Double-focusing sector field mass spectrometer

Combination of Magnetic and Electric Sector Fields - Double-focusing Sector Field Mass Spectrometer... 

Figure 3.5 Double-focusing sector field mass spectrometer with Nier-johnson geometry. (77. Kienitz (ed.), Massenspektrometrie (1968), Verlag Chemie, Weinheim. Reproduced by permission ofWiley-VCH)...

Figure 4.4 Schematic (a) and photograph of ion detector with extended dynamic range (b) in the double-focusing sector field mass spectrometer Element. (Reproduced by permission of Thermo Fisher Scientific, Bremen.)...

Double-focusing sector field mass spectrometer... 

Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)...

At present GDMS164 165 is one of the most powerful solid-state analytical methods for the direct determination of trace impurities and depth profiling of solids. The positively charged ions formed in the low pressure argon plasma of the glow discharge are extracted and accelerated into the double-focusing sector field mass spectrometer, quadrupole, ion trap or ToF mass analyzer. 

Figure 5.29 Instrumental setup of a radiofrequency (rf) glow discharge mass spectrometer by combining an ion source developed in house with a commercial double-focusing sector field mass spectrometer with reverse Nier-Johnson geometry (Element, Thermo Fisher Scientific, Bremen, Germany), (f S. Becker et al., IntJ. Mass Spectrom., 164, 81 (1997). Produced by permission of Elsevier.)...

A few SIMS and SNMS instruments for surface analysis187-189 are commercially available on the analytical market. These are SIMS instruments using a double-focusing sector field mass spectrometer (e.g., CAMECA IMS-7f), time-of-flight secondary ion mass spectrometers (ToF-SIMS IV from CAMECA, Cedex, France, or ToF-SIMS 5, the ToF-SIMS 300 from ION-TOF, Munster, Germany and the PHI TRIFT IV from Physical Electronics, USA) and quadrupole based SIMS (SIMS 4550 and 4600 CAMECA, Cedex, France) or the quadrupole based SNMS instruments with SIMS option (INA-X, SPECS GmbH, Berlin, Germany). 

However, nowadays some other different mass spectrometers are used for ICP-MS time-of-flight (TOP) systems for multielemental analysis of transient signals, ion trap analysers for ion storage, multicollector instruments for precise isotope ratio measurements and double-focusing sector field mass spectrometers for high mass resolution, but still the majority of instruments are equipped with quadrupole filters, which are simpler and cheaper. 

Fig. 5 Statistical evaluation of LC-MS-based methods for tropane alkaloids referred in this chapter. (a) Relative frequency of ionization methods. +APCI positive atmospheric pressure chemical ionization, +ESI positive electrospray ionization, FAB fast atom bombardment, +TSP positive thermospray, (b) Relative frequency of scan modes used. MS full scan MS, MS/MS tandem mass spectrometry (product ion scan), MRM multiple reaction monitoring, SIM selected ion monitoring, (c) Relative frequency of mass analysers used. EBQtQ2 double focusing sector field mass spectrometer, IT ion trap, QqQ triple quadrupole, SQ single quadrupole. Considered publications were found by PubMed data-based search and references cited in these articles...

At last, the double focusing sector field mass spectrometer (EBQjQ2) should briefly be addressed. This mass analyser represents a highly sophisticated early design that has rarely been used for routine analysis especially for quantification. For detailed information on the functional principle the reader is referred to respective textbooks on mass spectrometry. We mention this technique as Kajbaf et al. used EBQjQ2 for detection and identification of the QTA cimetropium and its biotransformation products from liver microsomal mixtures in offline analysis of HPLC fractions after FAB ionization [23, 62] (Table 7). 

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