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Analyzer double-focusing sector field

At present GDMS164 165 is one of the most powerful solid-state analytical methods for the direct determination of trace impurities and depth profiling of solids. The positively charged ions formed in the low pressure argon plasma of the glow discharge are extracted and accelerated into the double-focusing sector field mass spectrometer, quadrupole, ion trap or ToF mass analyzer. [Pg.157]

See other pages where Analyzer double-focusing sector field is mentioned: [Pg.42] [Pg.20] [Pg.28] [Pg.48] [Pg.54] [Pg.95] [Pg.107] [Pg.132] [Pg.133] [Pg.135] [Pg.138] [Pg.164] [Pg.166] [Pg.167] [Pg.269] [Pg.270] [Pg.275] [Pg.327] [Pg.345] [Pg.346] [Pg.389] [Pg.397] [Pg.405] [Pg.422] [Pg.475] [Pg.317] [Pg.20] [Pg.48] [Pg.54] [Pg.95] [Pg.107] [Pg.132] [Pg.133] [Pg.135] [Pg.138] [Pg.157] [Pg.164] [Pg.166] [Pg.167] [Pg.269] [Pg.270] [Pg.275] [Pg.327] [Pg.345] [Pg.346] [Pg.389] [Pg.397] [Pg.405] [Pg.422] [Pg.475]

See also in sourсe #XX -- [ Pg.54 , Pg.60 , Pg.64 , Pg.78 ]

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Double focusing

Double-focusing analyzer

Double-focusing sector

Double-focusing sector field

Sector

Sector analyzers

Sector field

Sector field analyzers

Sectorization