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Single high mass resolution with sector field

Double-focusing mass spectrometers with high mass resolution are rather bulky and expensive instruments so that the development of single magnetic sector field mass spectrometers was of significance in the following years. [Pg.17]

In double-focusing sector field ICP-MS spectrometers with single ion detection, the best abundance sensitivity with a mass difference of two is observed at medium mass resolution m/Am = 4400 (9 x 10 ). At low mass resolution mlAm = 400) an abnndance sensitivity for °Sr determination of 2 x 10 was measured in the author s laboratory. In quadrupole ICP-MS with and without a hexapole coUision cell, an abundance sensitivity of 6 x 10 and 6 x 10 , respectively, for determination in the presence of abundant with high ion intensity was determined by Boulyga et al. ° A significant improvement in abundance sensitivity for the determination of the isotope ratio has been obtained by multi-collector ICP-MS (Nu Plasma... [Pg.100]

Mass spectrometers with only a sector magnetic field for mass analysis are known as single-focusing instruments. A well designed single-focusing spectrometer may have resolution as high as 5000. In mass spectrometry, resolution R is defined as... [Pg.451]

High-resolution sector-field ICP-MS (SF-ICP-MS), be it double or single focusing, offers superior detection limits, and more precise quantitative and isotope ratio results when measurements are performed in low-resolution mode due to the flat-top spectral peaks. Use of higher mass resolution (up to 10000) results in sharper spectral peaks and resolves polyatomic interferences from the target element signals. The result is improved detection capability for certain elements compared to quadrupole ICP-MS. Prominent examples of elements where measurements with SF-ICP-MS are beneficial are Fe, V, Cr, As and Se. ... [Pg.310]

Magnetic sector and electrostatic sector mass analyzers are well suited for operation with continuous ion sources the trajectories of moving ions are curved by forces developed by the electric or magnetic fields (Fig. 2.9). The extent of this curvature depends on an ion s m/z. Sector analyzers can be used to monitor a single ion with high resolution. A narrow slit is installed between the detector and the ion analyzer the position of the slit determines... [Pg.37]

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High field

High-mass

High-resolution mass

Mass resolution

Resolution with

Sector

Sector field

Sector field high-resolution

Sector high mass resolution with

Sectorization

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