Post-ionization techniques

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

A comparison of the various post-ionization techniques electron-gas bombardment, resonant and nonresonant laser ionization, etc. While some of the numbers are outdated, the relative capabilities of these methods have remained the same. This is a well-written review article that reiterates the specific areas where post-ionization has advantages over SIMS. 

A discussion of the motivation behind doing sputtered neutral analysis versus SIMS, plus a description of the first prototype SALI instrument. A well written introduction for someone without previous surface analysis experience it also includes an historical overview of the various post-ionization techniques. 

Depending on the matrix and the post-ionization technique, SN" spectra can be dominated by atomic or molecular signals. In particular, compounds with high mass... 

In both electron post-ionization techniques mass analysis is performed by means of a quadrupole mass analyzer (Sect. 3.1.2.2), and pulse counting by means of a dynode multiplier. In contrast with a magnetic sector field, a quadrupole enables swift switching between mass settings, thus enabling continuous data acquisition for many elements even at high sputter rates within thin layers. 

Surface analysis by non-resonant (NR-) laser-SNMS [3.102-3.106] has been used to improve ionization efficiency while retaining the advantages of probing the neutral component. In NR-laser-SNMS, an intense laser beam is used to ionize, non-selec-tively, all atoms and molecules within the volume intersected by the laser beam (Eig. 3.40b). With sufficient laser power density it is possible to saturate the ionization process. Eor NR-laser-SNMS adequate power densities are typically achieved in a small volume only at the focus of the laser beam. This limits sensitivity and leads to problems with quantification, because of the differences between the effective ionization volumes of different elements. The non-resonant post-ionization technique provides rapid, multi-element, and molecular survey measurements with significantly improved ionization efficiency over SIMS, although it still suffers from isoba-ric interferences. 

Sputter yields for pertinent species are most commonly defined nsing some form of post-ionization technique. These effectively operate by ionizing the plume of neutral species shortly after their departure from the surface from which they are sputtered, with all ions then passed through a mass spectrometer, most conunonly a time-of-flight mass spectrometer. 

However, this high variability in ionization efficiencies implies that LDl is a very selective ionization method. In some cases, this selectivity is advantageous, for example, when one wishes to observe the presence or concentration of one, known, select molecule of interest.However, in mass spectrometry, one usually is interested in detecting all molecules that are present, including unknown species. Thus, many methods were explored to ionize the molecules after they were desorbed by the laser. These methods are collectively known as laser desorption post-ionization methods, and the post-ionization techniques include electron impact (El, diagrammed in Figure 6.2), chemical ionization (Cl), photoionization (PI), resonant-enhanced multiphoton ionization (REMPI), and many others. 

R. W. Odom and B. Schueler. Laser Microprobe Mass Spectrometry Ion and Neutral Analysis, in Lasers and Mass Spectrometry (D. M. Lubman, ed.) Oxford University Press, Oxford, 1990. Presents a useful discussion of LIMS instrumental issues, including the post-ablation ionization technique. Several anal)n ical applications are presented. 

In SIMSLAB from VG Scientific, both surface analytical techniques - SIMS and SNMS - have been applied (see Figure 5.34). In this mass spectrometer different types of primary ion sources are available. Ar+, Cs+, Ga+ or O) primary ions are accelerated in the secondary ion source on the solid sample surface. Similar to the CAMECA IMS-7f, with this experimental arrangement, besides depth profiling, a microlocal analysis can also be performed. The sputtered secondary ions (for SIMS) or the post-ionized sputtered neutrals (for SNMS) - the post-ionization is carried out by an electron beam in an ionizer box (right-hand schematic in Figure 5.34) - are separated... 

Resonant and non-resonant laser post-ionization of sputtered uranium atoms using SIRIS (sputtered initited resonance ionization spectroscopy) and SNMS (secondary neutral mass spectrometry) in one instrument for the characterization of sub-pm sized single microparticles was suggested by Erdmann et al.94 Resonant ionization mass spectrometry allows a selective and sensitive isotope analysis without isobaric interferences as demonstrated for the ultratrace analysis of plutonium from bulk samples.94 Unfortunately, no instrumental equipment combining both techniques is commercially available. 

In SNMS, sputtered neutrals are post-ionized before they enter the mass spectrometer. In contrast to SIMS, SNMS does not suffer from the matrix effects associated with the ionization probability of sputtered particles, as here the sensitivity for a certain element is mainly determined by its sputter yield. As sputtering is relatively well understood, excellent quantitation of SNMS has been demonstrated. Moreover, SNMS as a technique was developed much later than SIMS, and has not yet been fully exploited for catalysts. 

With the advent of very sensitive ionization techniques such as matrix assisted laser desorption (MALDI) coupled with time-of-flight (TOF) mass analysis, measurement of the intact mass of peptides at sub-pmol levels has become a reality (2) of which we have taken advantage for the systematic screening of HPLC fractions. Partial sequence information can be obtained by carrying out enzymatic hydrolysis with exoproteinases (e.g. carboxypeptidases and aminopeptidases) (3, 4). More recently, MALDI has been used to measure metastable decomposition occurring in the first field free region of a reflectron TOF instrument (referred to as post source decay (PSD)) with only marginally more sample (5-7). 

Mass spectrometry of secondary ions (SIMS) [78, 79] or of post-ionized secondary neutral particles (SNMS) [80-82], which both are ejected from a surface which is bombarded with an ion beam, is a very sensitive but for chemical compounds also destructive analytical technique. It yields excellent qualitative information. Quantitative results are difficult to obtain. A review is given in [83]. 

As a first approach to post-ionization of desorbed neutral pol5uners we discuss laser-generated cationization. This approach differs from other desorption/ cationization techniques because the desorption step and the cationization step are completely separate. First polymers are gently laser desorbed at low fluence wifh one laser. Independenfly atomic metal ions are generated by a second pulsed laser that is tightly focused on a metal surface fo creafe a plume of mefal ions. Gas phase collisions above the sample surface subsequenfly produce fhe cafionized complexes. Separation of fhe desorption and cationization processes allows independent optimization of fhe fwo laser/maferial interactions. This approach is especially useful in sifuations where ofher ionization methods fail, such as fhe example of PFPEs discussed here. ... 

Sputtering by kilovolt ion beams produces far more neutral species than ions. When static methods are employed, one can assume that a large percentage of these sputtered neutrals will be intact molecules. Thus, there is the very real possibility for improving detection limits (sensitivity) if these neutrals can be observed by post-ionization in the gas phase. Such techniques are known as secondary neutral mass spectrometry (SNMS). ... 

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