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Electron samples

Medeiros M (2005) Monte Carlo simulation of polarizable systems early rejection scheme for improving the performance of adiabatic nuclear and electronic sampling Monte Carlo simulations. Theor Chem Acc 113(3) 178-182... [Pg.252]

The availability of integrated circuits paved the way for the next generation ofX-ray inspection system. These units featured a side-shooting fan beam of X-rays incident on an extended array of scintillators optically coupled to photodiodes or phototransistors. The resulting low-level electric currents were then amphfied, integrated, and electronically sampled and digitized. Such systems were under development by ScanRay and Picker in 1977. By 1979, Picker was marketing... [Pg.104]

EM provides local structural information about the samples in both real and reciprocal space, for example local structural information about the surface and the bulk of the sample at the atomic level, together with chemical, electronic and three-dimensional structural information are now routinely available. Some of these methods are described in this chapter. Electron-sample interactions and scattering are fundamental to EM. EM is a diffraction technique in which crystals diffract electrons in accordance with Bragg s law, nX = Idhki sin 9, where X is the... [Pg.45]

In electron-sample interactions, x-rays can be formed during inelastic scattering of electrons. The following principles describe the generation and character of the x-rays. [Pg.59]

In the UPS or XPS of solid films, the front of the sample (the polymer or condensed molecular solid film) can be maintained in electrical contact (equilibrium) with the metallic substrate, because the films employed are so thin that electron tunneling from the substrate, or numerous other effects, prevent any positive surface electronic charge from building up during the course of the measurements. In this way, electronic sample charging effects23 40 41 are avoided in works reported herein, and thus will not be covered. [Pg.42]

Figure 3.12. Signals detected in SEM, resulting from electrons/sample interaction. Figure 3.12. Signals detected in SEM, resulting from electrons/sample interaction.
FIGURE 11.7 Electron/sample interactions for (a) conventional and (b) thin-foil mounting techniques in the SEM. (Adapted from Seaman, J.C., Environ. Sci. Technol., 34, 187, 2000. With permission.)... [Pg.300]

Nuclear and Electronic Sampling Monte Carlo Simulations in the Gibbs Ensemble Application to Polarizable Force Fields for Water. [Pg.142]

Figure 19 Ecosystem-level differences in the ability of humic substances to accept electrons. Samples were taken from the water column of freshwater lakes and rivers, aquatic sediments and soils (FA = fulvic acid, HA = humic acid) (after Scott et al., 1998). Figure 19 Ecosystem-level differences in the ability of humic substances to accept electrons. Samples were taken from the water column of freshwater lakes and rivers, aquatic sediments and soils (FA = fulvic acid, HA = humic acid) (after Scott et al., 1998).
For bulk diamond the g-value is determined to be 2.0029, which is quite close to the value of a free electron. Samples thermally freed from their surface covering show spin densities of about 7 x 10 spins per gram of material. This value decreases to as little as 2.2 x 10 spins per gram for diamond hydrogenated at... [Pg.361]

S)FEM (Scanning) Fransmission Eleclron Microscopy Thin specimen-<200 nm High energy electrons typically 300 keV Transmitted and diffracted electrons (Sample thickness) 2-20 nm (Defect) structure of cryst. solids microchemistry high resol. 0.2 nm 33... [Pg.1968]

Transmission electron microscopy (TEM) is also used to visualize materials using electrons. Samples must be thin enough that the electrons transmit through them and then onto a detector below the sample. TEM can be used to look at the morphology of materials and also probe the crystalline properties. When crystals are present the electrons are diffracted, similar to what occurs with XRD. The diffracted electrons provide a picture with lines crisscrossing each other, and the lines represent the crystal lattice. [Pg.321]

The SEM uses a focused beam of high-energy electrons on the surface of solid specimens to generate a variety of signals deriving from the electron-sample interactions and subsequently, reveals the information about... [Pg.256]

However, the Hohenbeig-Kohn theorems give new conceptual quantum tools for physico-chemical characterization of an electronic sample by means of electronic density and its functionals, the total energy and chemical potential (electronegativity). Such density functional premises are in next analyzed towards elucidating of the quantum nature of the chemical bond as driven by chemical reactivity (Putz, 2007b). [Pg.475]

The array consists of four mini-CITs arranged like the rods of a mass filter shown in Figure 1. Each mini-CIT has a barrel electrode with rc = 1.25mm, its own inlet system, filament assembly, and detector, all within a common vacuum manifold and with a single set of control electronics. Sample ions are generated externally to the mini-CIT and transported through an Einzel lens into each mini-CIT, as shown... [Pg.2853]

The creation of a set of rough data ends the period of the operator passive role in the measurement, during which the operator cannot influence the parameters of the electronic sampling, the A/D converter, the time constant of the measuring system, the slice integration interval, the parameters of the transfer of the rough data into the memory, etc. [Pg.4015]

It may, therefore, be assumed that a conduction electron samples... [Pg.476]


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Analyzers, electron energy sample position

Bulk samples, electron microscopy

Ceramic samples, electron microscopy

Conducting samples, electron microscopy

Core samples, electron micrographs

Electron ionization sample introduction

Electron micrographs, analysis solid samples

Electron microscopy sample preparation

Electron paramagnetic resonance samples

Electron spin resonance doped samples

Electron spin resonance polycrystalline samples

Electronic spectroscopy sample quantities required

Electronic states sample preparation

Particles, transmission electron samples, preparation

Sample Preparation for Electron Microscopy Sectioning

Sample Preparation for Scanning Electron Micrography

Sample electron microscopy

Sample electron-transfer proteins

Sample scanning electron

Sample transmission electron

Sample-electron interaction

Scanning electron microscop sample preparation

Scanning electron microscopy sample

Scanning electron microscopy sample coating

Scanning electron microscopy sample etching

Scanning electron microscopy sample materials

Scanning electron microscopy sample preparation

Scanning transmission electron microscopy sample preparation

Solid samples, electron micrographs

Transmission electron microscopy sample preparation

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