Sample electron microscopy

Deposition of organic matter was determined by mass balance in feed and concentrate samples. Electron microscopy and X-ray photoelectron pectroscopy (XPSJ were used to study the morphology and composition of the fouling layer. 

Spectroscopic characterization is also important in the study of oxide minerals. Among the many methods (Sections 7.3 through 7.7), it is important to mention X-ray fluorescence (XRF, Section 7.3.3), which allows a rapid elemental analysis of mineral samples. Electron microscopy allows observation of clay fraction particles shape and, coupled to X-ray spectroscopy, also elemental analysis (Section 7.5). Infrared spectroscopy (Section 7.4.3) is also frequently employed here, difference spectra combined with selective extraction procedures (Hass and Fine 2010) can be used to identify and study minor components (Golden, Dixon, and Kanehiro 1993). Nuclear magnetic resonance (NMR, Section 7.4.4) is in some cases useful (with uneven spin nuclei), for example, to distinguish octahedral and tetrahedral A1 centers (Bertsch and Parker 1996). 

To reveal the structure and morphology of the catalyst samples, electron microscopy analysis was performed on a REM-lOOy installation. After the samples were prepared by the replica method, they were studied directly under electron microscope. 

Transmission electron microscopy (TEM) can resolve features down to about 1 nm and allows the use of electron diffraction to characterize the structure. Since electrons must pass through the sample however, the technique is limited to thin films. One cryoelectron microscopic study of fatty-acid Langmuir films on vitrified water [13] showed faceted crystals. The application of TEM to Langmuir-Blodgett films is discussed in Chapter XV. 

The history of EM (for an overview see table Bl.17,1) can be interpreted as the development of two concepts the electron beam either illuminates a large area of tire sample ( flood-beam illumination , as in the typical transmission electron microscope (TEM) imaging using a spread-out beam) or just one point, i.e. focused to the smallest spot possible, which is then scaimed across the sample (scaiming transmission electron microscopy (STEM) or scaiming electron microscopy (SEM)). In both situations the electron beam is considered as a matter wave interacting with the sample and microscopy simply studies the interaction of the scattered electrons. 

For bulk structural detemiination (see chapter B 1.9). the main teclmique used has been x-ray diffraction (XRD). Several other teclmiques are also available for more specialized applications, including electron diffraction (ED) for thin film structures and gas-phase molecules neutron diffraction (ND) and nuclear magnetic resonance (NMR) for magnetic studies (see chapter B1.12 and chapter B1.13) x-ray absorption fine structure (XAFS) for local structures in small or unstable samples and other spectroscopies to examine local structures in molecules. Electron microscopy also plays an important role, primarily tlirough unaging (see chapter B1.17). 

Apart from the sheer complexity of the static stmctures of biomolecules, they are also rather labile. On the one hand this means that especial consideration must be given to the fact (for example in electron microscopy) that samples have to be dried, possibly stained, and then measured in high vacuum, which may introduce artifacts into the observed images [5]. On the other, apart from the vexing question of whether a protein in a crystal has the same stmcture as one freely diffusing in solution, the static stmcture resulting from an x-ray diffraction experiment gives few clues to the molecular motions on which operation of an enzyme depends [6]. 

In many ways the nanocrystal characterization problem is an ideal one for transmission electron microscopy (TEM). Here, an electron beam is used to image a thin sample in transmission mode [119]. The resolution is a sensitive fimction of the beam voltage and electron optics a low-resolution microscope operating at 100 kV might... 

Transmission electron microscopy (tern) is used to analyze the stmcture of crystals, such as distinguishing between amorphous siUcon dioxide and crystalline quartz. The technique is based on the phenomenon that crystalline materials are ordered arrays that scatter waves coherently. A crystalline material diffracts a beam in such a way that discrete spots can be detected on a photographic plate, whereas an amorphous substrate produces diffuse rings. Tern is also used in an imaging mode to produce images of substrate grain stmctures. Tern requires samples that are very thin (10—50 nm) sections, and is a destmctive as well as time-consuming method of analysis. 

Asbestos fiber identification can also be achieved through transmission or scanning electron microscopy (tern, sem) techniques which are especially usefiil with very short fibers, or with extremely small samples (see Microscopy). With appropriate peripheral instmmentation, these techniques can yield the elemental composition of the fibers using energy dispersive x-ray fluorescence, or the crystal stmcture from electron diffraction, selected area electron diffraction (saed). 

The properties and performance of cemented carbide tools depend not only on the type and amount of carbide but also on carbide grain size and the amount of biader metal. Information on porosity, grain size and distribution of WC, soHd solution cubic carbides, and the metallic biader phase is obtained from metaHographicaHy poHshed samples. Optical microscopy and scanning and transmission electron microscopy are employed for microstmctural evaluation. Typical microstmctures of cemented carbides are shown ia Figure 3. 

A variety of instmmental techniques may be used to determine mineral content. Typically the coal sample is prepared by low temperature ashing to remove the organic material. Then one or more of the techniques of x-ray diffraction, infrared spectroscopy, differential thermal analysis, electron microscopy, and petrographic analysis may be employed (7). 

Thin films of metals, alloys and compounds of a few micrometres diickness, which play an important part in microelectronics, can be prepared by die condensation of atomic species on an inert substrate from a gaseous phase. The source of die atoms is, in die simplest circumstances, a sample of die collision-free evaporated beam originating from an elemental substance, or a number of elementary substances, which is formed in vacuum. The condensing surface is selected and held at a pre-determined temperature, so as to affect die crystallographic form of die condensate. If diis surface is at room teiiiperamre, a polycrystalline film is usually formed. As die temperature of die surface is increased die deposit crystal size increases, and can be made practically monocrystalline at elevated temperatures. The degree of crystallinity which has been achieved can be determined by electron diffraction, while odier properties such as surface morphology and dislocation sttiicmre can be established by electron microscopy. 

The STEM instrument itself can produce highly focused high-intensity beams down to 2 A if a field-emission source is used. Such an instrument provides a higher spatial resolution compositional analysis than any other widely used technique, but to capitalize on this requires very thin samples, as stated above. EELS and EDS are the two composition techniques usually found on a STEM, but CL, and even AES are sometimes incorporated. In addition simultaneous crystallographic information can be provided by diffraction, as in the TEM, but with 100 times better spatial resolution. The combination of diffraction techniques and analysis techniques in a TEM or STEM is termed Analytical Electron Microscopy, AEM. A well-equipped analytical TEM or STEM costs well over 1,000,000. 

As NRA is sensitive only to the nuclei present in the sample, it does not provide information on chemical bonding or microscopic structure. Hence, it is often used in conjunction with other techniques that do provide such information, such as ESCA, optical absorption. Auger, or electron microscopy. As NRA is used to detect mainly light nuclei, it complements another accelerator-based ion-beam technique, Rutherford backscattering (RBS), which is more sensitive to heavy nuclei than to light nuclei. 

In contrast to many other surface analytical techniques, like e. g. scanning electron microscopy, AFM does not require vacuum. Therefore, it can be operated under ambient conditions which enables direct observation of processes at solid-gas and solid-liquid interfaces. The latter can be accomplished by means of a liquid cell which is schematically shown in Fig. 5.6. The cell is formed by the sample at the bottom, a glass cover - holding the cantilever - at the top, and a silicone o-ring seal between. Studies with such a liquid cell can also be performed under potential control which opens up valuable opportunities for electrochemistry [5.11, 5.12]. Moreover, imaging under liquids opens up the possibility to protect sensitive surfaces by in-situ preparation and imaging under an inert fluid [5.13]. 

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