited for analysis of layers, also, and all concepts developed for SNMS (Sect. 3.3) can be used to calculate the concentration-depth profile from the measured intensity-time profile by use of relative or absolute sensitivity factors [3.199]. So far, however, acceptance of this technique is hesitant compared with GD-OES. The main factors limiting wider acceptance are the greater cost of the instrument and the fact that no commercial ion source has yet been optimized for this purpose. The literature therefore contains only preliminary results from analysis of layers obtained with either modified sources of the commercial instrument [3.200, 3.201] or with homebuilt sources coupled to quadrupole [3.199], sector field [3.202], or time-of-flight instruments [3.203]. To summarize, the future success of GD-MS in this field of application strongly depends on the availability of commercial sources with adequate depth resolution comparable with that of GD-OES. [Pg.179]

Multiple-collector inductively coupled plasma mass spectrometry (MC-ICPMS) combines sector-field ICPMS with a multiple collector detector system and has recently emerged as an alternative to TIMS for precise U-Th isotope measurement. The full potential of MC-ICPMS has yet to be realized. Yet despite this, its performance in high precision isotope measurement already challenges and, in some cases, surpasses that ever achieved by TIMS (e.g., Lee and Halliday 1995 Blichert-Toft and Albarede 1997). [Pg.39]

Figure 7.32 shows the identification of an oxidation product of Irganox 1330 by means of APCI-MS. LC-APCI-MS/MS (high-resolution sector field-ion trap hybrid) has also been used for the analysis (elemental composition and structure) of Irganox PS 802 [636]. [Pg.517]

Kim et al. [116] determined plutonium isotopes in seawater by an online sequential injection technique with sector field ICP-MS. [Pg.355]

A Thermo Finnigan Element 2 Inductively Coupled Plasma Sector-Field Mass Spectrometer (ICP-SF-MS) with guard electrode was employed for trace element analyses. RSD values derived from internal check standard never exceeded 10%. Accuracy was better than 15% for all elements as determined by analyzing the certified reference standard NWRI TM-RAIN 95 trace metal fortified rainwater, every 5 to 8 samples. [Pg.208]

M. P. Field, J. T. Cullen, and R. M. Sherrell. Direct Determination of 10 Trace Metals in 50 xL Samples of Coastal Seawater Using Desolvating Micronebulization Sector Field ICP-MS. J. Anal. Atom. Spectrom., 14(1999) 1425-1431. [Pg.241]

In addition to the diversity of ionisation techniques available, mass spectrometers offer a selection of mass analyser configurations. Of note are single (MS) and triple quadrupole (MS—MS) instruments, ion trap analysers (MS)n, time-of-flight (ToF) analysers, sector field analysers, and Fourier transform-ion cyclotron resonance (FTICR) instruments. [Pg.147]

The recent and meteoric development of plasma source mass spectrometers equipped with high stability sector-field magnets and multiple collectors (MC-ICP-MS) has lead to a... [Pg.156]

Bensimon M, Bourquin J, Parriaux A (2000) Determination of ultra-trace elements in snow samples by inductively-coupled plasma source sector field mass spectrometry using ultrasonic nebulization. J Anal Atom Spectrom 15 731-734... [Pg.189]

Morgan, R.P. Porter, C.J. Beynon, J.H. On the Formation of Artefact Peaks in Linked Scans of the Magnet and Electric Sector Fields in a Mass Spectrometer. Org. Mass Spectrom. 1977,12, 735-738. [Pg.186]


See other pages where Sector field is mentioned: [Pg.244]    [Pg.434]    [Pg.434]    [Pg.434]    [Pg.435]    [Pg.435]    [Pg.52]    [Pg.53]    [Pg.53]    [Pg.178]    [Pg.27]    [Pg.157]    [Pg.217]    [Pg.39]    [Pg.42]    [Pg.56]    [Pg.57]    [Pg.484]    [Pg.527]    [Pg.9]    [Pg.18]    [Pg.18]    [Pg.33]    [Pg.41]    [Pg.523]    [Pg.326]    [Pg.95]    [Pg.116]   
See also in sourсe #XX -- [ Pg.256 ]

See also in sourсe #XX -- [ Pg.112 ]

See also in sourсe #XX -- [ Pg.256 ]




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Analyzer double-focusing sector field

Analyzer magnetic sector field

Double focussing sector field mass

Double focussing sector field mass spectrometer

Double-focusing sector field

Double-focusing sector field ICP mass spectrometry

Double-focusing sector field mass

Double-focusing sector field mass spectrometer

Double-focusing sector field mass spectrometer with Mattauch-Herzog geometry

Double-focusing sector field mass spectrometer with Nier-Johnson geometry

Electric sector fields

Electromagnetic sector field

Glow discharge-sector field mass spectrometry

Inductively coupled plasma mass sector-field

Inductively coupled plasma sector field mass spectrometry

Magnetic sector field

Magnetic sector field instruments

Magnetic sector field mass spectrometer

Mass sector field

Mass spectrometer sector field

Mattauch-Herzog-type sector field instrument

Sector

Sector field ICP

Sector field analysers

Sector field analyzers

Sector field analyzers electric

Sector field analyzers lens effect

Sector field analyzers prism effect

Sector field analyzers spectrometers

Sector field high-resolution

Sector field mass spectrometry

Sectorization

Single double-focusing sector field mass

Single high mass resolution with sector field

Spectral high mass resolution with sector field

Transmission sector field

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