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Double-focusing sector field

Combination of Magnetic and Electric Sector Fields - Double-focusing Sector Field Mass Spectrometer... [Pg.83]

Figure 3.5 Double-focusing sector field mass spectrometer with Nier-johnson geometry. (77. Kienitz (ed.), Massenspektrometrie (1968), Verlag Chemie, Weinheim. Reproduced by permission ofWiley-VCH)... Figure 3.5 Double-focusing sector field mass spectrometer with Nier-johnson geometry. (77. Kienitz (ed.), Massenspektrometrie (1968), Verlag Chemie, Weinheim. Reproduced by permission ofWiley-VCH)...
A special experimental arrangement of double-focusing sector field mass spectrometry - the... [Pg.85]

Figure 3.6 Schematicofa double-focusing sector field mass spectrograph with Mattauch-Herzog geometry with a linear imaging curve (double focusing for ions of all masses simultaneously) modified field combination with 70°. In the mass spectrograph, photographic ion detection or focal plane array detectors are used for quasi-simultaneous detection of separated ion beams. (H. Kienitz (ed.), Massen-spektrometrie (1968), Verlag Chemie, Weinheim. Reproduced by permission of Wiley-VCH)... Figure 3.6 Schematicofa double-focusing sector field mass spectrograph with Mattauch-Herzog geometry with a linear imaging curve (double focusing for ions of all masses simultaneously) modified field combination with 70°. In the mass spectrograph, photographic ion detection or focal plane array detectors are used for quasi-simultaneous detection of separated ion beams. (H. Kienitz (ed.), Massen-spektrometrie (1968), Verlag Chemie, Weinheim. Reproduced by permission of Wiley-VCH)...
Magnetic sector field equilibr Lorentz force and centrifugal force mv2 n-e-v-B= 2 - direction focusing (lens effect) - separation after m/z (prism effect) 1 500 5 000 TIMS, organic ms, double-focusing sector field ms, tandem ms... [Pg.98]

Figure 4.4 Schematic (a) and photograph of ion detector with extended dynamic range (b) in the double-focusing sector field mass spectrometer Element. (Reproduced by permission of Thermo Fisher Scientific, Bremen.)... Figure 4.4 Schematic (a) and photograph of ion detector with extended dynamic range (b) in the double-focusing sector field mass spectrometer Element. (Reproduced by permission of Thermo Fisher Scientific, Bremen.)...
Double-focusing sector field mass spectrometer... [Pg.119]

An overview of commercial ICP mass spectrometers from different companies (quadrupole based ICP-MS with and without collision/reaction cell, double-focusing sector field instrumentation with single and multiple ion collectors, time-of-flight (ToF), ICP-ion trap-MS and non-commercial ICP-Fourier transform ion cyclotron resonance (FTICR) mass spectrometers is given in Figure 5.2. By using ion traps and FTICR mass spectrometers in ICP-MS isobaric interferences of atomic ions... [Pg.120]

As an alternative to commercial quadrupole based ICP-MS measurements at low mass resolution ( / 300), in 1996 Yiang and Douglas15 proposed a quadrupole ICP-MS system which allows a maximum mass resolution of 9000. At a mass resolution of 5000 the sensitivity was comparable to that of a commercial double-focusing sector field ICP-MS operated at the same mass resolution. Due to the very high continuum instrumental background of about lOOOcps no commercial high resolution quadrupole instrumentation with an inductively coupled plasma source exists and the development of high resolution quadrupole based ICP-MS has ceased. [Pg.123]

Double-focusing Sector Field ICP Mass Spectrometers with Single Ion Collector (ICP-SFMS)... [Pg.131]

The analytical performance of selected commercially available sector field ICP-MS with multiple ion collection compared to double-focusing sector field ICP-MS with a single ion collector are compared in Table 5.2. [Pg.138]

The experimental arrangement of LA-ICP-MS using a powerful laser ablation system coupled to a double-focusing sector field ICP-MS (Element, Thermo Fisher Scientific, Bremen) is shown in Figure 5.22. A cooled laser ablation chamber using two Peltier elements in serial connection... [Pg.151]

Figure 5.22 Schematic of laser ablation inductively coupled plasma mass spectrometer a laser ablation system (wa velength 213 nm) is coupled to a double-focusing sector field ICP-MS (Element, Thermo Fisher Scientific, Bremen). The cooled laser ablation chamber using two Peltier elements was developed in the author s laboratoryJ26 (M. V. Zoriy, M. Kayser, A. Izmer, C. Pickhardt and J. S. Becker, Int. J. Mass Spectrom., 242, 297 (2005). Reproduced by permission of Elsevier.)... Figure 5.22 Schematic of laser ablation inductively coupled plasma mass spectrometer a laser ablation system (wa velength 213 nm) is coupled to a double-focusing sector field ICP-MS (Element, Thermo Fisher Scientific, Bremen). The cooled laser ablation chamber using two Peltier elements was developed in the author s laboratoryJ26 (M. V. Zoriy, M. Kayser, A. Izmer, C. Pickhardt and J. S. Becker, Int. J. Mass Spectrom., 242, 297 (2005). Reproduced by permission of Elsevier.)...
Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)... Figure 5.24 Experimental setup of a double-focusing sector field mass spectrometer with Mattauch-Herzog geometry with interchangeable spark and laser ion source. (/. 5. Becker and H. /. Dietze, Int. /. Mass Spectrom. Ion Proc. 197, 1 (2000). Reproduced by permission of Elsevier.)...
At present GDMS164 165 is one of the most powerful solid-state analytical methods for the direct determination of trace impurities and depth profiling of solids. The positively charged ions formed in the low pressure argon plasma of the glow discharge are extracted and accelerated into the double-focusing sector field mass spectrometer, quadrupole, ion trap or ToF mass analyzer. [Pg.157]

See other pages where Double-focusing sector field is mentioned: [Pg.178]    [Pg.42]    [Pg.57]    [Pg.17]    [Pg.20]    [Pg.28]    [Pg.36]    [Pg.43]    [Pg.48]    [Pg.54]    [Pg.84]    [Pg.84]    [Pg.84]    [Pg.95]    [Pg.98]    [Pg.100]    [Pg.107]    [Pg.120]    [Pg.127]    [Pg.131]    [Pg.132]    [Pg.132]    [Pg.132]    [Pg.132]    [Pg.133]    [Pg.135]    [Pg.137]    [Pg.137]    [Pg.138]    [Pg.138]    [Pg.144]    [Pg.151]    [Pg.157]    [Pg.158]   
See also in sourсe #XX -- [ Pg.54 , Pg.55 , Pg.60 , Pg.64 , Pg.78 ]



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Analyzer double-focusing sector field

Double focusing

Double-focusing sector

Double-focusing sector field ICP mass spectrometry

Double-focusing sector field mass

Double-focusing sector field mass spectrometer

Double-focusing sector field mass spectrometer with Mattauch-Herzog geometry

Double-focusing sector field mass spectrometer with Nier-Johnson geometry

Sector

Sector field

Sectorization

Single double-focusing sector field mass

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